JPS55113927A - Thermal noise thermometer - Google Patents
Thermal noise thermometerInfo
- Publication number
- JPS55113927A JPS55113927A JP2165479A JP2165479A JPS55113927A JP S55113927 A JPS55113927 A JP S55113927A JP 2165479 A JP2165479 A JP 2165479A JP 2165479 A JP2165479 A JP 2165479A JP S55113927 A JPS55113927 A JP S55113927A
- Authority
- JP
- Japan
- Prior art keywords
- fet
- voltage
- transistor
- input stage
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
- Amplifiers (AREA)
Abstract
PURPOSE: To enable the measurement of high accuracy, by eliminating the influence of an induced gate noise in an AC amplifier employing an FET in the input stage of a preamplifier.
CONSTITUTION: An FET Q1 of an input stage is cascade-connected by a transistor Q2. Even if the base voltage of the transistor Q2 is changed, the DC level of its collector current scarcely varies. Therefore, the change in the base voltage of the transistor Q2 does not appear on an output voltage. When a switch SW is closed, the base of the taransistor Q2 is grounded in an AC manner by a capacitor C1 and the fluctuation in the drain voltage of the FET Q1 is very small. When the switch SW is open, an induced gate noise is caused as compensation in the FET Q1 of the input stage by a voltage which appears across the drain of the FET.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2165479A JPS5858013B2 (en) | 1979-02-26 | 1979-02-26 | thermal noise thermometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2165479A JPS5858013B2 (en) | 1979-02-26 | 1979-02-26 | thermal noise thermometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55113927A true JPS55113927A (en) | 1980-09-02 |
JPS5858013B2 JPS5858013B2 (en) | 1983-12-23 |
Family
ID=12061028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2165479A Expired JPS5858013B2 (en) | 1979-02-26 | 1979-02-26 | thermal noise thermometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5858013B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS592314U (en) * | 1982-06-30 | 1984-01-09 | 横河電機株式会社 | ultrasonic probe |
-
1979
- 1979-02-26 JP JP2165479A patent/JPS5858013B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5858013B2 (en) | 1983-12-23 |
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