JPS54162417A - Low voltage detector circuit - Google Patents

Low voltage detector circuit

Info

Publication number
JPS54162417A
JPS54162417A JP7093478A JP7093478A JPS54162417A JP S54162417 A JPS54162417 A JP S54162417A JP 7093478 A JP7093478 A JP 7093478A JP 7093478 A JP7093478 A JP 7093478A JP S54162417 A JPS54162417 A JP S54162417A
Authority
JP
Japan
Prior art keywords
voltage
vth
output
comparator
noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7093478A
Other languages
Japanese (ja)
Inventor
Tetsuya Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7093478A priority Critical patent/JPS54162417A/en
Publication of JPS54162417A publication Critical patent/JPS54162417A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make it possible to make the response speed higher and lower for high-frequency noise, etc., and an input break time respectively by taking OR between the output of a high-response speed detection means and the output of a low-response speed detection means as a low voltage detection output.
CONSTITUTION: OR gate 11 is proviede which operates OR between the output of voltage comparator 6 (comparison voltage VTH1) and the output of voltage comparator 10 (comparison voltage VTH2, VTH1>VTH2). In respect to the response for the noise voltage at time t1, if VTH2 is set lower than the voltage drop dependent upon allowable noise, comparators 6 and 10 are not operated to output no low voltage detection output. Next, at time t2, though comparator 6 is operated at response time Td2,comparator 10 is operated immediately when the input voltage becomes below VTH2 because the input voltage passes through no integrating circuit, and the output of rapider one of voltage comparators is transmitted to power source 7 and unit 8 by gate 11. That is, the circuit does not cause malfunction at the allowable voltage drop by noise by setting VTH1>VTH2, and an extreme voltage drop can be detected surely even if this voltage drop is temporary.
COPYRIGHT: (C)1979,JPO&Japio
JP7093478A 1978-06-14 1978-06-14 Low voltage detector circuit Pending JPS54162417A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7093478A JPS54162417A (en) 1978-06-14 1978-06-14 Low voltage detector circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7093478A JPS54162417A (en) 1978-06-14 1978-06-14 Low voltage detector circuit

Publications (1)

Publication Number Publication Date
JPS54162417A true JPS54162417A (en) 1979-12-24

Family

ID=13445825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7093478A Pending JPS54162417A (en) 1978-06-14 1978-06-14 Low voltage detector circuit

Country Status (1)

Country Link
JP (1) JPS54162417A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03284132A (en) * 1990-03-29 1991-12-13 Toshiba Corp Power unit
JPH1172585A (en) * 1997-06-17 1999-03-16 Seiko Epson Corp Power generation detection circuit, semiconductor device, electronic instrument, timepiece, power generation detection method and electric power consumption control method
JP2020187810A (en) * 2019-05-13 2020-11-19 ウィンボンド エレクトロニクス コーポレーション Semiconductor memory device
JP2020187808A (en) * 2019-05-13 2020-11-19 ウィンボンド エレクトロニクス コーポレーション Semiconductor memory device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03284132A (en) * 1990-03-29 1991-12-13 Toshiba Corp Power unit
JPH1172585A (en) * 1997-06-17 1999-03-16 Seiko Epson Corp Power generation detection circuit, semiconductor device, electronic instrument, timepiece, power generation detection method and electric power consumption control method
JP2020187810A (en) * 2019-05-13 2020-11-19 ウィンボンド エレクトロニクス コーポレーション Semiconductor memory device
JP2020187808A (en) * 2019-05-13 2020-11-19 ウィンボンド エレクトロニクス コーポレーション Semiconductor memory device

Similar Documents

Publication Publication Date Title
JPS57124946A (en) Pulse detection circuit
ATE128244T1 (en) CIRCUIT FOR ELECTROMAGNETIC ROTATION SENSOR.
JPS54132915A (en) Speed rationality checking circuit
JPS54162417A (en) Low voltage detector circuit
JPS5372667A (en) Analogue comparator
EP0665488A3 (en) Supply sensing circuit with power-on reset detection
JPS5338944A (en) Abnormality detector
JPS5410648A (en) Operation monitor circuit for amplifier
JPS535746A (en) Over-curren t sensing device of dc motor
JPS55149873A (en) Overcurrent detector
JPS5341683A (en) Sampling control system
JPS54161021A (en) Gate control system
JPS54162577A (en) Low voltage detecting circuit
JPS54159840A (en) Micro address generation control circuit
JPS52143077A (en) Polar value arrival detector
JPS53127983A (en) Signal identifier circuit
JPS5340847A (en) Reclosing protector for converter
JPS57194627A (en) Protecting device for load control circuit
JPS5365922A (en) Fault detection for cyclo converter
JPS57179989A (en) Sense circuit
JPS53106599A (en) Ultrasonic alarm device
JPS52137585A (en) Input setting circuit
JPS52124848A (en) Digital phase detection circuit
JPS54101277A (en) Prober for semiconductor wafer
JPS5550169A (en) Trouble detector for humidity sensor