JPS53109481A - Test method for semiconductor circuit - Google Patents

Test method for semiconductor circuit

Info

Publication number
JPS53109481A
JPS53109481A JP2387777A JP2387777A JPS53109481A JP S53109481 A JPS53109481 A JP S53109481A JP 2387777 A JP2387777 A JP 2387777A JP 2387777 A JP2387777 A JP 2387777A JP S53109481 A JPS53109481 A JP S53109481A
Authority
JP
Japan
Prior art keywords
semiconductor circuit
test method
circuit
pulse
delay time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2387777A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6124654B2 (enExample
Inventor
Shigetake Hamaguchi
Koji Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP2387777A priority Critical patent/JPS53109481A/ja
Publication of JPS53109481A publication Critical patent/JPS53109481A/ja
Publication of JPS6124654B2 publication Critical patent/JPS6124654B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2387777A 1977-03-07 1977-03-07 Test method for semiconductor circuit Granted JPS53109481A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2387777A JPS53109481A (en) 1977-03-07 1977-03-07 Test method for semiconductor circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2387777A JPS53109481A (en) 1977-03-07 1977-03-07 Test method for semiconductor circuit

Publications (2)

Publication Number Publication Date
JPS53109481A true JPS53109481A (en) 1978-09-25
JPS6124654B2 JPS6124654B2 (enExample) 1986-06-12

Family

ID=12122671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2387777A Granted JPS53109481A (en) 1977-03-07 1977-03-07 Test method for semiconductor circuit

Country Status (1)

Country Link
JP (1) JPS53109481A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5651679A (en) * 1979-10-03 1981-05-09 Hitachi Ltd Measuring circuit for minimum operation pulse
KR101013442B1 (ko) 2007-04-13 2011-02-14 주식회사 하이닉스반도체 반도체 집적 회로의 전압 측정 장치 및 이를 포함하는 전압측정 시스템

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5651679A (en) * 1979-10-03 1981-05-09 Hitachi Ltd Measuring circuit for minimum operation pulse
KR101013442B1 (ko) 2007-04-13 2011-02-14 주식회사 하이닉스반도체 반도체 집적 회로의 전압 측정 장치 및 이를 포함하는 전압측정 시스템
US8013593B2 (en) 2007-04-13 2011-09-06 Hynix Semiconductor Inc. Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same

Also Published As

Publication number Publication date
JPS6124654B2 (enExample) 1986-06-12

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