JPS5287662A - Eddy current converter for testing conductive layer coated on hole portion of printed substrate nonndestructively - Google Patents

Eddy current converter for testing conductive layer coated on hole portion of printed substrate nonndestructively

Info

Publication number
JPS5287662A
JPS5287662A JP373576A JP373576A JPS5287662A JP S5287662 A JPS5287662 A JP S5287662A JP 373576 A JP373576 A JP 373576A JP 373576 A JP373576 A JP 373576A JP S5287662 A JPS5287662 A JP S5287662A
Authority
JP
Japan
Prior art keywords
nonndestructively
conductive layer
eddy current
hole portion
current converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP373576A
Other languages
Japanese (ja)
Other versions
JPS5750255B2 (en
Inventor
Igorobuichi Rogachi Buikutooru
Buashiriebuichi Suho Buashirii
Nikoraebuichi Shiyukato Petoru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MO ENERUGECHICHIESUKII I
Original Assignee
MO ENERUGECHICHIESUKII I
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MO ENERUGECHICHIESUKII I filed Critical MO ENERUGECHICHIESUKII I
Publication of JPS5287662A publication Critical patent/JPS5287662A/en
Publication of JPS5750255B2 publication Critical patent/JPS5750255B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Pathology (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Coils Or Transformers For Communication (AREA)
  • Coils Of Transformers For General Uses (AREA)
JP373576A 1975-01-15 1976-01-14 Eddy current converter for testing conductive layer coated on hole portion of printed substrate nonndestructively Granted JPS5287662A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU7502090705A SU563615A1 (en) 1975-01-15 1975-01-15 Eddy current convertor

Publications (2)

Publication Number Publication Date
JPS5287662A true JPS5287662A (en) 1977-07-21
JPS5750255B2 JPS5750255B2 (en) 1982-10-26

Family

ID=20605590

Family Applications (1)

Application Number Title Priority Date Filing Date
JP373576A Granted JPS5287662A (en) 1975-01-15 1976-01-14 Eddy current converter for testing conductive layer coated on hole portion of printed substrate nonndestructively

Country Status (3)

Country Link
JP (1) JPS5287662A (en)
SE (1) SE413944B (en)
SU (1) SU563615A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7123519B1 (en) * 2021-06-10 2022-08-23 東芝三菱電機産業システム株式会社 Eddy current inspection method

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58183156U (en) * 1982-06-02 1983-12-06 日本発条株式会社 Automobile seat armrest
JPS6256451U (en) * 1985-09-30 1987-04-08
JPS6366956U (en) * 1986-10-22 1988-05-06
JPH0525958Y2 (en) * 1987-03-03 1993-06-30

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7123519B1 (en) * 2021-06-10 2022-08-23 東芝三菱電機産業システム株式会社 Eddy current inspection method
WO2022259444A1 (en) * 2021-06-10 2022-12-15 東芝三菱電機産業システム株式会社 Eddy current inspection method

Also Published As

Publication number Publication date
SU563615A1 (en) 1977-06-30
JPS5750255B2 (en) 1982-10-26
SE7600325L (en) 1976-07-16
SE413944B (en) 1980-06-30

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Legal Events

Date Code Title Description
TRDD Decision of grant or rejection written
LAPS Cancellation because of no payment of annual fees