JPS55163444A - X-ray analyzing device - Google Patents

X-ray analyzing device

Info

Publication number
JPS55163444A
JPS55163444A JP7072979A JP7072979A JPS55163444A JP S55163444 A JPS55163444 A JP S55163444A JP 7072979 A JP7072979 A JP 7072979A JP 7072979 A JP7072979 A JP 7072979A JP S55163444 A JPS55163444 A JP S55163444A
Authority
JP
Japan
Prior art keywords
detector
rays
elements
detectors
simply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7072979A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6236171B2 (enrdf_load_stackoverflow
Inventor
Mutsumi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON X SEN KK
Original Assignee
NIPPON X SEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON X SEN KK filed Critical NIPPON X SEN KK
Priority to JP7072979A priority Critical patent/JPS55163444A/ja
Publication of JPS55163444A publication Critical patent/JPS55163444A/ja
Publication of JPS6236171B2 publication Critical patent/JPS6236171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP7072979A 1979-06-06 1979-06-06 X-ray analyzing device Granted JPS55163444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7072979A JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7072979A JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Publications (2)

Publication Number Publication Date
JPS55163444A true JPS55163444A (en) 1980-12-19
JPS6236171B2 JPS6236171B2 (enrdf_load_stackoverflow) 1987-08-05

Family

ID=13439907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7072979A Granted JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Country Status (1)

Country Link
JP (1) JPS55163444A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6236171B2 (enrdf_load_stackoverflow) 1987-08-05

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