JPS5338597B1 - - Google Patents

Info

Publication number
JPS5338597B1
JPS5338597B1 JP790471A JP790471A JPS5338597B1 JP S5338597 B1 JPS5338597 B1 JP S5338597B1 JP 790471 A JP790471 A JP 790471A JP 790471 A JP790471 A JP 790471A JP S5338597 B1 JPS5338597 B1 JP S5338597B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP790471A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5338597B1 publication Critical patent/JPS5338597B1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P32/00Diffusion of dopants within, into or out of wafers, substrates or parts of devices
    • H10P32/10Diffusion of dopants within, into or out of semiconductor bodies or layers
    • H10P32/14Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
    • H10P32/1408Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
    • H10P32/141Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers the applied layer comprising oxides only
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P32/00Diffusion of dopants within, into or out of wafers, substrates or parts of devices
    • H10P32/10Diffusion of dopants within, into or out of semiconductor bodies or layers
    • H10P32/17Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
    • H10P32/171Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Photovoltaic Devices (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Silicon Compounds (AREA)
  • Formation Of Insulating Films (AREA)
JP790471A 1970-02-19 1971-02-19 Pending JPS5338597B1 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2007752A DE2007752B2 (de) 1970-02-19 1970-02-19 Verfahren zum Herstellen von dotiertem Halbleitermaterial

Publications (1)

Publication Number Publication Date
JPS5338597B1 true JPS5338597B1 (enExample) 1978-10-16

Family

ID=5762769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP790471A Pending JPS5338597B1 (enExample) 1970-02-19 1971-02-19

Country Status (8)

Country Link
JP (1) JPS5338597B1 (enExample)
AT (1) AT338335B (enExample)
CH (1) CH519249A (enExample)
DE (1) DE2007752B2 (enExample)
FR (1) FR2080610B1 (enExample)
GB (1) GB1289432A (enExample)
NL (1) NL7102176A (enExample)
SE (1) SE366227B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2262021C2 (de) * 1972-12-19 1982-12-30 Degussa Ag, 6000 Frankfurt Verfahren zur Dotierung von Halbleitersilicium
DE3375253D1 (de) * 1982-09-23 1988-02-11 Allied Corp Polymeric boron-nitrogen dopant
JPH01135017A (ja) * 1987-11-20 1989-05-26 Fujitsu Ltd 半導体装置の製造方法
DE4013929C2 (de) * 1989-05-02 1995-12-07 Toshiba Kawasaki Kk Verfahren zum Einbringen von Störstoffen in eine Halbleitermaterial-Schicht beim Herstellen eines Halbleiterbauelements und Anwendung des Verfahrens

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3084079A (en) * 1960-10-13 1963-04-02 Pacific Semiconductors Inc Manufacture of semiconductor devices
US3355291A (en) * 1963-10-08 1967-11-28 Texas Instruments Inc Application of glass to semiconductor devices
US3514348A (en) * 1967-05-10 1970-05-26 Ncr Co Method for making semiconductor devices
JPS4822536B1 (enExample) * 1969-03-20 1973-07-06

Also Published As

Publication number Publication date
FR2080610B1 (enExample) 1976-04-16
DE2007752A1 (de) 1971-08-26
DE2007752B2 (de) 1978-07-27
GB1289432A (enExample) 1972-09-20
FR2080610A1 (enExample) 1971-11-19
AT338335B (de) 1977-08-25
NL7102176A (enExample) 1971-08-23
SE366227B (enExample) 1974-04-22
ATA82571A (de) 1976-12-15
DE2007752C3 (enExample) 1979-04-05
CH519249A (de) 1972-02-15

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