JPS5223699B2 - - Google Patents

Info

Publication number
JPS5223699B2
JPS5223699B2 JP47068760A JP6876072A JPS5223699B2 JP S5223699 B2 JPS5223699 B2 JP S5223699B2 JP 47068760 A JP47068760 A JP 47068760A JP 6876072 A JP6876072 A JP 6876072A JP S5223699 B2 JPS5223699 B2 JP S5223699B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP47068760A
Other versions
JPS4826036A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4826036A publication Critical patent/JPS4826036A/ja
Publication of JPS5223699B2 publication Critical patent/JPS5223699B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP47068760A 1971-08-04 1972-07-11 Expired JPS5223699B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00168875A US3805152A (en) 1971-08-04 1971-08-04 Recirculating testing methods and apparatus

Publications (2)

Publication Number Publication Date
JPS4826036A JPS4826036A (ja) 1973-04-05
JPS5223699B2 true JPS5223699B2 (ja) 1977-06-25

Family

ID=22613311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47068760A Expired JPS5223699B2 (ja) 1971-08-04 1972-07-11

Country Status (4)

Country Link
US (1) US3805152A (ja)
JP (1) JPS5223699B2 (ja)
FR (1) FR2148313B1 (ja)
GB (1) GB1355296A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174271U (ja) * 1987-01-30 1988-11-11

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IN146507B (ja) * 1975-09-29 1979-06-23 Ericsson Telefon Ab L M
DE2746743C2 (de) * 1977-10-18 1986-04-17 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und Anordnung zur computergesteuerten Erzeugung von Impulsintervallen
DE2829709C2 (de) * 1978-07-06 1984-02-23 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und Anordnung zur Erzeugung zeitlich unmittelbar aufeinanderfolgender Impulszyklen
DE2839950B1 (de) * 1978-09-14 1979-10-25 Ibm Deutschland Einrichtung zur Feststellung der Laenge beliebiger Schieberegister
FR2460526A1 (fr) * 1979-06-29 1981-01-23 Ibm France Procede de mesure du temps d'acces d'adresse de memoires mettant en oeuvre la technique de recirculation des donnees, et testeur en resultant
JPS59198596A (ja) * 1983-04-22 1984-11-10 Hitachi Micro Comput Eng Ltd 検査回路
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
JPS6238600A (ja) * 1985-08-14 1987-02-19 Fujitsu Ltd 半導体記憶装置
JPS62120698A (ja) * 1985-11-20 1987-06-01 Fujitsu Ltd 半導体記憶回路
US4841485A (en) * 1987-11-05 1989-06-20 International Business Machines Corporation Read/write memory device with an embedded read-only pattern and method for providing same
JP2956145B2 (ja) * 1990-06-28 1999-10-04 日本電気株式会社 半導体集積回路装置
US5287363A (en) * 1991-07-01 1994-02-15 Disk Technician Corporation System for locating and anticipating data storage media failures
JP2962238B2 (ja) * 1996-08-15 1999-10-12 日本電気株式会社 論理回路及びその試験方法
JP4307445B2 (ja) * 2003-07-22 2009-08-05 富士通マイクロエレクトロニクス株式会社 内蔵されるメモリマクロのａｃ特性を測定するテスト回路を有する集積回路装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3487304A (en) * 1968-02-02 1969-12-30 Aai Corp Sequential test apparatus for electrical circuits including a digital controlled analog test signal generating unit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174271U (ja) * 1987-01-30 1988-11-11

Also Published As

Publication number Publication date
GB1355296A (en) 1974-06-05
FR2148313B1 (ja) 1974-12-27
FR2148313A1 (ja) 1973-03-11
JPS4826036A (ja) 1973-04-05
US3805152A (en) 1974-04-16

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