JPS5364592A - Flameless atomic absorption anlysis method - Google Patents

Flameless atomic absorption anlysis method

Info

Publication number
JPS5364592A
JPS5364592A JP13998976A JP13998976A JPS5364592A JP S5364592 A JPS5364592 A JP S5364592A JP 13998976 A JP13998976 A JP 13998976A JP 13998976 A JP13998976 A JP 13998976A JP S5364592 A JPS5364592 A JP S5364592A
Authority
JP
Japan
Prior art keywords
anlysis
atomic absorption
flameless atomic
flameless
specimenthrough
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13998976A
Other languages
Japanese (ja)
Inventor
Yoshiaki Maruno
Seiji Kamiharashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP13998976A priority Critical patent/JPS5364592A/en
Publication of JPS5364592A publication Critical patent/JPS5364592A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/74Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces

Abstract

PURPOSE:To suppress the interference of the coexisting halogen compound, by previously coating the surface, of the graphite for discomposing and reducing to a atoms the specimenthrough electric heating, with high melting point metal.
JP13998976A 1976-11-19 1976-11-19 Flameless atomic absorption anlysis method Pending JPS5364592A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13998976A JPS5364592A (en) 1976-11-19 1976-11-19 Flameless atomic absorption anlysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13998976A JPS5364592A (en) 1976-11-19 1976-11-19 Flameless atomic absorption anlysis method

Publications (1)

Publication Number Publication Date
JPS5364592A true JPS5364592A (en) 1978-06-09

Family

ID=15258337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13998976A Pending JPS5364592A (en) 1976-11-19 1976-11-19 Flameless atomic absorption anlysis method

Country Status (1)

Country Link
JP (1) JPS5364592A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542082A (en) * 1978-09-20 1980-03-25 Matsushita Electric Ind Co Ltd Method of measuring minute quantity of indium by flameless atomic absorption spectroscopy
JPS5542083A (en) * 1978-09-20 1980-03-25 Matsushita Electric Ind Co Ltd Method of measuring minute quantity of selenium by flameless atomic absorption spectroscopy
EP0467326A2 (en) * 1990-07-19 1992-01-22 Hitachi, Ltd. Sample handling method for atomic absorption analysis

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542082A (en) * 1978-09-20 1980-03-25 Matsushita Electric Ind Co Ltd Method of measuring minute quantity of indium by flameless atomic absorption spectroscopy
JPS5542083A (en) * 1978-09-20 1980-03-25 Matsushita Electric Ind Co Ltd Method of measuring minute quantity of selenium by flameless atomic absorption spectroscopy
JPS5853857B2 (en) * 1978-09-20 1983-12-01 松下電器産業株式会社 Quantification of trace amounts of indium using flameless atomic absorption spectrometry
JPS5853858B2 (en) * 1978-09-20 1983-12-01 松下電器産業株式会社 Determination of trace amounts of selenium using flameless atomic absorption spectrometry
EP0467326A2 (en) * 1990-07-19 1992-01-22 Hitachi, Ltd. Sample handling method for atomic absorption analysis
US5235862A (en) * 1990-07-19 1993-08-17 Hitachi, Ltd. Sample handling method and apparatus for atomic absorption analysis

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