JPS5124872B1 - - Google Patents
Info
- Publication number
- JPS5124872B1 JPS5124872B1 JP45009032A JP903270A JPS5124872B1 JP S5124872 B1 JPS5124872 B1 JP S5124872B1 JP 45009032 A JP45009032 A JP 45009032A JP 903270 A JP903270 A JP 903270A JP S5124872 B1 JPS5124872 B1 JP S5124872B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
- G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
- G07C3/005—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles during manufacturing process
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S209/00—Classifying, separating, and assorting solids
- Y10S209/905—Feeder conveyor holding item by suction
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US468395A US3392830A (en) | 1965-06-29 | 1965-06-29 | Electrical component tester with test multiplexing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5124872B1 true JPS5124872B1 (US20030199744A1-20031023-C00003.png) | 1976-07-27 |
Family
ID=23859635
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3864966A Pending JPS447097B1 (US20030199744A1-20031023-C00003.png) | 1965-06-29 | 1966-06-16 | |
| JP45009032A Pending JPS5124872B1 (US20030199744A1-20031023-C00003.png) | 1965-06-29 | 1970-02-03 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3864966A Pending JPS447097B1 (US20030199744A1-20031023-C00003.png) | 1965-06-29 | 1966-06-16 |
Country Status (8)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5444691U (US20030199744A1-20031023-C00003.png) * | 1977-09-02 | 1979-03-27 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3576494A (en) * | 1967-07-13 | 1971-04-27 | Rca Corp | Digital computer controlled test system |
| US3716134A (en) * | 1971-03-08 | 1973-02-13 | San Fernando Electic Mfg Co | Apparatus for automatically testing and sorting electrical elements |
| US3759383A (en) * | 1971-08-02 | 1973-09-18 | K Inoue | Apparatus for making abrasive articles |
| EP1801602B1 (de) * | 2005-12-21 | 2011-04-06 | Rasco GmbH | Vorrichtung und Verfahren zum Positionieren von elektronischen Mikrochips zum elektrischen Testen |
| CN111777870B (zh) | 2015-06-04 | 2022-06-07 | 太阳化学公司 | 氯化铜酞菁颜料 |
| CN116899918B (zh) * | 2023-07-19 | 2024-05-03 | 明光市永鸿木制品厂 | 一种元器连接件自检装置及自动插针机 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3039604A (en) * | 1959-09-10 | 1962-06-19 | Texas Instruments Inc | Centralized automatic tester for semiconductor units |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2567741A (en) * | 1948-08-20 | 1951-09-11 | Western Electric Co | Article testing and sorting apparatus |
| US2885076A (en) * | 1955-08-30 | 1959-05-05 | Western Electric Co | Handling apparatus for electrical articles |
| US2962655A (en) * | 1955-11-04 | 1960-11-29 | Sylvania Electric Prod | Quality control apparatus |
| US2999587A (en) * | 1957-08-12 | 1961-09-12 | Pacific Semiconductors Inc | Automatic diode sorter |
| US3094212A (en) * | 1961-12-14 | 1963-06-18 | Gen Precision Inc | Automatic component tester |
| US3209908A (en) * | 1963-03-21 | 1965-10-05 | Western Electric Co | High speed apparatus for measuring and sorting electrical components |
-
1965
- 1965-06-29 US US468395A patent/US3392830A/en not_active Expired - Lifetime
-
1966
- 1966-06-13 FR FR7878A patent/FR1483576A/fr not_active Expired
- 1966-06-13 NL NL666608140A patent/NL151513B/xx unknown
- 1966-06-16 JP JP3864966A patent/JPS447097B1/ja active Pending
- 1966-06-21 DE DE1516941A patent/DE1516941B2/de active Granted
- 1966-06-24 GB GB28387/66A patent/GB1125229A/en not_active Expired
- 1966-06-29 SE SE89116/66*A patent/SE338103B/xx unknown
- 1966-06-29 CH CH944266A patent/CH441503A/de unknown
-
1970
- 1970-02-03 JP JP45009032A patent/JPS5124872B1/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3039604A (en) * | 1959-09-10 | 1962-06-19 | Texas Instruments Inc | Centralized automatic tester for semiconductor units |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5444691U (US20030199744A1-20031023-C00003.png) * | 1977-09-02 | 1979-03-27 |
Also Published As
| Publication number | Publication date |
|---|---|
| NL6608140A (US20030199744A1-20031023-C00003.png) | 1967-01-02 |
| JPS447097B1 (US20030199744A1-20031023-C00003.png) | 1969-03-28 |
| US3392830A (en) | 1968-07-16 |
| GB1125229A (US20030199744A1-20031023-C00003.png) | 1968-08-28 |
| DE1516941B2 (de) | 1973-10-31 |
| NL151513B (nl) | 1976-11-15 |
| DE1516941A1 (de) | 1969-06-26 |
| FR1483576A (fr) | 1967-06-02 |
| CH441503A (de) | 1967-07-31 |
| SE338103B (US20030199744A1-20031023-C00003.png) | 1971-08-30 |
