JPS55143418A - Optical measuring instrument - Google Patents

Optical measuring instrument

Info

Publication number
JPS55143418A
JPS55143418A JP5139479A JP5139479A JPS55143418A JP S55143418 A JPS55143418 A JP S55143418A JP 5139479 A JP5139479 A JP 5139479A JP 5139479 A JP5139479 A JP 5139479A JP S55143418 A JPS55143418 A JP S55143418A
Authority
JP
Japan
Prior art keywords
electromagnetic wave
detecting element
output
filters
differing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5139479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6116011B2 (enrdf_load_stackoverflow
Inventor
Isao Hishikari
Masahiro Tsuzura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP5139479A priority Critical patent/JPS55143418A/ja
Publication of JPS55143418A publication Critical patent/JPS55143418A/ja
Publication of JPS6116011B2 publication Critical patent/JPS6116011B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Radiation Pyrometers (AREA)
JP5139479A 1979-04-27 1979-04-27 Optical measuring instrument Granted JPS55143418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5139479A JPS55143418A (en) 1979-04-27 1979-04-27 Optical measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5139479A JPS55143418A (en) 1979-04-27 1979-04-27 Optical measuring instrument

Publications (2)

Publication Number Publication Date
JPS55143418A true JPS55143418A (en) 1980-11-08
JPS6116011B2 JPS6116011B2 (enrdf_load_stackoverflow) 1986-04-26

Family

ID=12885712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5139479A Granted JPS55143418A (en) 1979-04-27 1979-04-27 Optical measuring instrument

Country Status (1)

Country Link
JP (1) JPS55143418A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0825572A1 (en) * 1996-08-16 1998-02-25 Raytheon TI Systems, Inc. Chopper for thermal imaging system and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0825572A1 (en) * 1996-08-16 1998-02-25 Raytheon TI Systems, Inc. Chopper for thermal imaging system and method
US5952661A (en) * 1996-08-16 1999-09-14 Raytheon Company Chopper for thermal imaging system and method

Also Published As

Publication number Publication date
JPS6116011B2 (enrdf_load_stackoverflow) 1986-04-26

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