JPS51146887A - Defect monitoring device for nondestructive inspection - Google Patents

Defect monitoring device for nondestructive inspection

Info

Publication number
JPS51146887A
JPS51146887A JP50070472A JP7047275A JPS51146887A JP S51146887 A JPS51146887 A JP S51146887A JP 50070472 A JP50070472 A JP 50070472A JP 7047275 A JP7047275 A JP 7047275A JP S51146887 A JPS51146887 A JP S51146887A
Authority
JP
Japan
Prior art keywords
monitoring device
nondestructive inspection
defect monitoring
defect
assures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50070472A
Other languages
Japanese (ja)
Other versions
JPS598773B2 (en
Inventor
Hiroshi Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP50070472A priority Critical patent/JPS598773B2/en
Publication of JPS51146887A publication Critical patent/JPS51146887A/en
Publication of JPS598773B2 publication Critical patent/JPS598773B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:A defect monitoring device which assures a definite defect discrimination, equipped with two image receiving parts having the scanning line inclined each other between the radio active image converting amplifying portion and monitoring portion.
JP50070472A 1975-06-11 1975-06-11 Defect monitoring equipment for non-destructive testing Expired JPS598773B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50070472A JPS598773B2 (en) 1975-06-11 1975-06-11 Defect monitoring equipment for non-destructive testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50070472A JPS598773B2 (en) 1975-06-11 1975-06-11 Defect monitoring equipment for non-destructive testing

Publications (2)

Publication Number Publication Date
JPS51146887A true JPS51146887A (en) 1976-12-16
JPS598773B2 JPS598773B2 (en) 1984-02-27

Family

ID=13432489

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50070472A Expired JPS598773B2 (en) 1975-06-11 1975-06-11 Defect monitoring equipment for non-destructive testing

Country Status (1)

Country Link
JP (1) JPS598773B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6211574U (en) * 1985-07-08 1987-01-24
JPS6376475U (en) * 1986-11-10 1988-05-20

Also Published As

Publication number Publication date
JPS598773B2 (en) 1984-02-27

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