JPS54106266A - Plate thickness metering method for radioactive ray thickness meter - Google Patents
Plate thickness metering method for radioactive ray thickness meterInfo
- Publication number
- JPS54106266A JPS54106266A JP1294478A JP1294478A JPS54106266A JP S54106266 A JPS54106266 A JP S54106266A JP 1294478 A JP1294478 A JP 1294478A JP 1294478 A JP1294478 A JP 1294478A JP S54106266 A JPS54106266 A JP S54106266A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- thicknesses
- detected
- circuit
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
PURPOSE: To provide a metering method, which is suitable even in case teat pieces of different thicknesses to be metered are continuously conveyed, by inspecting the relationship between the outputs of a detector and the thicknesses for all the metering range of a thickness meter.
CONSTITUTION: A reference plate 15 is inserted into the beam 11a of a radioactive source 11 in a manner to have its thickness consecutively increased. The output of a radioactive ray detector 12 at that time is taken out of a linearizing circuit 21 to obtain the chart showing the relationship between the actual detected outputs and thicknesses. The resultant characteristic curve is divided into such sections as can be deemed linear from the standpoint of accuracy, and the thicknesses Xn at the respective dividing points a to f are stored in an operationally processing circuit 16. In response to these signals, a reference plate driving device 14 is operated to prepare a calibration curve shown in broken line. The detected output VX according to the thickness of a test piece 13 is fed to the processing circuit 16 through the detector 12, a preamplifier 19 and the linearizing circuit 21. By the use of the circuit 16, the detected output VX is compared with the metering line obtained by the calibration so that the thickness X may be detected by the detected output VX.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1294478A JPS54106266A (en) | 1978-02-09 | 1978-02-09 | Plate thickness metering method for radioactive ray thickness meter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1294478A JPS54106266A (en) | 1978-02-09 | 1978-02-09 | Plate thickness metering method for radioactive ray thickness meter |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54106266A true JPS54106266A (en) | 1979-08-21 |
Family
ID=11819385
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1294478A Pending JPS54106266A (en) | 1978-02-09 | 1978-02-09 | Plate thickness metering method for radioactive ray thickness meter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54106266A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003097902A (en) * | 2001-09-20 | 2003-04-03 | Mitsutoyo Corp | Caliper gauge and method for correcting error of caliper gauge |
-
1978
- 1978-02-09 JP JP1294478A patent/JPS54106266A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003097902A (en) * | 2001-09-20 | 2003-04-03 | Mitsutoyo Corp | Caliper gauge and method for correcting error of caliper gauge |
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