JPS5451872A - Automatic measurement of frequencies - Google Patents

Automatic measurement of frequencies

Info

Publication number
JPS5451872A
JPS5451872A JP11804377A JP11804377A JPS5451872A JP S5451872 A JPS5451872 A JP S5451872A JP 11804377 A JP11804377 A JP 11804377A JP 11804377 A JP11804377 A JP 11804377A JP S5451872 A JPS5451872 A JP S5451872A
Authority
JP
Japan
Prior art keywords
frequencies
basic
vibration waveforms
data
levels
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11804377A
Other languages
Japanese (ja)
Inventor
Ikuo Nunomura
Akio Watanuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Denshi KK
Original Assignee
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK filed Critical Hitachi Denshi KK
Priority to JP11804377A priority Critical patent/JPS5451872A/en
Publication of JPS5451872A publication Critical patent/JPS5451872A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To automatically and accurately measure basic frequencies by analyzing vibration waveforms in the relation of frequencies and levels and setting an arbitrary slice level from the outside.
CONSTITUTION: A data input part 5 is connected via data memory part 6 to a data analyzing and processing part 7 and a basic frequency measurement circuit 9 connected with a level setter 9 and a display control unit 10. Then, the vibration waveforms being vibration analysis data 4 of a constant quantity are inputted at a constant sampling period and are stored, after which they are analyzed in the relation of frequencies and levels, and the basic frequency is measured based on the slice level having been set for the results of said analysis, and is displayed in a display device 11. Hence, the basic frequencies of the vibration waveforms are accurately and readily measuted without need for relying upon human manual operations
COPYRIGHT: (C)1979,JPO&Japio
JP11804377A 1977-09-30 1977-09-30 Automatic measurement of frequencies Pending JPS5451872A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11804377A JPS5451872A (en) 1977-09-30 1977-09-30 Automatic measurement of frequencies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11804377A JPS5451872A (en) 1977-09-30 1977-09-30 Automatic measurement of frequencies

Publications (1)

Publication Number Publication Date
JPS5451872A true JPS5451872A (en) 1979-04-24

Family

ID=14726613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11804377A Pending JPS5451872A (en) 1977-09-30 1977-09-30 Automatic measurement of frequencies

Country Status (1)

Country Link
JP (1) JPS5451872A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002073222A1 (en) * 2001-03-14 2002-09-19 Advantest Corporation Frequency analyzing method, frequency analyzing apparatus, and spectrum analyzer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002073222A1 (en) * 2001-03-14 2002-09-19 Advantest Corporation Frequency analyzing method, frequency analyzing apparatus, and spectrum analyzer
US6979993B2 (en) 2001-03-14 2005-12-27 Advantest Corporation Frequency analyzing method, frequency analyzing apparatus, and spectrum analyzer

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