JPS52146601A - Method of detecting defect of vortex groove formed on disk surface and device therefor - Google Patents

Method of detecting defect of vortex groove formed on disk surface and device therefor

Info

Publication number
JPS52146601A
JPS52146601A JP6208277A JP6208277A JPS52146601A JP S52146601 A JPS52146601 A JP S52146601A JP 6208277 A JP6208277 A JP 6208277A JP 6208277 A JP6208277 A JP 6208277A JP S52146601 A JPS52146601 A JP S52146601A
Authority
JP
Japan
Prior art keywords
groove formed
disk surface
device therefor
vortex groove
detecting defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6208277A
Other languages
English (en)
Other versions
JPS576161B2 (ja
Inventor
Haabaato Fuaiasuta Aasa
Gorogu Aisutoban
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of JPS52146601A publication Critical patent/JPS52146601A/ja
Publication of JPS576161B2 publication Critical patent/JPS576161B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/261—Preparing a master, e.g. exposing photoresist, electroforming
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
    • G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
    • G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Manufacturing Optical Record Carriers (AREA)
JP6208277A 1976-05-28 1977-05-26 Method of detecting defect of vortex groove formed on disk surface and device therefor Granted JPS52146601A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/691,206 US4030835A (en) 1976-05-28 1976-05-28 Defect detection system

Publications (2)

Publication Number Publication Date
JPS52146601A true JPS52146601A (en) 1977-12-06
JPS576161B2 JPS576161B2 (ja) 1982-02-03

Family

ID=24775572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6208277A Granted JPS52146601A (en) 1976-05-28 1977-05-26 Method of detecting defect of vortex groove formed on disk surface and device therefor

Country Status (8)

Country Link
US (1) US4030835A (ja)
JP (1) JPS52146601A (ja)
AU (1) AU511802B2 (ja)
CA (1) CA1095619A (ja)
DE (1) DE2724121C3 (ja)
FR (1) FR2353107A1 (ja)
GB (1) GB1578817A (ja)
IT (1) IT1074352B (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5690246A (en) * 1979-12-24 1981-07-22 Matsushita Electric Ind Co Ltd Optical defect detection device
JPS57161640A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for surface
JPS57184957A (en) * 1981-05-09 1982-11-13 Toshiba Corp Defect inspecting device
JPS58105443A (ja) * 1981-09-08 1983-06-23 デイスコビジヨン・アソシエイツ ビ−ム走査装置
JPS6089735A (ja) * 1983-04-22 1985-05-20 エルヴイ−ン　ズイツク　ゲ−エムベ−ハ−　オブテツク−エレクトロニ−ク 平坦な物品の欠陥検出装置
JP2005114630A (ja) * 2003-10-09 2005-04-28 Sony Corp 凹凸パターン検査装置及び凹凸パターン検査方法

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4155098A (en) * 1977-06-28 1979-05-15 Rca Corporation Groove depth estimation system using diffractive groove effects
US4180830A (en) * 1977-06-28 1979-12-25 Rca Corporation Depth estimation system using diffractive effects of the grooves and signal elements in the grooves
US4197011A (en) * 1977-09-22 1980-04-08 Rca Corporation Defect detection and plotting system
US4303341A (en) * 1977-12-19 1981-12-01 Rca Corporation Optically testing the lateral dimensions of a pattern
US4200396A (en) * 1977-12-19 1980-04-29 Rca Corporation Optically testing the lateral dimensions of a pattern
CH622896A5 (ja) * 1978-03-20 1981-04-30 Landis & Gyr Ag
US4236823A (en) * 1978-09-18 1980-12-02 Rca Corporation Diffractometer for measuring signal depth and width
US4307419A (en) * 1980-04-23 1981-12-22 Rca Corporation Video disc signal surface imaging apparatus
US4352564A (en) * 1980-05-30 1982-10-05 Rca Corporation Missing order defect detection apparatus
US4341469A (en) * 1980-06-18 1982-07-27 Discovision Associates Laser shadowgraph
US4320567A (en) * 1980-06-30 1982-03-23 Rca Corporation Optical inspection method for determining machinability
US4395122A (en) * 1981-04-29 1983-07-26 Rca Corporation Defect detection system
JPS58121148A (ja) * 1982-01-11 1983-07-19 Olympus Optical Co Ltd 光学的情報記録再生装置
US4598997A (en) * 1982-02-15 1986-07-08 Rca Corporation Apparatus and method for detecting defects and dust on a patterned surface
US4477890A (en) * 1982-03-01 1984-10-16 Discovision Associates Mapping disc defect detector
US4541716A (en) * 1983-04-15 1985-09-17 Rca Corporation Detection of defects in a circular or spiral diffraction grating
DE3411934C2 (de) * 1983-04-22 1986-04-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlerfeststellungsvorrichtung
JPS61111036U (ja) * 1984-12-24 1986-07-14
JPH0654221B2 (ja) * 1985-04-12 1994-07-20 株式会社日立製作所 段差測定装置およびその方法
NL8503411A (nl) * 1985-12-11 1987-07-01 Philips Nv Inrichting voor het bepalen van een centreringsfout van een ronde spoorvormige informatiestruktuur in een optische registratiedrager ten opzichte van de draaiingsas van een draaitafel waarop de registratiedrager is aangebracht, alsmede een apparaat voorzien van een dergelijke inrichting en een registratiedrager geschikt voor gebruik in deze inrichting.
JPS62102074U (ja) * 1985-12-18 1987-06-29
JPS62157057U (ja) * 1986-03-27 1987-10-06
JPS63153456A (ja) * 1986-12-18 1988-06-25 Yokogawa Electric Corp 光デイスクテストシステム
JPS63153455A (ja) * 1986-12-18 1988-06-25 Yokogawa Electric Corp 光デイスクテストシステム
US5337146A (en) * 1992-03-30 1994-08-09 University Of New Orleans Diffraction-grating photopolarimeters and spectrophotopolarimeters
US5805285A (en) * 1992-09-18 1998-09-08 J.A. Woollam Co. Inc. Multiple order dispersive optics system and method of use
US5666201A (en) * 1992-09-18 1997-09-09 J.A. Woollam Co. Inc. Multiple order dispersive optics system and method of use
US5413939A (en) * 1993-06-29 1995-05-09 First Medical, Inc. Solid-phase binding assay system for interferometrically measuring analytes bound to an active receptor
AUPM821994A0 (en) * 1994-09-19 1994-10-13 Amcor Limited Washboard measuring apparatus
DE4434475C2 (de) * 1994-09-27 1998-05-28 Basler Gmbh Verfahren und Vorrichtung zur Qualitätskontrolle eines Gegenstandes, insbesondere einer Compact-Disc
DE4434474C2 (de) * 1994-09-27 2000-06-15 Basler Ag Verfahren und Vorrichtung zur vollständigen optischen Qualitätskontrolle von Gegenständen
DE4434473A1 (de) * 1994-09-27 1996-03-28 Basler Gmbh Verfahren und Vorrichtung zur Qualitätskontrolle von Gegenständen mit polarisiertem Licht
CA2236696A1 (en) * 1995-11-08 1997-05-15 David E. Jones Flexible disk mode observer
US6046801A (en) * 1997-12-23 2000-04-04 Analog Technologies, Inc. Laser-based inspection system for optical disks
DE10054099B4 (de) * 2000-10-31 2005-09-01 Steag Eta-Optik Gmbh Verfahren und Vorrichtung zum Bestimmen von Defektenauf oder in einem Gegenstand
FR2826112B1 (fr) * 2001-06-14 2003-09-05 Dev Applic Appareil d'examen micrometrique d'une surface, d'application quelconque et notamment medicale
US7511816B2 (en) * 2005-06-16 2009-03-31 Kla-Tencor Technologies Corp. Methods and systems for determining drift in a position of a light beam with respect to a chuck
JP5390757B2 (ja) * 2007-09-04 2014-01-15 Ｈｏｙａ株式会社 磁気ディスク基板及びその製造方法並びに磁気ディスク及びその製造方法
DE102009029234A1 (de) * 2009-09-07 2011-03-10 Robert Bosch Gmbh Laserprojektor zur Fahrwerksvermessung
CN117681079B (zh) * 2024-02-02 2024-05-14 江苏金穗能源设备制造有限公司 一种防泄漏gis开关壳体用表面处理装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614232A (en) * 1968-11-25 1971-10-19 Ibm Pattern defect sensing using error free blocking spacial filter
US3633037A (en) * 1969-10-15 1972-01-04 Perkin Elmer Corp Method and apparatus for observing, detecting and correcting periodic structures in a moving web
US3842194A (en) * 1971-03-22 1974-10-15 Rca Corp Information records and recording/playback systems therefor
FR2137104B1 (ja) * 1971-05-13 1973-05-11 Roy Kleber
DE2200222A1 (de) * 1972-01-04 1973-07-12 Ibm Deutschland Vorrichtung zur bestimmung der oberflaechenguete
US3783296A (en) * 1972-04-14 1974-01-01 Deering Milliken Res Corp Method and apparatus for detecting flaws in a fabric web
AR205243A1 (es) * 1972-05-11 1976-04-21 Philips Nv Aparato para la lectura de un portador de grabacion reflector plano
FR2212070A6 (ja) * 1972-08-25 1974-07-19 Thomson Csf
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials
US3879131A (en) * 1974-02-06 1975-04-22 Bell Telephone Labor Inc Photomask inspection by real time diffraction pattern analysis
DE2415592C3 (de) * 1974-03-30 1979-06-21 Phieler, Thomas, 2400 Luebeck Verfahren zum Messen von Fehlstellen in einer kreisringförmigen, mit einer Dichtungsmasse versehenen Verschlußzone auf dem Boden eines rotationssymmetrischen Deckels
US3915576A (en) * 1974-09-30 1975-10-28 Mca Disco Vision Method and apparatus for centering a circular disc
NL7413162A (nl) * 1974-10-07 1976-04-09 Philips Nv Inrichting voor het uitlezen van een schijf- vormige registratiedrager.

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5690246A (en) * 1979-12-24 1981-07-22 Matsushita Electric Ind Co Ltd Optical defect detection device
JPS6250774B2 (ja) * 1979-12-24 1987-10-27 Matsushita Electric Ind Co Ltd
JPS57161640A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for surface
JPS57184957A (en) * 1981-05-09 1982-11-13 Toshiba Corp Defect inspecting device
JPS6322255B2 (ja) * 1981-05-09 1988-05-11 Tokyo Shibaura Electric Co
JPS58105443A (ja) * 1981-09-08 1983-06-23 デイスコビジヨン・アソシエイツ ビ−ム走査装置
JPS6089735A (ja) * 1983-04-22 1985-05-20 エルヴイ−ン　ズイツク　ゲ−エムベ−ハ−　オブテツク−エレクトロニ−ク 平坦な物品の欠陥検出装置
JP2005114630A (ja) * 2003-10-09 2005-04-28 Sony Corp 凹凸パターン検査装置及び凹凸パターン検査方法
JP4581370B2 (ja) * 2003-10-09 2010-11-17 ソニー株式会社 凹凸パターン検査装置及び凹凸パターン検査方法

Also Published As

Publication number Publication date
CA1095619A (en) 1981-02-10
DE2724121A1 (de) 1977-12-01
JPS576161B2 (ja) 1982-02-03
GB1578817A (en) 1980-11-12
FR2353107A1 (fr) 1977-12-23
FR2353107B1 (ja) 1982-03-19
DE2724121B2 (de) 1981-06-11
US4030835A (en) 1977-06-21
AU2541177A (en) 1978-11-30
IT1074352B (it) 1985-04-20
DE2724121C3 (de) 1982-03-11
AU511802B2 (en) 1980-09-04

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