JPS5465463A - Method of generating pulse train - Google Patents

Method of generating pulse train

Info

Publication number
JPS5465463A
JPS5465463A JP11754478A JP11754478A JPS5465463A JP S5465463 A JPS5465463 A JP S5465463A JP 11754478 A JP11754478 A JP 11754478A JP 11754478 A JP11754478 A JP 11754478A JP S5465463 A JPS5465463 A JP S5465463A
Authority
JP
Japan
Prior art keywords
pulse train
generating pulse
generating
train
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11754478A
Other languages
Japanese (ja)
Other versions
JPS6042421B2 (en
Inventor
Sutaigeru Deiiteru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE2746743A external-priority patent/DE2746743C2/en
Priority claimed from DE2829709A external-priority patent/DE2829709C2/en
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS5465463A publication Critical patent/JPS5465463A/en
Publication of JPS6042421B2 publication Critical patent/JPS6042421B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/78—Generating a single train of pulses having a predetermined pattern, e.g. a predetermined number
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP53117544A 1977-10-18 1978-09-26 Pulse train generator Expired JPS6042421B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2746743.2 1977-10-18
DE2746743A DE2746743C2 (en) 1977-10-18 1977-10-18 Method and arrangement for the computer-controlled generation of pulse intervals
DE2829709A DE2829709C2 (en) 1978-07-06 1978-07-06 Method and arrangement for generating pulse cycles immediately following one another in time

Publications (2)

Publication Number Publication Date
JPS5465463A true JPS5465463A (en) 1979-05-26
JPS6042421B2 JPS6042421B2 (en) 1985-09-21

Family

ID=25772918

Family Applications (2)

Application Number Title Priority Date Filing Date
JP53117544A Expired JPS6042421B2 (en) 1977-10-18 1978-09-26 Pulse train generator
JP54081578A Expired JPS6042422B2 (en) 1977-10-18 1979-06-29 Pulse cycle generator

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP54081578A Expired JPS6042422B2 (en) 1977-10-18 1979-06-29 Pulse cycle generator

Country Status (2)

Country Link
JP (2) JPS6042421B2 (en)
FR (1) FR2406912A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3023699A1 (en) * 1980-06-25 1982-01-14 Ibm Deutschland Gmbh, 7000 Stuttgart METHOD AND ARRANGEMENT FOR GENERATING IMPULSES AT PRESET TIME RELATION WITHIN PRESET IMPULSE INTERVALS WITH HIGH TIME RESOLUTION
JPS61172431A (en) * 1985-01-28 1986-08-04 Fujisoku:Kk Sampling signal generating circuit
JPS63145529U (en) * 1987-03-17 1988-09-26

Also Published As

Publication number Publication date
JPS5511693A (en) 1980-01-26
FR2406912B1 (en) 1982-06-04
JPS6042421B2 (en) 1985-09-21
JPS6042422B2 (en) 1985-09-21
FR2406912A1 (en) 1979-05-18

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