JPS55142217A - Device for analyzing polarization state of radiation - Google Patents

Device for analyzing polarization state of radiation

Info

Publication number
JPS55142217A
JPS55142217A JP4817680A JP4817680A JPS55142217A JP S55142217 A JPS55142217 A JP S55142217A JP 4817680 A JP4817680 A JP 4817680A JP 4817680 A JP4817680 A JP 4817680A JP S55142217 A JPS55142217 A JP S55142217A
Authority
JP
Japan
Prior art keywords
radiation
polarization state
analyzing polarization
analyzing
state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4817680A
Other languages
English (en)
Other versions
JPH0131131B2 (ja
Inventor
Koruto Hansuuerudoman
Shiedebii Furantsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS55142217A publication Critical patent/JPS55142217A/ja
Publication of JPH0131131B2 publication Critical patent/JPH0131131B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP4817680A 1979-04-21 1980-04-14 Device for analyzing polarization state of radiation Granted JPS55142217A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19792916202 DE2916202A1 (de) 1979-04-21 1979-04-21 Verfahren zur analyse des polarisationszustandes einer strahlung und vorrichtung zur durchfuehrung des verfahrens

Publications (2)

Publication Number Publication Date
JPS55142217A true JPS55142217A (en) 1980-11-06
JPH0131131B2 JPH0131131B2 (ja) 1989-06-23

Family

ID=6068926

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4817680A Granted JPS55142217A (en) 1979-04-21 1980-04-14 Device for analyzing polarization state of radiation

Country Status (5)

Country Link
US (1) US4310247A (ja)
EP (1) EP0017822B1 (ja)
JP (1) JPS55142217A (ja)
DE (2) DE2916202A1 (ja)
IT (1) IT1150985B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06147984A (ja) * 1992-11-10 1994-05-27 Moritetsukusu:Kk 偏光計測方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3906119C2 (de) * 1988-04-08 1996-06-05 Zeiss Carl Jena Gmbh Anordnung zum Messen polarisationsoptischer Gangunterschiede
DD276734A1 (de) * 1988-11-02 1990-03-07 Zeiss Jena Veb Carl Verfahren zur gangunterschiedsmessung an anisotropen transparenten objekten
US5073025A (en) * 1989-11-08 1991-12-17 Rockwell International Corporation Independent polarization state measurements sensor
DE4016731C3 (de) * 1990-05-24 2001-04-26 Bruker Analytik Gmbh Fourierspektrometer
JP3095231B2 (ja) * 1990-09-20 2000-10-03 浜松ホトニクス株式会社 偏光測定装置及び位相板測定装置
US5517309A (en) * 1993-05-03 1996-05-14 Barker; David D. Tool for analyzing a polarization state of a light beam
DE19511707B4 (de) * 1995-03-30 2007-09-27 Isra Vision Lasor Gmbh Verfahren zur Bestimmung von Spannungen in transparenten Materialien
US6674532B2 (en) 2001-11-02 2004-01-06 Vandelden Jay S. Interferometric polarization interrogating filter assembly and method
US7456962B2 (en) * 2005-02-07 2008-11-25 Meadowlark Optics, Inc. Conical refraction polarimeter

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3700334A (en) * 1970-11-13 1972-10-24 Nasa Interferometer-polarimeter
US3694088A (en) * 1971-01-25 1972-09-26 Bell Telephone Labor Inc Wavefront measurement
US4105335A (en) * 1975-06-28 1978-08-08 Canon Kabushiki Kaisha Interferometric optical phase discrimination apparatus
US4166954A (en) * 1977-10-07 1979-09-04 Ii-Vi Incorporated Instrument for determining infrared beam vergence

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06147984A (ja) * 1992-11-10 1994-05-27 Moritetsukusu:Kk 偏光計測方法

Also Published As

Publication number Publication date
IT8020725A0 (it) 1980-03-18
EP0017822A1 (de) 1980-10-29
IT1150985B (it) 1986-12-17
US4310247A (en) 1982-01-12
EP0017822B1 (de) 1982-08-11
DE2916202A1 (de) 1980-10-23
JPH0131131B2 (ja) 1989-06-23
DE3060743D1 (en) 1982-10-07

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