JPS54128774A - Measurment of insulation-resistance of coils for electric device - Google Patents

Measurment of insulation-resistance of coils for electric device

Info

Publication number
JPS54128774A
JPS54128774A JP3636878A JP3636878A JPS54128774A JP S54128774 A JPS54128774 A JP S54128774A JP 3636878 A JP3636878 A JP 3636878A JP 3636878 A JP3636878 A JP 3636878A JP S54128774 A JPS54128774 A JP S54128774A
Authority
JP
Japan
Prior art keywords
coil
metal pellets
conductor
transformer
measurment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3636878A
Other languages
Japanese (ja)
Inventor
Hideyuki Mitsushima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Electric Manufacturing Co Ltd
Priority to JP3636878A priority Critical patent/JPS54128774A/en
Publication of JPS54128774A publication Critical patent/JPS54128774A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To provide a measurement, by which the troubles before and after the measuring operations are eliminated, by which the quasi-permanent use of metal pellets is made available and by which no influence is exerted upon a human body, by burying a coil in the metal pellets and by applying a voltage between the coil and the metal pellets.
CONSTITUTION: A coil 1 is made of a conductor 1a and an insulating coating 1b and is supplied with a high voltage when the measurements are to be performed. Upon the high voltage application, the coil is buried in metal pellets 3 of an excellent conductor made of a conductive substance such as lead or tin, and the metal pellets 3 are used as a grounded medium. The conductor 1a has its one end connected to one end of a testing transformer 4 at a secondary side thereof. The measurements are performed with the use of an ammeter 6 and a voltmeter 6 which are connected with the primary side of the transformer 4 through a variable transformer 5.
COPYRIGHT: (C)1979,JPO&Japio
JP3636878A 1978-03-29 1978-03-29 Measurment of insulation-resistance of coils for electric device Pending JPS54128774A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3636878A JPS54128774A (en) 1978-03-29 1978-03-29 Measurment of insulation-resistance of coils for electric device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3636878A JPS54128774A (en) 1978-03-29 1978-03-29 Measurment of insulation-resistance of coils for electric device

Publications (1)

Publication Number Publication Date
JPS54128774A true JPS54128774A (en) 1979-10-05

Family

ID=12467882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3636878A Pending JPS54128774A (en) 1978-03-29 1978-03-29 Measurment of insulation-resistance of coils for electric device

Country Status (1)

Country Link
JP (1) JPS54128774A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5008617A (en) * 1989-06-20 1991-04-16 Energy Conversion Devices, Inc. Functional testing of ultra large area, ultra large scale integrated circuits

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5008617A (en) * 1989-06-20 1991-04-16 Energy Conversion Devices, Inc. Functional testing of ultra large area, ultra large scale integrated circuits

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