JPS5519066B2 - - Google Patents

Info

Publication number
JPS5519066B2
JPS5519066B2 JP9245276A JP9245276A JPS5519066B2 JP S5519066 B2 JPS5519066 B2 JP S5519066B2 JP 9245276 A JP9245276 A JP 9245276A JP 9245276 A JP9245276 A JP 9245276A JP S5519066 B2 JPS5519066 B2 JP S5519066B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9245276A
Other languages
Japanese (ja)
Other versions
JPS5318390A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9245276A priority Critical patent/JPS5318390A/ja
Priority to US05/821,198 priority patent/US4205263A/en
Publication of JPS5318390A publication Critical patent/JPS5318390A/ja
Publication of JPS5519066B2 publication Critical patent/JPS5519066B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/811Combinations of field-effect devices and one or more diodes, capacitors or resistors
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is DC
    • G05F3/10Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
JP9245276A 1976-08-03 1976-08-03 Mos type field effect transistor circuit Granted JPS5318390A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP9245276A JPS5318390A (en) 1976-08-03 1976-08-03 Mos type field effect transistor circuit
US05/821,198 US4205263A (en) 1976-08-03 1977-08-02 Temperature compensated constant current MOS field effective transistor circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9245276A JPS5318390A (en) 1976-08-03 1976-08-03 Mos type field effect transistor circuit

Publications (2)

Publication Number Publication Date
JPS5318390A JPS5318390A (en) 1978-02-20
JPS5519066B2 true JPS5519066B2 (enExample) 1980-05-23

Family

ID=14054782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9245276A Granted JPS5318390A (en) 1976-08-03 1976-08-03 Mos type field effect transistor circuit

Country Status (2)

Country Link
US (1) US4205263A (enExample)
JP (1) JPS5318390A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4323846A (en) * 1979-06-21 1982-04-06 Rockwell International Corporation Radiation hardened MOS voltage generator circuit
US4347476A (en) * 1980-12-04 1982-08-31 Rockwell International Corporation Voltage-temperature insensitive on-chip reference voltage source compatible with VLSI manufacturing techniques
US4492972A (en) * 1981-08-17 1985-01-08 Honeywell Inc. JFET Monolithic integrated circuit with input bias current temperature compensation
JPS61221812A (ja) * 1985-03-27 1986-10-02 Mitsubishi Electric Corp 電圧発生回路
JP2592234B2 (ja) * 1985-08-16 1997-03-19 富士通株式会社 半導体装置
US6321074B1 (en) 1999-02-18 2001-11-20 Itron, Inc. Apparatus and method for reducing oscillator frequency pulling during AM modulation
JP6205238B2 (ja) 2013-10-25 2017-09-27 エスアイアイ・セミコンダクタ株式会社 基準電圧発生装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4632972B1 (enExample) * 1967-11-13 1971-09-27
US3710271A (en) * 1971-10-12 1973-01-09 United Aircraft Corp Fet driver for capacitive loads
US3806742A (en) * 1972-11-01 1974-04-23 Motorola Inc Mos voltage reference circuit
JPS5051658A (enExample) * 1973-09-07 1975-05-08
JPS5942495B2 (ja) * 1974-12-16 1984-10-15 株式会社東芝 負性抵抗回路
JPS51138848A (en) * 1975-05-28 1976-11-30 Hitachi Ltd Steady current circuit
US4119904A (en) * 1977-04-11 1978-10-10 Honeywell Inc. Low battery voltage detector

Also Published As

Publication number Publication date
US4205263A (en) 1980-05-27
JPS5318390A (en) 1978-02-20

Similar Documents

Publication Publication Date Title
JPS5327928U (enExample)
JPS52157214U (enExample)
CS178499B1 (enExample)
CS178385B1 (enExample)
CS177784B1 (enExample)
JPS52163984U (enExample)
CH603949A5 (enExample)
CH610358A5 (enExample)
CH592967A5 (enExample)
CH594229A5 (enExample)
CH594306A5 (enExample)
CH594988A5 (enExample)
CH596512A5 (enExample)
CH596533A5 (enExample)
CH597615A5 (enExample)
CH598011A5 (enExample)
CH598499A5 (enExample)
CH598628A5 (enExample)
CH598982A5 (enExample)
CH599862A5 (enExample)
CH600010A5 (enExample)
CH600372A5 (enExample)
CH601870A5 (enExample)
BG23466A1 (enExample)
CH604736A5 (enExample)