JPS5136165A - - Google Patents

Info

Publication number
JPS5136165A
JPS5136165A JP50087868A JP8786875A JPS5136165A JP S5136165 A JPS5136165 A JP S5136165A JP 50087868 A JP50087868 A JP 50087868A JP 8786875 A JP8786875 A JP 8786875A JP S5136165 A JPS5136165 A JP S5136165A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50087868A
Inventor
Erunesuto Peetaas Kurisutofuaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of JPS5136165A publication Critical patent/JPS5136165A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP50087868A 1974-07-22 1975-07-19 Pending JPS5136165A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7409850A NL7409850A (nl) 1974-07-22 1974-07-22 Werkwijze en inrichting voor het testen van een tweedimensionaal patroon.

Publications (1)

Publication Number Publication Date
JPS5136165A true JPS5136165A (ja) 1976-03-26

Family

ID=19821794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50087868A Pending JPS5136165A (ja) 1974-07-22 1975-07-19

Country Status (9)

Country Link
US (1) US4006296A (ja)
JP (1) JPS5136165A (ja)
AU (1) AU499645B2 (ja)
CA (1) CA1061467A (ja)
DE (1) DE2530606A1 (ja)
FR (1) FR2280276A1 (ja)
GB (1) GB1511919A (ja)
IT (1) IT1041313B (ja)
NL (1) NL7409850A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147205A (ja) * 1983-02-12 1984-08-23 Takaharu Miyazaki 輝度信号比較判別の方法

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2321229A1 (fr) * 1975-08-13 1977-03-11 Cit Alcatel Procede et appareillage pour controle automatique de graphisme
US4079416A (en) * 1975-12-01 1978-03-14 Barry-Wehmiller Company Electronic image analyzing method and apparatus
GB1551335A (en) * 1976-03-01 1979-08-30 Smiths Industries Ltd Data-display systems
US4242702A (en) * 1976-12-01 1980-12-30 Hitachi, Ltd. Apparatus for automatically checking external appearance of object
DE2700252C2 (de) * 1977-01-05 1985-03-14 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum Prüfen definierter Strukturen
US4247203A (en) * 1978-04-03 1981-01-27 Kla Instrument Corporation Automatic photomask inspection system and apparatus
US4347001A (en) * 1978-04-03 1982-08-31 Kla Instruments Corporation Automatic photomask inspection system and apparatus
JPS55100787A (en) * 1979-01-25 1980-07-31 Hajime Sangyo Kk Inspection unit for body
US4486775A (en) * 1980-10-17 1984-12-04 Micro Consultants Limited Object recognition
US4481534A (en) * 1981-04-29 1984-11-06 Mitsubishi Denki Kabushiki Kaisha Configuration detecting device
US4509075A (en) * 1981-06-15 1985-04-02 Oxbridge, Inc. Automatic optical inspection apparatus
DE3151265C2 (de) * 1981-12-24 1984-03-29 Bayerische Motoren Werke AG, 8000 München Prüfverfahren für eine Schraubenverbindung und Vorrichtung zur Durchführung des Verfahrens
DE3416883A1 (de) * 1984-05-08 1985-11-14 Robert Prof. Dr.-Ing. 7760 Radolfzell Massen Verfahren und anordnung zur kontinuierlichen beruehrungslosen messung der 2-dimensionalen schrumpfung von strickwaren
DE3432215A1 (de) * 1984-09-01 1986-03-13 kabelmetal electro GmbH, 3000 Hannover Verfahren zur pruefung der geometrie eines lichtwellenleiter
DE3432216A1 (de) * 1984-09-01 1986-03-13 kabelmetal electro GmbH, 3000 Hannover Verfahren zur pruefung der geometrie eines lichtwellenleiters
EP0195161B1 (en) * 1985-03-14 1993-09-15 Nikon Corporation Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
IT1233298B (it) * 1989-01-13 1992-03-26 Gd Spa Sistema per il controllo di estremita' di gruppi di sigarette
DE19628319C2 (de) * 1996-07-13 2000-11-23 Monforts Textilmaschinen Gmbh Einrichtung zum Messen der Rapportlänge eines plastischen Musters

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834051A (ja) * 1971-09-06 1973-05-15
JPS4858476A (ja) * 1971-11-24 1973-08-16
JPS4997648A (ja) * 1973-01-18 1974-09-14

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3309958A (en) * 1965-10-11 1967-03-21 Image Instr Inc Flying spot system for comparing an object with tolerance masks
US3823261A (en) * 1968-05-27 1974-07-09 E Bolsey Image motion and change transducers and systems controlled thereby
US3546377A (en) * 1968-06-12 1970-12-08 Ovitron Corp Video comparator using vidicons with delayed scanning
US3617744A (en) * 1969-07-01 1971-11-02 Bell Telephone Labor Inc Method and apparatus for circuit module testing by comparison of a fluorescent image with a standard pattern
GB1411546A (en) * 1971-12-31 1975-10-29 Image Analysing Computers Ltd Visual display of information
FR2212034A5 (ja) * 1972-12-21 1974-07-19 Cem Comp Electro Mec

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4834051A (ja) * 1971-09-06 1973-05-15
JPS4858476A (ja) * 1971-11-24 1973-08-16
JPS4997648A (ja) * 1973-01-18 1974-09-14

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147205A (ja) * 1983-02-12 1984-08-23 Takaharu Miyazaki 輝度信号比較判別の方法

Also Published As

Publication number Publication date
IT1041313B (it) 1980-01-10
CA1061467A (en) 1979-08-28
AU499645B2 (en) 1979-04-26
US4006296A (en) 1977-02-01
DE2530606A1 (de) 1976-02-12
GB1511919A (en) 1978-05-24
FR2280276A1 (fr) 1976-02-20
NL7409850A (nl) 1976-01-26
AU8320375A (en) 1977-01-20

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