JPS513181A - Handotaisochi narabini sonoseiho - Google Patents
Handotaisochi narabini sonoseihoInfo
- Publication number
- JPS513181A JPS513181A JP50062593A JP6259375A JPS513181A JP S513181 A JPS513181 A JP S513181A JP 50062593 A JP50062593 A JP 50062593A JP 6259375 A JP6259375 A JP 6259375A JP S513181 A JPS513181 A JP S513181A
- Authority
- JP
- Japan
- Prior art keywords
- sonoseiho
- handotaisochi
- narabini
- narabini sonoseiho
- handotaisochi narabini
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/676—Combinations of only thyristors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
- H10P10/12—Bonding of semiconductor wafers or semiconductor substrates to semiconductor wafers or semiconductor substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/904—Charge carrier lifetime control
Landscapes
- Thyristors (AREA)
- Element Separation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/474,033 US3988762A (en) | 1974-05-28 | 1974-05-28 | Minority carrier isolation barriers for semiconductor devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS513181A true JPS513181A (en) | 1976-01-12 |
Family
ID=23881929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50062593A Pending JPS513181A (en) | 1974-05-28 | 1975-05-27 | Handotaisochi narabini sonoseiho |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3988762A (ref) |
| JP (1) | JPS513181A (ref) |
| DE (1) | DE2523055A1 (ref) |
| FR (1) | FR2275885A1 (ref) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05326693A (ja) * | 1991-10-24 | 1993-12-10 | Mitsubishi Electric Corp | 半導体装置の製造方法及び半導体装置 |
| US5270290A (en) * | 1987-08-28 | 1993-12-14 | Mitsubishi Denki Kabushiki Kaisha | Information recording medium and methods of recording and reproducing information on and from the information recording medium |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4184897A (en) * | 1978-09-21 | 1980-01-22 | General Electric Company | Droplet migration doping using carrier droplets |
| US4190467A (en) * | 1978-12-15 | 1980-02-26 | Western Electric Co., Inc. | Semiconductor device production |
| US4755697A (en) * | 1985-07-17 | 1988-07-05 | International Rectifier Corporation | Bidirectional output semiconductor field effect transistor |
| JPH0821678B2 (ja) * | 1987-05-29 | 1996-03-04 | 日産自動車株式会社 | 半導体装置 |
| US6875628B1 (en) * | 1993-05-26 | 2005-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method of the same |
| TW264575B (ref) * | 1993-10-29 | 1995-12-01 | Handotai Energy Kenkyusho Kk | |
| JP2860869B2 (ja) * | 1993-12-02 | 1999-02-24 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
| US5869362A (en) * | 1993-12-02 | 1999-02-09 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
| KR100319332B1 (ko) | 1993-12-22 | 2002-04-22 | 야마자끼 순페이 | 반도체장치및전자광학장치 |
| US6884698B1 (en) | 1994-02-23 | 2005-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device with crystallization of amorphous silicon |
| DE19710375C2 (de) * | 1997-03-13 | 2002-11-07 | Micronas Semiconductor Holding | Verfahren zum Herstellen von räumlich strukturierten Bauteilen |
| US6849874B2 (en) * | 2001-10-26 | 2005-02-01 | Cree, Inc. | Minimizing degradation of SiC bipolar semiconductor devices |
| DE102009051828B4 (de) * | 2009-11-04 | 2014-05-22 | Infineon Technologies Ag | Halbleiterbauelement mit Rekombinationszone und Graben sowie Verfahren zu dessen Herstellung |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2813048A (en) * | 1954-06-24 | 1957-11-12 | Bell Telephone Labor Inc | Temperature gradient zone-melting |
| DE1614410B2 (de) * | 1967-01-25 | 1973-12-13 | Siemens Ag, 1000 Berlin U. 8000 Muenchen | Halbleiterbauelement |
| GB1196576A (en) * | 1968-03-06 | 1970-07-01 | Westinghouse Electric Corp | High Current Gate Controlled Switches |
| GB1250377A (ref) * | 1968-08-24 | 1971-10-20 | ||
| US3727116A (en) * | 1970-05-05 | 1973-04-10 | Rca Corp | Integral thyristor-rectifier device |
-
1974
- 1974-05-28 US US05/474,033 patent/US3988762A/en not_active Expired - Lifetime
-
1975
- 1975-05-24 DE DE19752523055 patent/DE2523055A1/de active Pending
- 1975-05-27 JP JP50062593A patent/JPS513181A/ja active Pending
- 1975-05-28 FR FR7516713A patent/FR2275885A1/fr active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5270290A (en) * | 1987-08-28 | 1993-12-14 | Mitsubishi Denki Kabushiki Kaisha | Information recording medium and methods of recording and reproducing information on and from the information recording medium |
| JPH05326693A (ja) * | 1991-10-24 | 1993-12-10 | Mitsubishi Electric Corp | 半導体装置の製造方法及び半導体装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US3988762A (en) | 1976-10-26 |
| FR2275885A1 (fr) | 1976-01-16 |
| FR2275885B1 (ref) | 1979-03-23 |
| DE2523055A1 (de) | 1975-12-18 |
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