JPS5369689A - Inspection apparatus - Google Patents

Inspection apparatus

Info

Publication number
JPS5369689A
JPS5369689A JP14230477A JP14230477A JPS5369689A JP S5369689 A JPS5369689 A JP S5369689A JP 14230477 A JP14230477 A JP 14230477A JP 14230477 A JP14230477 A JP 14230477A JP S5369689 A JPS5369689 A JP S5369689A
Authority
JP
Japan
Prior art keywords
inspection apparatus
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14230477A
Other languages
English (en)
Inventor
Moorii Kuraaku Gurahamu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ferranti International PLC
Original Assignee
Ferranti PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ferranti PLC filed Critical Ferranti PLC
Publication of JPS5369689A publication Critical patent/JPS5369689A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/06—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency using wave or particle radiation
    • G07D7/12—Visible light, infrared or ultraviolet radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP14230477A 1976-12-01 1977-11-29 Inspection apparatus Pending JPS5369689A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB50184/76A GB1592449A (en) 1976-12-01 1976-12-01 Optical inspection apparatus

Publications (1)

Publication Number Publication Date
JPS5369689A true JPS5369689A (en) 1978-06-21

Family

ID=10454993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14230477A Pending JPS5369689A (en) 1976-12-01 1977-11-29 Inspection apparatus

Country Status (4)

Country Link
US (1) US4172666A (ja)
JP (1) JPS5369689A (ja)
DE (1) DE2749873A1 (ja)
GB (1) GB1592449A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583840A (en) * 1978-12-18 1980-06-24 Gretag Ag Quality assessment method of printed matter
JPS58200138A (ja) * 1982-05-18 1983-11-21 Toshiba Corp 表面検査装置
JPS6069539A (ja) * 1983-09-26 1985-04-20 Toshiba Corp 表面欠陥検査装置

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
IT1108254B (it) * 1978-10-24 1985-12-02 Fiat Spa Procedimento e dispositivo per il ilevamento di difetti superficiali di un pezzo che ha subito una lavorazione meccanica
EP0065517B1 (en) * 1980-11-17 1988-12-28 Caterpillar Inc. Surface roughness gauge
US4364663A (en) * 1980-11-17 1982-12-21 Caterpillar Tractor Co. Surface roughness gauge and method
DE3043849A1 (de) * 1980-11-21 1982-07-08 Koninklijke Textielfabrieken Nijverdal-Ten Gate N.V., Almelo Verfahren zum beschauen einer reflektierenden und/oder transparenten, sich bewegenden bahn und beschaumaschine zur durchfuehrung des verfahrens
ATE28367T1 (de) * 1981-08-11 1987-08-15 De La Rue Syst Geraet zur feststellung von klebeband auf dokumenten.
GB2109923B (en) * 1981-11-13 1985-05-22 De La Rue Syst Optical scanner
DE3325125C1 (de) * 1983-07-12 1985-02-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Anordnung zur Markierung von Fehlstellen an schnell laufenden Materialbahnen
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
US5206700A (en) * 1985-03-14 1993-04-27 Diffracto, Ltd. Methods and apparatus for retroreflective surface inspection and distortion measurement
US4715718A (en) * 1985-06-24 1987-12-29 The Dow Chemical Company Method and apparatus for on-line monitoring of laminate bond strength
US4889998A (en) * 1987-01-29 1989-12-26 Nikon Corporation Apparatus with four light detectors for checking surface of mask with pellicle
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
US4794264A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface defect detection and confirmation system and method
DE3882905T2 (de) * 1987-05-27 1994-03-10 Nippon Sheet Glass Co Ltd Fühler zur unterscheidung von fehlern in lichtdurchlassendem bahnförmigem material.
DE3811563A1 (de) * 1988-04-06 1989-10-19 Fraunhofer Ges Forschung Vorrichtung zur optischen inspektion von bewegten materialoberflaechen
US5068523A (en) * 1990-03-02 1991-11-26 Intec Corp. Scanner detector array and light diffuser
WO1991018281A1 (en) * 1990-05-23 1991-11-28 Pulp And Paper Research Institute Of Canada On-line dirt counter
US5168322A (en) * 1991-08-19 1992-12-01 Diffracto Ltd. Surface inspection using retro-reflective light field
US5225890A (en) * 1991-10-28 1993-07-06 Gencorp Inc. Surface inspection apparatus and method
DE4447061A1 (de) * 1994-12-29 1996-07-04 Huels Chemische Werke Ag Verfahren zur Beurteilung der Druckqualität
WO1997026529A1 (en) * 1996-01-19 1997-07-24 Phase Metrics Surface inspection apparatus and method
EP0816825A3 (en) * 1996-06-26 1998-08-12 Toshiba Engineering Corporation Method and apparatus for inspecting streak
DE102005042991A1 (de) * 2005-09-09 2007-03-22 Giesecke & Devrient Gmbh Verfahren und Vorrichtung zum Testen von Wertdokumenten
WO2009012106A1 (en) * 2007-07-13 2009-01-22 Vincent Chow System and method for the attenuation of electrical noise

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE621843A (ja) * 1961-09-05
CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
US3984189A (en) * 1973-01-19 1976-10-05 Hitachi Electronics, Ltd. Method and apparatus for detecting defects in a surface regardless of surface finish

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583840A (en) * 1978-12-18 1980-06-24 Gretag Ag Quality assessment method of printed matter
JPS58200138A (ja) * 1982-05-18 1983-11-21 Toshiba Corp 表面検査装置
JPH0434098B2 (ja) * 1982-05-18 1992-06-04 Tokyo Shibaura Electric Co
JPS6069539A (ja) * 1983-09-26 1985-04-20 Toshiba Corp 表面欠陥検査装置
JPH0334578B2 (ja) * 1983-09-26 1991-05-23 Tokyo Shibaura Electric Co

Also Published As

Publication number Publication date
DE2749873A1 (de) 1978-06-08
GB1592449A (en) 1981-07-08
US4172666A (en) 1979-10-30

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