JPS5520637B2 - - Google Patents
Info
- Publication number
- JPS5520637B2 JPS5520637B2 JP4978973A JP4978973A JPS5520637B2 JP S5520637 B2 JPS5520637 B2 JP S5520637B2 JP 4978973 A JP4978973 A JP 4978973A JP 4978973 A JP4978973 A JP 4978973A JP S5520637 B2 JPS5520637 B2 JP S5520637B2
- Authority
- JP
- Japan
- Prior art keywords
- ion beam
- uniform magnetic
- magnetic field
- entrance
- electrostatic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005686 electrostatic field Effects 0.000 abstract 2
- 238000010884 ion-beam technique Methods 0.000 abstract 2
- 230000004075 alteration Effects 0.000 abstract 1
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4978973A JPS5520637B2 (enrdf_load_stackoverflow) | 1973-05-07 | 1973-05-07 | |
| US467788A US3920988A (en) | 1973-05-07 | 1974-05-07 | Mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4978973A JPS5520637B2 (enrdf_load_stackoverflow) | 1973-05-07 | 1973-05-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS502591A JPS502591A (enrdf_load_stackoverflow) | 1975-01-11 |
| JPS5520637B2 true JPS5520637B2 (enrdf_load_stackoverflow) | 1980-06-04 |
Family
ID=12840911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4978973A Expired JPS5520637B2 (enrdf_load_stackoverflow) | 1973-05-07 | 1973-05-07 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US3920988A (enrdf_load_stackoverflow) |
| JP (1) | JPS5520637B2 (enrdf_load_stackoverflow) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5721832B2 (enrdf_load_stackoverflow) * | 1975-02-14 | 1982-05-10 | ||
| EP0016561A1 (en) * | 1979-03-15 | 1980-10-01 | University Of Manchester Institute Of Science And Technology | Mass spectrometers |
| JPS5829577B2 (ja) * | 1980-06-13 | 1983-06-23 | 日本電子株式会社 | 二重収束質量分析装置 |
| JPS6037642A (ja) * | 1983-08-10 | 1985-02-27 | Hitachi Ltd | イオン打込装置用質量分離器 |
| US5317151A (en) * | 1992-10-30 | 1994-05-31 | Sinha Mahadeva P | Miniaturized lightweight magnetic sector for a field-portable mass spectrometer |
| US8723114B2 (en) * | 2011-11-17 | 2014-05-13 | National University Of Singapore | Sequential radial mirror analyser |
| CN114709129B (zh) * | 2022-03-16 | 2025-06-24 | 中国核电工程有限公司 | 一种质量分析器系统及质谱仪 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3061720A (en) * | 1960-02-29 | 1962-10-30 | Ewald Heinz | Spectrograph |
| US3194961A (en) * | 1962-02-28 | 1965-07-13 | Ewald Heinz | Double deflection system for focusing ions of selected mass and charge at a predetermined point |
| US3671737A (en) * | 1969-05-07 | 1972-06-20 | Bell & Howell Co | Method for focusing a double focusing mass spectrometer |
-
1973
- 1973-05-07 JP JP4978973A patent/JPS5520637B2/ja not_active Expired
-
1974
- 1974-05-07 US US467788A patent/US3920988A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS502591A (enrdf_load_stackoverflow) | 1975-01-11 |
| US3920988A (en) | 1975-11-18 |
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