JPS5474377A - Device for searching electron beam for electron beam device and method of driving same - Google Patents

Device for searching electron beam for electron beam device and method of driving same

Info

Publication number
JPS5474377A
JPS5474377A JP11782378A JP11782378A JPS5474377A JP S5474377 A JPS5474377 A JP S5474377A JP 11782378 A JP11782378 A JP 11782378A JP 11782378 A JP11782378 A JP 11782378A JP S5474377 A JPS5474377 A JP S5474377A
Authority
JP
Japan
Prior art keywords
electron beam
searching
driving same
driving
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11782378A
Other languages
English (en)
Inventor
Fuoierubaumu Hansupeetaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of JPS5474377A publication Critical patent/JPS5474377A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electron Beam Exposure (AREA)
JP11782378A 1977-09-26 1978-09-25 Device for searching electron beam for electron beam device and method of driving same Pending JPS5474377A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19772743200 DE2743200A1 (de) 1977-09-26 1977-09-26 Verbesserung an einer vorrichtung zur elektronenstrahleintastung

Publications (1)

Publication Number Publication Date
JPS5474377A true JPS5474377A (en) 1979-06-14

Family

ID=6019884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11782378A Pending JPS5474377A (en) 1977-09-26 1978-09-25 Device for searching electron beam for electron beam device and method of driving same

Country Status (4)

Country Link
US (1) US4169229A (ja)
EP (1) EP0001228B1 (ja)
JP (1) JPS5474377A (ja)
DE (1) DE2743200A1 (ja)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4445041A (en) * 1981-06-02 1984-04-24 Hewlett-Packard Company Electron beam blanker
DE3227426A1 (de) * 1982-07-22 1984-01-26 Siemens AG, 1000 Berlin und 8000 München Ablenkstruktur fuer ein korpuskularstrahl-austastsystem und verfahren zu seinem betrieb
GB2139411B (en) * 1983-05-05 1987-01-07 Cambridge Instr Ltd Charged particle deflection
JPS60112236A (ja) * 1983-11-21 1985-06-18 Hitachi Ltd パルスビ−ム発生装置
DE3407050A1 (de) * 1984-02-27 1985-09-05 Siemens AG, 1000 Berlin und 8000 München Korpuskelbeschleunigende elektrode
DE3519401A1 (de) * 1984-05-30 1985-12-05 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur detektion und abbildung eines punktes einer probe, der ein signal wenigstens einer bestimmten frequenz fuehrt
EP0166814B1 (de) * 1984-05-30 1990-07-18 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Detektion und Abbildung eines Messpunkts, der eine Spannung wenigstens einer bestimmten Frequenz führt
DE3428965A1 (de) * 1984-08-06 1986-02-06 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur detektion und abbildung von messpunkten, die einen bestimmten signalverlauf aufweisen
US4689555A (en) * 1985-03-22 1987-08-25 Siemens Aktiengesellschaft Method for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscope
DE3666897D1 (en) * 1985-03-28 1989-12-14 Philips Nv Electron beam apparatus comprising an integrated anode/beam blanking unit
EP0301254A3 (de) * 1987-07-30 1990-10-10 Siemens Aktiengesellschaft Spannungsmessung mit einer Elektronensonde durch Messungen im Frequenzbereich mittels eines modulierten Primärstrahls
DE3887403D1 (de) * 1987-08-06 1994-03-10 Siemens Ag Spannungsmessung mit einer Elektronensonde ohne externes Triggersignal.
EP0310816B1 (de) * 1987-09-30 1991-11-06 Siemens Aktiengesellschaft Automatische Frequenznachführung bei Korpuskularstrahlmessverfahren unter Anwendung eines modulierten Primärstrahls
US4922196A (en) * 1988-09-02 1990-05-01 Amray, Inc. Beam-blanking apparatus for stroboscopic electron beam instruments
US5276330A (en) * 1991-05-29 1994-01-04 Etec Systems, Inc. High accuracy beam blanker
US6521896B1 (en) 2000-06-01 2003-02-18 Applied Materials, Inc. Blanker assembly employing dielectric material
US20070069149A1 (en) * 2005-09-29 2007-03-29 Earl Weltmer Combined aperture holder, beam blanker and vacuum feed through for electron beam, ion beam charged particle devices

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE898044C (de) * 1942-02-11 1953-11-26 Siemens Ag Elektronenmikroskop
DE910944C (de) * 1944-05-26 1954-05-10 Aeg Vorrichtung zur Herstellung von uebermikroskopischen Stereobilden
GB612434A (en) * 1946-03-05 1948-11-12 Gerald Thomas Davies Improvements in and relating to cathode ray tubes
FR1013995A (fr) * 1950-01-21 1952-08-06 Csf Dispositif électrique pour stéréomicroscopie électronique

Also Published As

Publication number Publication date
EP0001228B1 (de) 1981-09-02
US4169229A (en) 1979-09-25
DE2743200A1 (de) 1979-04-05
EP0001228A1 (de) 1979-04-04

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