JPS5221772A - Measuring system for working temperature of semiconductor element - Google Patents
Measuring system for working temperature of semiconductor elementInfo
- Publication number
- JPS5221772A JPS5221772A JP9798375A JP9798375A JPS5221772A JP S5221772 A JPS5221772 A JP S5221772A JP 9798375 A JP9798375 A JP 9798375A JP 9798375 A JP9798375 A JP 9798375A JP S5221772 A JPS5221772 A JP S5221772A
- Authority
- JP
- Japan
- Prior art keywords
- working temperature
- semiconductor element
- measuring system
- wave
- micro
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9798375A JPS5221772A (en) | 1975-08-12 | 1975-08-12 | Measuring system for working temperature of semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9798375A JPS5221772A (en) | 1975-08-12 | 1975-08-12 | Measuring system for working temperature of semiconductor element |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5221772A true JPS5221772A (en) | 1977-02-18 |
JPS5619590B2 JPS5619590B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1981-05-08 |
Family
ID=14206890
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9798375A Granted JPS5221772A (en) | 1975-08-12 | 1975-08-12 | Measuring system for working temperature of semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5221772A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52114334U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1977-02-21 | 1977-08-30 | ||
JPS5419672U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1977-07-08 | 1979-02-08 | ||
JPS61145704U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1985-03-01 | 1986-09-08 | ||
JP2001228199A (ja) * | 1999-11-30 | 2001-08-24 | Thomson Csf | マイクロ波部品の温度を測定する方法及び装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01177294U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1988-06-03 | 1989-12-18 |
-
1975
- 1975-08-12 JP JP9798375A patent/JPS5221772A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52114334U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1977-02-21 | 1977-08-30 | ||
JPS5419672U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1977-07-08 | 1979-02-08 | ||
JPS61145704U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1985-03-01 | 1986-09-08 | ||
JP2001228199A (ja) * | 1999-11-30 | 2001-08-24 | Thomson Csf | マイクロ波部品の温度を測定する方法及び装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5619590B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1981-05-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS51134558A (en) | Measuring unit | |
JPS5221772A (en) | Measuring system for working temperature of semiconductor element | |
JPS5437582A (en) | Measuring method for capacity of three-terminal semiconductor element | |
JPS5224078A (en) | Ic use measuring device | |
JPS5425882A (en) | Preheating type electronic clinical thermometer | |
JPS529201A (en) | Device for measuring wheel alignment simultaneously | |
JPS5227380A (en) | Measuring system of semiconductor breakdown voltage | |
JPS53125771A (en) | Measuring unit for semiconductor | |
JPS5357878A (en) | Peak value detector | |
JPS5414683A (en) | Measuring circuit for turn-off time | |
JPS5384685A (en) | Semicocductor element measuring method | |
JPS51135474A (en) | To analyze a semiconductor device | |
JPS53112058A (en) | Semiconductor device and temperature characteristic measuring method of the same | |
JPS54946A (en) | Operation speed test circuit for logic element or logic circuit | |
JPS5238952A (en) | Measuring device of clearance | |
JPS5258947A (en) | Measuring device for solids | |
JPS5421177A (en) | Measuring unit for characters | |
JPS52137384A (en) | Maximum discharge charge measuring method | |
JPS53142168A (en) | Reproductive use of semiconductor substrate | |
JPS5228367A (en) | Liquid conductivity measuring apparatus | |
JPS53109481A (en) | Test method for semiconductor circuit | |
JPS5261938A (en) | Tester for integrated circuit function | |
JPS53120382A (en) | Testing method of field effect type semiconductor device | |
JPS53112674A (en) | Measuring method for current-coltage characteristics of semiconductor devic e | |
JPS5223378A (en) | Method of measuring surface temperatures |