JPS54106266A - Plate thickness metering method for radioactive ray thickness meter - Google Patents

Plate thickness metering method for radioactive ray thickness meter

Info

Publication number
JPS54106266A
JPS54106266A JP1294478A JP1294478A JPS54106266A JP S54106266 A JPS54106266 A JP S54106266A JP 1294478 A JP1294478 A JP 1294478A JP 1294478 A JP1294478 A JP 1294478A JP S54106266 A JPS54106266 A JP S54106266A
Authority
JP
Japan
Prior art keywords
thickness
thicknesses
detected
circuit
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1294478A
Other languages
Japanese (ja)
Inventor
Takaaki Okino
Hiroshi Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP1294478A priority Critical patent/JPS54106266A/en
Publication of JPS54106266A publication Critical patent/JPS54106266A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE: To provide a metering method, which is suitable even in case teat pieces of different thicknesses to be metered are continuously conveyed, by inspecting the relationship between the outputs of a detector and the thicknesses for all the metering range of a thickness meter.
CONSTITUTION: A reference plate 15 is inserted into the beam 11a of a radioactive source 11 in a manner to have its thickness consecutively increased. The output of a radioactive ray detector 12 at that time is taken out of a linearizing circuit 21 to obtain the chart showing the relationship between the actual detected outputs and thicknesses. The resultant characteristic curve is divided into such sections as can be deemed linear from the standpoint of accuracy, and the thicknesses Xn at the respective dividing points a to f are stored in an operationally processing circuit 16. In response to these signals, a reference plate driving device 14 is operated to prepare a calibration curve shown in broken line. The detected output VX according to the thickness of a test piece 13 is fed to the processing circuit 16 through the detector 12, a preamplifier 19 and the linearizing circuit 21. By the use of the circuit 16, the detected output VX is compared with the metering line obtained by the calibration so that the thickness X may be detected by the detected output VX.
COPYRIGHT: (C)1979,JPO&Japio
JP1294478A 1978-02-09 1978-02-09 Plate thickness metering method for radioactive ray thickness meter Pending JPS54106266A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1294478A JPS54106266A (en) 1978-02-09 1978-02-09 Plate thickness metering method for radioactive ray thickness meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1294478A JPS54106266A (en) 1978-02-09 1978-02-09 Plate thickness metering method for radioactive ray thickness meter

Publications (1)

Publication Number Publication Date
JPS54106266A true JPS54106266A (en) 1979-08-21

Family

ID=11819385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1294478A Pending JPS54106266A (en) 1978-02-09 1978-02-09 Plate thickness metering method for radioactive ray thickness meter

Country Status (1)

Country Link
JP (1) JPS54106266A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003097902A (en) * 2001-09-20 2003-04-03 Mitsutoyo Corp Caliper gauge and method for correcting error of caliper gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003097902A (en) * 2001-09-20 2003-04-03 Mitsutoyo Corp Caliper gauge and method for correcting error of caliper gauge

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