JPS55146954A - Protective circuit for protecting semiconductor device against thermal breakage - Google Patents

Protective circuit for protecting semiconductor device against thermal breakage

Info

Publication number
JPS55146954A
JPS55146954A JP5464479A JP5464479A JPS55146954A JP S55146954 A JPS55146954 A JP S55146954A JP 5464479 A JP5464479 A JP 5464479A JP 5464479 A JP5464479 A JP 5464479A JP S55146954 A JPS55146954 A JP S55146954A
Authority
JP
Japan
Prior art keywords
diode
transistor
semiconductor device
against thermal
temperature sensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5464479A
Other languages
Japanese (ja)
Inventor
Kunitaka Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP5464479A priority Critical patent/JPS55146954A/en
Publication of JPS55146954A publication Critical patent/JPS55146954A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
    • H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
    • H02H5/044—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using a semiconductor device to sense the temperature

Landscapes

  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

PURPOSE:To protect an electronic circuits incorporating semiconductor devices against thermal breakage attributable to overload, by providing a protection circuit wherein a temperature sensing diode is mounted in the same chip of the semiconductor device and connected to a temperature sensing circuit. CONSTITUTION:In a semiconductor device 1 having a transistor 1' formed therein, a temperature sensing diode 4 is formed in the vicinity of the junction of the transistor 1'. The diode 4 is connected to a protection circuit which includes a Zener diode 5, voltage converter 2, power-cut-off transistor 3 and a predetermined resistance. A bias voltage is applied to the diode 4. If the temperature at the juncture is maintained at normal level, the diode 4 exhibit a linear forward voltage characteristic. However, when the temperature at the juncture is elevated to 140 deg.C or so, the voltage characteristic is changed to actuate the transistor 3, thereby to open the circuit including the transistor 1' without delay.
JP5464479A 1979-05-02 1979-05-02 Protective circuit for protecting semiconductor device against thermal breakage Pending JPS55146954A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5464479A JPS55146954A (en) 1979-05-02 1979-05-02 Protective circuit for protecting semiconductor device against thermal breakage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5464479A JPS55146954A (en) 1979-05-02 1979-05-02 Protective circuit for protecting semiconductor device against thermal breakage

Publications (1)

Publication Number Publication Date
JPS55146954A true JPS55146954A (en) 1980-11-15

Family

ID=12976476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5464479A Pending JPS55146954A (en) 1979-05-02 1979-05-02 Protective circuit for protecting semiconductor device against thermal breakage

Country Status (1)

Country Link
JP (1) JPS55146954A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61149844U (en) * 1985-03-11 1986-09-16
EP0267447A2 (en) * 1986-11-12 1988-05-18 SILICONIX Incorporated A vertical DMOS power transistor with an integral operating condition sensor
JPH02120633A (en) * 1988-10-31 1990-05-08 Nec Corp Heat detection circuit
WO2007101446A2 (en) * 2006-03-09 2007-09-13 Linak A/S Electro-mechanical actuator system, for instance for adjustable furniture

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61149844U (en) * 1985-03-11 1986-09-16
EP0267447A2 (en) * 1986-11-12 1988-05-18 SILICONIX Incorporated A vertical DMOS power transistor with an integral operating condition sensor
JPH02120633A (en) * 1988-10-31 1990-05-08 Nec Corp Heat detection circuit
WO2007101446A2 (en) * 2006-03-09 2007-09-13 Linak A/S Electro-mechanical actuator system, for instance for adjustable furniture
WO2007101446A3 (en) * 2006-03-09 2007-12-06 Linak As Electro-mechanical actuator system, for instance for adjustable furniture

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