JPS55119073A - Temperature drift inspecting apparatus - Google Patents
Temperature drift inspecting apparatusInfo
- Publication number
- JPS55119073A JPS55119073A JP2707179A JP2707179A JPS55119073A JP S55119073 A JPS55119073 A JP S55119073A JP 2707179 A JP2707179 A JP 2707179A JP 2707179 A JP2707179 A JP 2707179A JP S55119073 A JPS55119073 A JP S55119073A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- amplifier dut
- output
- temperature
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To make possible quick and accurate measurement of arithmetic amplifiers to be inspected by enabling measurement thereof in sequence maintaining them at a fixed temperature at a time under a high temperature cell.
CONSTITUTION: Two sets of variable resistors 4 and 5 are provided on the rotating shaft of a servomotor 3 and a voltage VR is applied to one end of the resistor 5 with the other end grounded. When a switch S2 is connected to the terminal T0 of the start circuit, the output of the arithmetic amplifier DUT1 is input into the decision part 6 by way of a relay RL1. At this point, the initial value zero of the memory circuit 8 is input into a limit setting circuit 9 to set the comparison voltage at zero. At the same time, with the rotation of a servomotor 3, the resistors 4 and 5 turn to vary the output of the amplifier DUT1. At the point where this voltage transverses the comparison voltage, the control section halts the rotation to complete the zero adjustment, when the voltage level at the intermediate terminal of the resistor 5 is maintained by the circuit 8. Subsequently, the amplifier DUT is kept at the prescribed temperature to develop a condition the same as presented in the zero adjustment whereby the output of the amplifier DUT is obtained after the heating up to the prescribed temperature. This operation is conducted for each amplifier DUT in sequence to accomplish the checking of the temperature drift.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2707179A JPS55119073A (en) | 1979-03-08 | 1979-03-08 | Temperature drift inspecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2707179A JPS55119073A (en) | 1979-03-08 | 1979-03-08 | Temperature drift inspecting apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55119073A true JPS55119073A (en) | 1980-09-12 |
| JPS6355030B2 JPS6355030B2 (en) | 1988-11-01 |
Family
ID=12210826
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2707179A Granted JPS55119073A (en) | 1979-03-08 | 1979-03-08 | Temperature drift inspecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55119073A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100344965B1 (en) * | 1999-10-12 | 2002-07-19 | 서통테크놀로지주식회사 | Apparatus for measuring open circuit voltage and inner impedance of a lithium ion cell |
-
1979
- 1979-03-08 JP JP2707179A patent/JPS55119073A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100344965B1 (en) * | 1999-10-12 | 2002-07-19 | 서통테크놀로지주식회사 | Apparatus for measuring open circuit voltage and inner impedance of a lithium ion cell |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6355030B2 (en) | 1988-11-01 |
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