JPS52177A - Prober - Google Patents
ProberInfo
- Publication number
- JPS52177A JPS52177A JP7556875A JP7556875A JPS52177A JP S52177 A JPS52177 A JP S52177A JP 7556875 A JP7556875 A JP 7556875A JP 7556875 A JP7556875 A JP 7556875A JP S52177 A JPS52177 A JP S52177A
- Authority
- JP
- Japan
- Prior art keywords
- needle
- prober
- checked
- supporting
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To provide adjustable contacting degree of inspection needle contacted with a part to be checked in predetermined pressure range by supporting the needle at the ends of leaf springs of a pair provided in parallel with each other.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7556875A JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7556875A JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52177A true JPS52177A (en) | 1977-01-05 |
Family
ID=13579902
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7556875A Pending JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52177A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0362938A (en) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | Inspection apparatus |
-
1975
- 1975-06-23 JP JP7556875A patent/JPS52177A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0362938A (en) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | Inspection apparatus |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5383075A (en) | Testing pin | |
SE410271B (en) | PROTESTS FOR AMPUTED LOWER LEGS WITH INSPIRED INSERT | |
BR7606148A (en) | IMPROVEMENTS IN DEVICE TO ADJUST THE EXTENSION OF A GAS SPRING | |
JPS5281402A (en) | Adjusting device for use in steam turbine device | |
JPS5233575A (en) | Differential pressure measuring device | |
GB1549250A (en) | Low cycle fatigue damage counter | |
JPS52151479A (en) | Gas spring apparatus | |
JPS5217851A (en) | Super sonic transfer time measurement device | |
SE7602559L (en) | ERROR DETECTION PROCEDURE IN CONNECTION WITH CONTAINER CLOTHING | |
JPS52177A (en) | Prober | |
JPS5248348A (en) | Origin detecting apparatus | |
JPS5343553A (en) | Test piece size measuring apparatus | |
SE403508B (en) | APPLIANCE FOR TESTING THE IGNITION COIL / CONDENSER IN THE IGNITION SYSTEM IGNITION SYSTEM | |
JPS5320866A (en) | Relative position deviation observing apparatus of patterns | |
JPS5324883A (en) | Vicker's hardness tester | |
ATA654577A (en) | ARRANGEMENT FOR SITTING AN INVERTER STILL | |
JPS51132086A (en) | Specific characteristics variation testing device | |
SE7714411L (en) | FOR ELECTROCHEMICAL DEVICES INTENDED ARRANGEMENTS, INCLUDING A DISC WITH ASSOCIATED STAND OR HALLER | |
JPS559182A (en) | Printed base measuring device | |
JPS51124948A (en) | Method and apparatus for measuring posture angle | |
JPS51139387A (en) | High-temperature magnetic agent for finding fault | |
JPS52151481A (en) | Gas spring apparatus | |
JPS5441144A (en) | Fixing device of electrophotography | |
JPS52134486A (en) | Pressure resistance testing method | |
JPS5223959A (en) | Nicrometer in which a measuring range is made variable |