JPS5198953A - mos daioodono raifutaimu sokuteiho - Google Patents
mos daioodono raifutaimu sokuteihoInfo
- Publication number
- JPS5198953A JPS5198953A JP50022934A JP2293475A JPS5198953A JP S5198953 A JPS5198953 A JP S5198953A JP 50022934 A JP50022934 A JP 50022934A JP 2293475 A JP2293475 A JP 2293475A JP S5198953 A JPS5198953 A JP S5198953A
- Authority
- JP
- Japan
- Prior art keywords
- raifutaimu
- daioodono
- sokuteiho
- mos
- raifutaimu sokuteiho
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50022934A JPS5198953A (en) | 1975-02-26 | 1975-02-26 | mos daioodono raifutaimu sokuteiho |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50022934A JPS5198953A (en) | 1975-02-26 | 1975-02-26 | mos daioodono raifutaimu sokuteiho |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5198953A true JPS5198953A (en) | 1976-08-31 |
JPS5312783B2 JPS5312783B2 (enrdf_load_stackoverflow) | 1978-05-04 |
Family
ID=12096448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50022934A Granted JPS5198953A (en) | 1975-02-26 | 1975-02-26 | mos daioodono raifutaimu sokuteiho |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5198953A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53120370A (en) * | 1977-03-30 | 1978-10-20 | Agency Of Ind Science & Technol | Measuring method of diffusion distance of minority carriers and its apparatus |
JPH0883828A (ja) * | 1994-09-09 | 1996-03-26 | Mitsubishi Materials Corp | 半導体ウェーハの内部欠陥の測定方法およびこれを用いた熱酸化炉の管理方法 |
-
1975
- 1975-02-26 JP JP50022934A patent/JPS5198953A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53120370A (en) * | 1977-03-30 | 1978-10-20 | Agency Of Ind Science & Technol | Measuring method of diffusion distance of minority carriers and its apparatus |
JPH0883828A (ja) * | 1994-09-09 | 1996-03-26 | Mitsubishi Materials Corp | 半導体ウェーハの内部欠陥の測定方法およびこれを用いた熱酸化炉の管理方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS5312783B2 (enrdf_load_stackoverflow) | 1978-05-04 |
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