JPS55101062A - Method and device for testing environment of electronic equipment - Google Patents

Method and device for testing environment of electronic equipment

Info

Publication number
JPS55101062A
JPS55101062A JP821779A JP821779A JPS55101062A JP S55101062 A JPS55101062 A JP S55101062A JP 821779 A JP821779 A JP 821779A JP 821779 A JP821779 A JP 821779A JP S55101062 A JPS55101062 A JP S55101062A
Authority
JP
Japan
Prior art keywords
unit
hanger
electronic equipment
hanger unit
circuit operating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP821779A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6131827B2 (show.php
Inventor
Eiji Fukawa
Yuji Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP821779A priority Critical patent/JPS55101062A/ja
Publication of JPS55101062A publication Critical patent/JPS55101062A/ja
Publication of JPS6131827B2 publication Critical patent/JPS6131827B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
JP821779A 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment Granted JPS55101062A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP821779A JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP821779A JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Publications (2)

Publication Number Publication Date
JPS55101062A true JPS55101062A (en) 1980-08-01
JPS6131827B2 JPS6131827B2 (show.php) 1986-07-23

Family

ID=11687042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP821779A Granted JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Country Status (1)

Country Link
JP (1) JPS55101062A (show.php)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57151842A (en) * 1981-03-13 1982-09-20 Daifuku Co Ltd Truck for testing and test facility using the same
JPS59147278A (ja) * 1983-02-14 1984-08-23 Tsubakimoto Chain Co 電子部品の負荷試験装置
JPS59184871A (ja) * 1983-04-05 1984-10-20 Tsubakimoto Chain Co 電子部品の負荷試験装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675496B (zh) * 2012-09-14 2016-12-21 联创汽车电子有限公司 电子设备环境测试系统
CN103808522A (zh) * 2013-11-12 2014-05-21 陕西国力信息技术有限公司 一种amt系统高温贮存试验方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57151842A (en) * 1981-03-13 1982-09-20 Daifuku Co Ltd Truck for testing and test facility using the same
JPS59147278A (ja) * 1983-02-14 1984-08-23 Tsubakimoto Chain Co 電子部品の負荷試験装置
JPS59184871A (ja) * 1983-04-05 1984-10-20 Tsubakimoto Chain Co 電子部品の負荷試験装置

Also Published As

Publication number Publication date
JPS6131827B2 (show.php) 1986-07-23

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