JPS54156584A - Optical anisotropy measuring apparatus - Google Patents

Optical anisotropy measuring apparatus

Info

Publication number
JPS54156584A
JPS54156584A JP6433078A JP6433078A JPS54156584A JP S54156584 A JPS54156584 A JP S54156584A JP 6433078 A JP6433078 A JP 6433078A JP 6433078 A JP6433078 A JP 6433078A JP S54156584 A JPS54156584 A JP S54156584A
Authority
JP
Japan
Prior art keywords
light
analyzer
anisotropy
vector
deviated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6433078A
Other languages
Japanese (ja)
Other versions
JPS6117295B2 (en
Inventor
Manabu Yamamoto
Seiichi Murayama
Konosuke Oishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6433078A priority Critical patent/JPS54156584A/en
Publication of JPS54156584A publication Critical patent/JPS54156584A/en
Publication of JPS6117295B2 publication Critical patent/JPS6117295B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To device photo detecting operation point by measuring optical anisotropy through the use of an analyzer whose polarizing direction is deviated by a specified angle. CONSTITUTION:Linearly polarized light or elliptically polarized light by a polarizer 2 whose polarizing direction is vector P makes double refraction according to the optical anisotropy of the sample 3 to which a magnetic field is being applied and this light passes through an analyzer 4 whose polarizing direction is vector A and becomes the quantity of light proportional to the square of sine wave of the magnitude of the anisotropy. This light is received in a photo detector 6. If the analyzer whose polarizing direction vector has been so deviated as to become smaller than the 1/2 of the maximum value of this quantity of the received light and larger than its minimum value and to a polarity opposite from the rotating angle by the anisotropy of the sample 3 is used, the photo detecting operation point of the non-sample state by the photo detector 6 is deviated. Hence, the change in the quantity of light increases according to anisotropy and this enables measurement sensitivity to be improved. The similar results may also be obtained even by providing a rotatory element immediately before the analyzer without deviating the polarizing vector direction of the analyzer.
JP6433078A 1978-05-31 1978-05-31 Optical anisotropy measuring apparatus Granted JPS54156584A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6433078A JPS54156584A (en) 1978-05-31 1978-05-31 Optical anisotropy measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6433078A JPS54156584A (en) 1978-05-31 1978-05-31 Optical anisotropy measuring apparatus

Publications (2)

Publication Number Publication Date
JPS54156584A true JPS54156584A (en) 1979-12-10
JPS6117295B2 JPS6117295B2 (en) 1986-05-07

Family

ID=13255112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6433078A Granted JPS54156584A (en) 1978-05-31 1978-05-31 Optical anisotropy measuring apparatus

Country Status (1)

Country Link
JP (1) JPS54156584A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011133428A (en) * 2009-12-25 2011-07-07 Yokogawa Electric Corp Retardation measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011133428A (en) * 2009-12-25 2011-07-07 Yokogawa Electric Corp Retardation measuring device

Also Published As

Publication number Publication date
JPS6117295B2 (en) 1986-05-07

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