JPS5511693A - Pulse cycle generator - Google Patents

Pulse cycle generator

Info

Publication number
JPS5511693A
JPS5511693A JP8157879A JP8157879A JPS5511693A JP S5511693 A JPS5511693 A JP S5511693A JP 8157879 A JP8157879 A JP 8157879A JP 8157879 A JP8157879 A JP 8157879A JP S5511693 A JPS5511693 A JP S5511693A
Authority
JP
Japan
Prior art keywords
pulse cycle
cycle generator
generator
pulse
cycle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8157879A
Other languages
Japanese (ja)
Other versions
JPS6042422B2 (en
Inventor
Erunsuto Sutaigaa Deiteru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE2746743A external-priority patent/DE2746743C2/en
Priority claimed from DE2829709A external-priority patent/DE2829709C2/en
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS5511693A publication Critical patent/JPS5511693A/en
Publication of JPS6042422B2 publication Critical patent/JPS6042422B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/78—Generating a single train of pulses having a predetermined pattern, e.g. a predetermined number
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP54081578A 1977-10-18 1979-06-29 Pulse cycle generator Expired JPS6042422B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2746743A DE2746743C2 (en) 1977-10-18 1977-10-18 Method and arrangement for the computer-controlled generation of pulse intervals
DE2829709A DE2829709C2 (en) 1978-07-06 1978-07-06 Method and arrangement for generating pulse cycles immediately following one another in time
DE2829709.8 1978-07-06

Publications (2)

Publication Number Publication Date
JPS5511693A true JPS5511693A (en) 1980-01-26
JPS6042422B2 JPS6042422B2 (en) 1985-09-21

Family

ID=25772918

Family Applications (2)

Application Number Title Priority Date Filing Date
JP53117544A Expired JPS6042421B2 (en) 1977-10-18 1978-09-26 Pulse train generator
JP54081578A Expired JPS6042422B2 (en) 1977-10-18 1979-06-29 Pulse cycle generator

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP53117544A Expired JPS6042421B2 (en) 1977-10-18 1978-09-26 Pulse train generator

Country Status (2)

Country Link
JP (2) JPS6042421B2 (en)
FR (1) FR2406912A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5715527A (en) * 1980-06-25 1982-01-26 Ibm Method of generating pulse
JPS61172431A (en) * 1985-01-28 1986-08-04 Fujisoku:Kk Sampling signal generating circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63145529U (en) * 1987-03-17 1988-09-26

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5715527A (en) * 1980-06-25 1982-01-26 Ibm Method of generating pulse
JPS6326925B2 (en) * 1980-06-25 1988-06-01 Intaanashonaru Bijinesu Mashiinzu Corp
JPS61172431A (en) * 1985-01-28 1986-08-04 Fujisoku:Kk Sampling signal generating circuit

Also Published As

Publication number Publication date
JPS6042422B2 (en) 1985-09-21
FR2406912B1 (en) 1982-06-04
JPS5465463A (en) 1979-05-26
JPS6042421B2 (en) 1985-09-21
FR2406912A1 (en) 1979-05-18

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