JPS53133082A - Method of increasing amount of sample for trace analysis by fluoroscent xxrays - Google Patents

Method of increasing amount of sample for trace analysis by fluoroscent xxrays

Info

Publication number
JPS53133082A
JPS53133082A JP10954477A JP10954477A JPS53133082A JP S53133082 A JPS53133082 A JP S53133082A JP 10954477 A JP10954477 A JP 10954477A JP 10954477 A JP10954477 A JP 10954477A JP S53133082 A JPS53133082 A JP S53133082A
Authority
JP
Japan
Prior art keywords
xxrays
fluoroscent
sample
increasing amount
trace analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10954477A
Other languages
English (en)
Japanese (ja)
Inventor
Kunooto Yoahimu
Shiyuuenke Hainritsuhi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KERNENERGIEVERWERT GES fur
Original Assignee
KERNENERGIEVERWERT GES fur
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KERNENERGIEVERWERT GES fur filed Critical KERNENERGIEVERWERT GES fur
Publication of JPS53133082A publication Critical patent/JPS53133082A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2202—Preparing specimens therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP10954477A 1977-04-22 1977-09-13 Method of increasing amount of sample for trace analysis by fluoroscent xxrays Pending JPS53133082A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19772717925 DE2717925C3 (de) 1977-04-22 1977-04-22 Verwendung eines für die Spurenanalyse durch Röntgenfluoreszenz diedenden Anreicherungsverfahren

Publications (1)

Publication Number Publication Date
JPS53133082A true JPS53133082A (en) 1978-11-20

Family

ID=6007015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10954477A Pending JPS53133082A (en) 1977-04-22 1977-09-13 Method of increasing amount of sample for trace analysis by fluoroscent xxrays

Country Status (6)

Country Link
JP (1) JPS53133082A (de)
AU (1) AU2700577A (de)
DE (1) DE2717925C3 (de)
FR (1) FR2388271A1 (de)
GB (1) GB1548488A (de)
NL (1) NL7707349A (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3139128A1 (de) * 1981-08-27 1983-03-17 Nippon Steel Corp., Tokyo Verfahren und vorrichtung zur roentgenbeugungsspektrokopie
WO2005033712A1 (en) * 2002-10-29 2005-04-14 E. I. Du Pont De Nemours And Company Method and apparatus for performing chemical reactions in a plurality of samples
CN1695061A (zh) 2002-10-29 2005-11-09 纳幕尔杜邦公司 对多个试样进行化学反应的方法和装置
DE102007039000B4 (de) * 2007-05-21 2009-01-22 Terrachem Gmbh Analysenlabor Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2632001C3 (de) 1976-07-16 1980-10-23 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Meßanordnung zur Röntgenfluoreszenzanalyse

Also Published As

Publication number Publication date
AU2700577A (en) 1979-01-18
DE2717925A1 (de) 1978-10-26
GB1548488A (en) 1979-07-18
DE2717925C3 (de) 1981-09-03
NL7707349A (nl) 1978-10-24
FR2388271A1 (fr) 1978-11-17
DE2717925B2 (de) 1981-01-22
FR2388271B1 (de) 1981-11-27

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