JPS5283267A - Method of testing conductivity by utilizing eddy current - Google Patents

Method of testing conductivity by utilizing eddy current

Info

Publication number
JPS5283267A
JPS5283267A JP15480576A JP15480576A JPS5283267A JP S5283267 A JPS5283267 A JP S5283267A JP 15480576 A JP15480576 A JP 15480576A JP 15480576 A JP15480576 A JP 15480576A JP S5283267 A JPS5283267 A JP S5283267A
Authority
JP
Japan
Prior art keywords
eddy current
utilizing eddy
testing conductivity
conductivity
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15480576A
Other languages
English (en)
Other versions
JPS5528026B2 (ja
Inventor
Rarufu Buraun Gooton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Law Engineers K J
Original Assignee
Law Engineers K J
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Law Engineers K J filed Critical Law Engineers K J
Publication of JPS5283267A publication Critical patent/JPS5283267A/ja
Publication of JPS5528026B2 publication Critical patent/JPS5528026B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/023—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance where the material is placed in the field of a coil
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP15480576A 1975-12-29 1976-12-22 Method of testing conductivity by utilizing eddy current Granted JPS5283267A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/644,809 US4095180A (en) 1975-12-29 1975-12-29 Method and apparatus for testing conductivity using eddy currents

Publications (2)

Publication Number Publication Date
JPS5283267A true JPS5283267A (en) 1977-07-12
JPS5528026B2 JPS5528026B2 (ja) 1980-07-24

Family

ID=24586427

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15480576A Granted JPS5283267A (en) 1975-12-29 1976-12-22 Method of testing conductivity by utilizing eddy current

Country Status (6)

Country Link
US (1) US4095180A (ja)
JP (1) JPS5283267A (ja)
CA (1) CA1056915A (ja)
DE (1) DE2659073C3 (ja)
FR (1) FR2337340A1 (ja)
GB (1) GB1572034A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447961A (en) * 1987-08-19 1989-02-22 Taiyo Keisoku Kk Ac type minus effect detector
JPH01202653A (ja) * 1987-12-17 1989-08-15 Atlantic Richfield Co <Arco> 容器壁における腐食を検出する方法

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT359178B (de) * 1976-04-20 1980-10-27 Rodler Ing Hans Einrichtung zum untersuchen biologischer koerper mit elektromagnetischen feldern
US4348639A (en) * 1979-05-18 1982-09-07 Triple Dee Electronics Inc. Transmitter-receiver loop buried metal object locator with switch controlled reference voltage
DE3005915C2 (de) * 1980-02-16 1985-01-10 Skf Kugellagerfabriken Gmbh, 8720 Schweinfurt Wirbelstromprüfgerät für Oberflächenfehler
EP0062396A3 (en) * 1981-03-26 1983-06-22 Environmental Products Corporation Aluminium can detector
FR2519934A1 (fr) * 1982-01-21 1983-07-22 Nguyen Manh Khanh Avion multiplan indeformable
DE3273999D1 (en) * 1982-07-23 1986-12-04 Electricity Council Control process of the heat treatment of aluminium alloy strip
US4553094A (en) * 1983-06-20 1985-11-12 K. J. Law Engineers, Inc. Method and apparatus for measuring conductivity using eddy currents with temperature compensation feature
EP0193168A3 (en) * 1985-02-25 1989-01-25 Kubota Limited Method of inspecting carburization and probe therefor
US4745809A (en) * 1986-08-12 1988-05-24 Grumman Aerospace Corporation Composite analyzer tester
US4747310A (en) * 1986-08-12 1988-05-31 Grumman Aerospace Corporation Probe for composite analyzer tester
US4943770A (en) * 1987-04-21 1990-07-24 Mccormick Laboratories, Inc. Device for accurately detecting the position of a ferromagnetic material inside biological tissue
DE3743521A1 (de) * 1987-12-22 1989-07-06 Foerster Inst Dr Friedrich Vorrichtung zum pruefen von halbzeug
DE3815010A1 (de) * 1988-04-30 1989-11-09 Leybold Ag Schaltungsanordnung fuer den kombinierten einsatz einer induktiven und einer kapazitiven einrichtung fuer die zerstoerungsfreie messung des ohmschen wiederstands duenner schichten
US4947117A (en) * 1989-01-03 1990-08-07 Iowa State University Research Foundation Nondestructive detection of an undesirable metallic phase, T1, during processing of aluminum-lithium alloys
FR2648236B1 (fr) * 1989-06-12 1991-12-20 Onera (Off Nat Aerospatiale) Appareil de mesure d'impedance surfacique
DE4022563A1 (de) * 1990-04-11 1991-10-17 Flachglas Ag Verfahren zur kontaktlosen messung des elektrischen widerstands eines untersuchungsmaterials
US5394084A (en) * 1991-12-23 1995-02-28 The Boeing Company Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements
CA2076205C (en) * 1992-08-14 1999-04-20 Valentino S. Cecco Differential transmit-receive eddy current probe incorporating bracelets of multi-coil units
US7161350B2 (en) * 1999-09-07 2007-01-09 Jentek Sensors, Inc. Method for material property monitoring with perforated, surface mounted sensors
US7824244B2 (en) * 2007-05-30 2010-11-02 Corning Incorporated Methods and apparatus for polishing a semiconductor wafer
CA2385868A1 (en) * 1999-09-20 2001-03-29 Jentek Sensors, Inc. Eddy-current sensor arrays
US7031687B2 (en) * 2001-04-18 2006-04-18 Nokia Corporation Balanced circuit arrangement and method for linearizing such an arrangement
KR101284943B1 (ko) * 2006-06-30 2013-07-10 엘지디스플레이 주식회사 몰드의 제조방법
CN114858867A (zh) * 2022-07-11 2022-08-05 国家海洋技术中心 一种电磁感应式电导率传感器的单控温点定标方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499281A (ja) * 1972-05-15 1974-01-26

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3020470A (en) * 1943-06-04 1962-02-06 Elbert N Shawhan Submerged body detection system
US2696588A (en) * 1950-07-18 1954-12-07 Heyl & Patterson Surface moisture detection system
GB975561A (en) * 1960-07-22 1964-11-18 Wiggin & Co Ltd Henry Improvements in or relating to eddy current testing of metals
US3510761A (en) * 1963-03-04 1970-05-05 Bissett Berman Corp Compensated salinometer
US3273056A (en) * 1963-03-22 1966-09-13 Magnaflux Corp Eddy current testing system in which the power applying circuit has a low output impedance relative to the effective input impedance of the test coil unit
US3416071A (en) * 1965-04-19 1968-12-10 Automation Forster Inc Electronic tuner for inductive probe testing apparatus
US3337796A (en) * 1965-04-19 1967-08-22 Automation Forster Inc Eddy current testing device with means for sampling the output signal to provide a signal proportional to the instantaneous value of said output signal at a particular phase
US3418572A (en) * 1966-02-11 1968-12-24 Thomas G. Humphreys Jr. Apparatus including variable frequency indicating means for locating and tracing conductive structures
US3443219A (en) * 1966-07-07 1969-05-06 Industrial Nucleonics Corp Dielectric materials gauging system with input signal frequency automatically variable in response to detected signal phase shift variation
US3443220A (en) * 1966-07-07 1969-05-06 Industrial Nucleonics Corp Dielectric materials gauging system with input signal frequency automatically variable in response to a variation from a selected phase shift in the detected signal
US3443218A (en) * 1966-07-07 1969-05-06 Industrial Nucleonics Corp Hybrid phase dielectric materials gauging system with input signal frequency automatically variable in response to a deviation from a reference phase shift which is also variable with frequency
JPS499388B1 (ja) * 1968-05-25 1974-03-04
US3491289A (en) * 1968-12-17 1970-01-20 Atomic Energy Commission Non-contact eddy current instrument
US3619771A (en) * 1969-09-02 1971-11-09 Rudolf G Hentschel Method of an apparatus for selecting the optimum test frequency in eddy current testing
US3706029A (en) * 1971-11-16 1972-12-12 Atomic Energy Commission Multiple parameter eddy current nondestructive testing device using plural transformation rotators to resolve each parameter
US3721896A (en) * 1971-12-23 1973-03-20 Nippon Kokan Kk Improved phase sensitive eddy current defect detector utilizing frequency doubling of detected signal prior to phase detection
US3764897A (en) * 1971-12-28 1973-10-09 Singer Co Electromagnetic thickness gauging using a transmitting coil shaped to provide a constant field over a range of measuring distances
US3848182A (en) * 1973-08-15 1974-11-12 Magnetic Analysis Corp Apparatus for limiting phase-angle response range, particularly in eddy current testing apparatus
US3904957A (en) * 1973-09-29 1975-09-09 Foerster Inst Dr Friedrich Eddy current test apparatus with peak signal value storage means
US4006405A (en) * 1975-01-13 1977-02-01 The Singer Company Method and apparatus for measuring parameters of a conductive material which can be used in independently determining thickness and conductivity

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499281A (ja) * 1972-05-15 1974-01-26

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447961A (en) * 1987-08-19 1989-02-22 Taiyo Keisoku Kk Ac type minus effect detector
JPH01202653A (ja) * 1987-12-17 1989-08-15 Atlantic Richfield Co <Arco> 容器壁における腐食を検出する方法

Also Published As

Publication number Publication date
CA1056915A (en) 1979-06-19
GB1572034A (en) 1980-07-23
JPS5528026B2 (ja) 1980-07-24
FR2337340A1 (fr) 1977-07-29
DE2659073B2 (de) 1980-01-17
DE2659073A1 (de) 1977-07-07
DE2659073C3 (de) 1980-09-11
FR2337340B1 (ja) 1981-12-11
US4095180A (en) 1978-06-13

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