JPS5372683A - Sample analyzer - Google Patents
Sample analyzerInfo
- Publication number
- JPS5372683A JPS5372683A JP14779376A JP14779376A JPS5372683A JP S5372683 A JPS5372683 A JP S5372683A JP 14779376 A JP14779376 A JP 14779376A JP 14779376 A JP14779376 A JP 14779376A JP S5372683 A JPS5372683 A JP S5372683A
- Authority
- JP
- Japan
- Prior art keywords
- image
- sample analyzer
- display
- simultanesouly
- confirming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To display the irradiation spots of the portion being analyzed simultanesouly in the image of the surface of a test piece, while confirming that portion at all times, by driving in a cascade display means for an image of secondary charged particles and means for stopping a bright spot on the surface of the image.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14779376A JPS5372683A (en) | 1976-12-10 | 1976-12-10 | Sample analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14779376A JPS5372683A (en) | 1976-12-10 | 1976-12-10 | Sample analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5372683A true JPS5372683A (en) | 1978-06-28 |
Family
ID=15438325
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14779376A Pending JPS5372683A (en) | 1976-12-10 | 1976-12-10 | Sample analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5372683A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5635041A (en) * | 1979-08-31 | 1981-04-07 | Univ Tohoku | Analyzing method of state of solid surface and its apparatus |
US6739852B1 (en) * | 1995-03-09 | 2004-05-25 | Outland Technologies Usa, Inc. | Rotary engine and method for determining engagement surface contours therefor |
-
1976
- 1976-12-10 JP JP14779376A patent/JPS5372683A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5635041A (en) * | 1979-08-31 | 1981-04-07 | Univ Tohoku | Analyzing method of state of solid surface and its apparatus |
JPH0240972B2 (en) * | 1979-08-31 | 1990-09-14 | Tohoku Daigaku Gakucho | |
US6739852B1 (en) * | 1995-03-09 | 2004-05-25 | Outland Technologies Usa, Inc. | Rotary engine and method for determining engagement surface contours therefor |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |