JPS5513446A - Uneven pattern input device - Google Patents

Uneven pattern input device

Info

Publication number
JPS5513446A
JPS5513446A JP8518478A JP8518478A JPS5513446A JP S5513446 A JPS5513446 A JP S5513446A JP 8518478 A JP8518478 A JP 8518478A JP 8518478 A JP8518478 A JP 8518478A JP S5513446 A JPS5513446 A JP S5513446A
Authority
JP
Japan
Prior art keywords
full reflection
fingerprint
reflection beam
input device
interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8518478A
Other languages
Japanese (ja)
Inventor
Tetsuo Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP8518478A priority Critical patent/JPS5513446A/en
Publication of JPS5513446A publication Critical patent/JPS5513446A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Collating Specific Patterns (AREA)
  • Image Input (AREA)

Abstract

PURPOSE: To obtain a 3-dimensional pattern input device which picks and supplies optically the uneven pattern on the soft substance such as the rubber stamp, the fingerprint or the like directly and in real time.
CONSTITUTION: Full reflection beam A is caused on interface 22 between air 21 and transparent material 20 such as the glass or the like with the incident angle exceeding critical angle Θ0, and no full reflection light is caused at the area of the interface where the rubber, the skin and the like adheres owing to the mutual refractive indexes of the media. When the fingerprints are gathered based on the above theory, parallel luminous flux 30 given from the light source enters optical device 31 featuring the transmissive and reflective properties like an orthogonal prisim or the like. And in case the beam enters slope 31c adhered to subject 32 with an incident angle more than the critical angle, the pattern information composed to the full reflection beam and non-full reflection beam can be obtained according to the fingerprint and in the form of emission light 33. This information can be supplied to processor 3 via TV camera 2.
COPYRIGHT: (C)1980,JPO&Japio
JP8518478A 1978-07-14 1978-07-14 Uneven pattern input device Pending JPS5513446A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8518478A JPS5513446A (en) 1978-07-14 1978-07-14 Uneven pattern input device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8518478A JPS5513446A (en) 1978-07-14 1978-07-14 Uneven pattern input device

Publications (1)

Publication Number Publication Date
JPS5513446A true JPS5513446A (en) 1980-01-30

Family

ID=13851566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8518478A Pending JPS5513446A (en) 1978-07-14 1978-07-14 Uneven pattern input device

Country Status (1)

Country Link
JP (1) JPS5513446A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59148808A (en) * 1983-02-15 1984-08-25 Nippon Telegr & Teleph Corp <Ntt> Detecting mechanism of unevenness surface information
JPS6128175A (en) * 1984-07-18 1986-02-07 Nec Corp Image input device
JPS6143379A (en) * 1984-08-08 1986-03-01 Nec Corp Picture input device
JPS62116204A (en) * 1985-11-16 1987-05-27 Nitto Electric Ind Co Ltd Method and apparatus for measuring contact area
JPS63228271A (en) * 1987-03-17 1988-09-22 Nippon Denso Co Ltd Fingerprint image detector
US5426296A (en) * 1993-02-17 1995-06-20 Mitsubishi Denki Kabushiki Kaisha Irregular pattern input device comprising an optical fiber bundle
US5623553A (en) * 1993-06-21 1997-04-22 Asahi Kogaku Kogyo Kabushiki Kaisha High contrast fingerprint image detector
WO2011043201A1 (en) 2009-10-08 2011-04-14 浜松ホトニクス株式会社 Relief pattern detection device
US8405757B2 (en) 2010-10-29 2013-03-26 Optical Logic Inc. Imaging device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5134680U (en) * 1974-09-06 1976-03-15
JPS5223018U (en) * 1975-08-06 1977-02-18
JPS52149922A (en) * 1976-06-08 1977-12-13 Nippon Telegr & Teleph Corp <Ntt> Graphic information input device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5134680U (en) * 1974-09-06 1976-03-15
JPS5223018U (en) * 1975-08-06 1977-02-18
JPS52149922A (en) * 1976-06-08 1977-12-13 Nippon Telegr & Teleph Corp <Ntt> Graphic information input device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59148808A (en) * 1983-02-15 1984-08-25 Nippon Telegr & Teleph Corp <Ntt> Detecting mechanism of unevenness surface information
JPS6128175A (en) * 1984-07-18 1986-02-07 Nec Corp Image input device
JPS6143379A (en) * 1984-08-08 1986-03-01 Nec Corp Picture input device
JPS62116204A (en) * 1985-11-16 1987-05-27 Nitto Electric Ind Co Ltd Method and apparatus for measuring contact area
JPS63228271A (en) * 1987-03-17 1988-09-22 Nippon Denso Co Ltd Fingerprint image detector
US5426296A (en) * 1993-02-17 1995-06-20 Mitsubishi Denki Kabushiki Kaisha Irregular pattern input device comprising an optical fiber bundle
US5623553A (en) * 1993-06-21 1997-04-22 Asahi Kogaku Kogyo Kabushiki Kaisha High contrast fingerprint image detector
WO2011043201A1 (en) 2009-10-08 2011-04-14 浜松ホトニクス株式会社 Relief pattern detection device
US8405757B2 (en) 2010-10-29 2013-03-26 Optical Logic Inc. Imaging device

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