JPS5240074A - Method for inspection of electrical characteristics of resin molded t ype transistors - Google Patents

Method for inspection of electrical characteristics of resin molded t ype transistors

Info

Publication number
JPS5240074A
JPS5240074A JP11562075A JP11562075A JPS5240074A JP S5240074 A JPS5240074 A JP S5240074A JP 11562075 A JP11562075 A JP 11562075A JP 11562075 A JP11562075 A JP 11562075A JP S5240074 A JPS5240074 A JP S5240074A
Authority
JP
Japan
Prior art keywords
inspection
electrical characteristics
resin molded
transistors
ype
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11562075A
Other languages
Japanese (ja)
Inventor
Sumio Nagase
Hideo Kano
Tsuneichi Odaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11562075A priority Critical patent/JPS5240074A/en
Publication of JPS5240074A publication Critical patent/JPS5240074A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:A method for inspection of electrical characteristics of resin molded type transistors, which does not use expensive apparatus and is able to shorten inspection time.
JP11562075A 1975-09-26 1975-09-26 Method for inspection of electrical characteristics of resin molded t ype transistors Pending JPS5240074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11562075A JPS5240074A (en) 1975-09-26 1975-09-26 Method for inspection of electrical characteristics of resin molded t ype transistors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11562075A JPS5240074A (en) 1975-09-26 1975-09-26 Method for inspection of electrical characteristics of resin molded t ype transistors

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP16388682A Division JPS5874063A (en) 1982-09-22 1982-09-22 Manufacture of resin mold type semiconductor device
JP16388582A Division JPS5874062A (en) 1982-09-22 1982-09-22 Manufacture of resin mold type semiconductor device

Publications (1)

Publication Number Publication Date
JPS5240074A true JPS5240074A (en) 1977-03-28

Family

ID=14667153

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11562075A Pending JPS5240074A (en) 1975-09-26 1975-09-26 Method for inspection of electrical characteristics of resin molded t ype transistors

Country Status (1)

Country Link
JP (1) JPS5240074A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56106459U (en) * 1980-01-17 1981-08-19
JPS59123247A (en) * 1982-12-28 1984-07-17 Mitsubishi Electric Corp Manufacture of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56106459U (en) * 1980-01-17 1981-08-19
JPS59123247A (en) * 1982-12-28 1984-07-17 Mitsubishi Electric Corp Manufacture of semiconductor device

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