JPS51141681A - Method of and instrument for optically measuring concentration of gaseous component - Google Patents

Method of and instrument for optically measuring concentration of gaseous component

Info

Publication number
JPS51141681A
JPS51141681A JP51055474A JP5547476A JPS51141681A JP S51141681 A JPS51141681 A JP S51141681A JP 51055474 A JP51055474 A JP 51055474A JP 5547476 A JP5547476 A JP 5547476A JP S51141681 A JPS51141681 A JP S51141681A
Authority
JP
Japan
Prior art keywords
instrument
gaseous component
optically measuring
measuring concentration
optically
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP51055474A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6214769B2 (US08063081-20111122-C00044.png
Inventor
Haatoman Kurausu
Fuon Bureitenbaaku Mainhaado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eruuin Shitsuku Oputeikuu GmbH
Eruuin Shitsuku Oputeikuuerekutoroniku GmbH
Original Assignee
Eruuin Shitsuku Oputeikuu GmbH
Eruuin Shitsuku Oputeikuuerekutoroniku GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eruuin Shitsuku Oputeikuu GmbH, Eruuin Shitsuku Oputeikuuerekutoroniku GmbH filed Critical Eruuin Shitsuku Oputeikuu GmbH
Publication of JPS51141681A publication Critical patent/JPS51141681A/ja
Publication of JPS6214769B2 publication Critical patent/JPS6214769B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G01N21/534—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP51055474A 1975-05-16 1976-05-17 Method of and instrument for optically measuring concentration of gaseous component Granted JPS51141681A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2521934A DE2521934C3 (de) 1975-05-16 1975-05-16 Vorrichtung zur Bestimmung der Konzentrationen von Komponenten eines Abgasgemisches

Publications (2)

Publication Number Publication Date
JPS51141681A true JPS51141681A (en) 1976-12-06
JPS6214769B2 JPS6214769B2 (US08063081-20111122-C00044.png) 1987-04-03

Family

ID=5946767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51055474A Granted JPS51141681A (en) 1975-05-16 1976-05-17 Method of and instrument for optically measuring concentration of gaseous component

Country Status (6)

Country Link
US (1) US4126396A (US08063081-20111122-C00044.png)
JP (1) JPS51141681A (US08063081-20111122-C00044.png)
DE (1) DE2521934C3 (US08063081-20111122-C00044.png)
FR (1) FR2311296A1 (US08063081-20111122-C00044.png)
GB (1) GB1531844A (US08063081-20111122-C00044.png)
IT (1) IT1062070B (US08063081-20111122-C00044.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185694A (ja) * 2009-02-10 2010-08-26 Central Res Inst Of Electric Power Ind ガス濃度測定装置
CN110967310A (zh) * 2019-11-18 2020-04-07 湖北中烟工业有限责任公司 一种烟草红外光谱数据与外观质量评分相关性的分析方法
JP2021085863A (ja) * 2019-11-27 2021-06-03 ポリマー キャラクタライゼーション，エセ．アー． 試料中の成分吸光度を測定するための赤外線検出器および方法

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NL85378C (US08063081-20111122-C00044.png) * 1978-11-29
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US4572663A (en) * 1983-12-22 1986-02-25 Elliott Turbomachinery Co., Inc. Method and apparatus for selectively illuminating a particular blade in a turbomachine
US4746218A (en) * 1984-06-12 1988-05-24 Syconex Corporation Gas detectors and gas analyzers utilizing spectral absorption
SE450913B (sv) * 1984-08-10 1987-08-10 Hans Georg Edner Gaskorrelerad lidar
US4647777A (en) * 1985-05-31 1987-03-03 Ametrek, Inc. Selective gas detector
JPH0711695B2 (ja) 1985-09-25 1995-02-08 富士写真フイルム株式会社 撮影用ハロゲン化銀カラー感光材料の処理方法
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DE3624567A1 (de) * 1986-07-21 1988-03-24 Sick Optik Elektronik Erwin Spektralanalytisches gasmessgeraet
JPH06105346B2 (ja) 1986-11-07 1994-12-21 富士写真フイルム株式会社 ハロゲン化銀カラ−写真感光材料の処理方法
US4893315A (en) * 1987-04-08 1990-01-09 General Signal Corporation Calorimetry system
US4846081A (en) * 1987-04-08 1989-07-11 General Signal Corporation Calorimetry system
US4809190A (en) * 1987-04-08 1989-02-28 General Signal Corporation Calorimetry system
US4895081A (en) * 1987-04-08 1990-01-23 General Signal Corporation Gravimetric feeder, especially adapted for use in a calorimetry system
US4795262A (en) * 1987-07-29 1989-01-03 The Regents Of The Univerity Of Michigan Liquid chromatography absorbance detector
DE3928081C2 (de) * 1989-08-25 1998-05-07 Bosch Gmbh Robert Vorrichtung zur Erfassung der Trübung von Gasen
US5060505A (en) * 1989-09-12 1991-10-29 Sensors, Inc. Non-dispersive infrared gas analyzer system
US5220179A (en) * 1990-02-06 1993-06-15 Helmut Katschnig Method of and apparatus for detecting the presence of vapor and/or smoke in the outgoing air of a device for heating materials
SG46261A1 (en) * 1990-04-09 1998-02-20 Commw Scient Ind Res Org A detection system for use in an aircraft
US5281256A (en) * 1990-09-28 1994-01-25 Regents Of The University Of Michigan Gas chromatography system with column bifurcation and tunable selectivity
US5401967A (en) * 1990-12-26 1995-03-28 Colorado Seminary Dba University Of Denver Apparatus for remote analysis of vehicle emissions
US5210702A (en) * 1990-12-26 1993-05-11 Colorado Seminary Apparatus for remote analysis of vehicle emissions
GB9210674D0 (en) * 1992-05-19 1992-07-01 Gersan Ets Method and apparatus for examining an object
US5288310A (en) * 1992-09-30 1994-02-22 The Regents Of The University Of Michigan Adsorbent trap for gas chromatography
US5510269A (en) * 1992-11-20 1996-04-23 Sensors, Inc. Infrared method and apparatus for measuring gas concentration including electronic calibration
US5371367A (en) * 1993-04-13 1994-12-06 Envirotest Systems Corp. Remote sensor device for monitoring motor vehicle exhaust systems
US5352901A (en) * 1993-04-26 1994-10-04 Cummins Electronics Company, Inc. Forward and back scattering loss compensated smoke detector
US5424842A (en) * 1993-04-27 1995-06-13 Cummins Electronics Company, Inc. Self-cleaning system for monitoring the opacity of combustion engine exhaust using venturi effect
DE4400963C2 (de) * 1994-01-14 1997-07-17 Sick Ag Verfahren und Vorrichtung zur Überwachung des Zustandes von in einem fluiddurchströmten Kanal eingeschalteten Filteranordnungen
US5751216A (en) * 1994-09-27 1998-05-12 Hochiki Kabushiki Kaisha Projected beam-type smoke detector and receiving unit
DE4443016A1 (de) * 1994-12-02 1996-06-05 Sick Optik Elektronik Erwin Gasanalytisches Meßgerät
US5621213A (en) * 1995-07-07 1997-04-15 Novitron International Inc. System and method for monitoring a stack gas
JP3383499B2 (ja) 1995-11-30 2003-03-04 富士写真フイルム株式会社 ハロゲン化銀カラー写真感光材料
JPH09152696A (ja) 1995-11-30 1997-06-10 Fuji Photo Film Co Ltd ハロゲン化銀カラー写真感光材料
DE19611290C2 (de) * 1996-03-22 1998-04-16 Draegerwerk Ag Gassensor
US5770156A (en) * 1996-06-04 1998-06-23 In Usa, Inc. Gas detection and measurement system
US6010665A (en) * 1996-10-18 2000-01-04 In Usa, Inc. Multi-wavelength based ozone measurement method and apparatus
US5831267A (en) * 1997-02-24 1998-11-03 Envirotest Systems Corp. Method and apparatus for remote measurement of exhaust gas
JP2003513272A (ja) * 1999-11-04 2003-04-08 レール・リキード−ソシエテ・アノニム・ア・ディレクトワール・エ・コンセイユ・ドゥ・スールベイランス・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード 高温プロセスガスの化学種および温度の連続モニタリング方法
US6536649B1 (en) 2000-07-28 2003-03-25 Advanced Micro Devices, Inc. Method of preventing residue contamination of semiconductor devices during furnace processing
KR100359237B1 (ko) * 2000-12-22 2002-11-04 재단법인 포항산업과학연구원 분진농도 측정장치
US6822216B2 (en) * 2002-01-08 2004-11-23 Honeywell International, Inc. Obscuration detector
JP2007524828A (ja) * 2003-06-20 2007-08-30 アイギス セミコンダクター インコーポレイテッド 熱光学フィルタ及びそれを用いた赤外線センサ
WO2005022900A2 (en) * 2003-08-26 2005-03-10 Redshift Systems Corporation Infrared camera system
US7221827B2 (en) * 2003-09-08 2007-05-22 Aegis Semiconductor, Inc. Tunable dispersion compensator
CN1864091A (zh) * 2003-10-07 2006-11-15 伊吉斯半导体公司 在热膨胀率匹配的透明衬底上具有加热体的可调谐光学滤波器
US7262856B2 (en) * 2004-05-25 2007-08-28 Hobbs Douglas S Microstructured optical device for remote chemical sensing
GB2422897A (en) * 2005-02-02 2006-08-09 Pcme Ltd A monitor for monitoring particles flowing in a stack
JP2007232402A (ja) * 2006-02-27 2007-09-13 Denso Corp 光学式ガス検知装置
GB0700677D0 (en) * 2007-01-12 2007-02-21 Servomex Group Ltd Probe
EP1975601B1 (de) 2007-03-24 2011-01-12 SICK Engineering GmbH Verschmutzungsmessung
WO2010036523A2 (en) * 2008-09-29 2010-04-01 Johanson Holdings, Llc Mixture segregation testing devices and methods
WO2011017616A1 (en) 2009-08-06 2011-02-10 Peter Theophilos Banos Methods of and devices for monitoring the effects of cellular stress and damage resulting from radiation exposure
US20140183380A1 (en) * 2011-05-20 2014-07-03 Horiba, Ltd. Measuring unit and gas analyzing apparatus
DE102016223440A1 (de) * 2016-11-25 2018-05-30 Robert Bosch Gmbh Partikelmessvorrichtung und Verfahren zur Bestimmung charakteristischer Größen eines Aerosols

Citations (1)

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Publication number Priority date Publication date Assignee Title
JPS49106875A (US08063081-20111122-C00044.png) * 1973-01-23 1974-10-09

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JPS49106875A (US08063081-20111122-C00044.png) * 1973-01-23 1974-10-09

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010185694A (ja) * 2009-02-10 2010-08-26 Central Res Inst Of Electric Power Ind ガス濃度測定装置
CN110967310A (zh) * 2019-11-18 2020-04-07 湖北中烟工业有限责任公司 一种烟草红外光谱数据与外观质量评分相关性的分析方法
JP2021085863A (ja) * 2019-11-27 2021-06-03 ポリマー キャラクタライゼーション，エセ．アー． 試料中の成分吸光度を測定するための赤外線検出器および方法

Also Published As

Publication number Publication date
FR2311296B1 (US08063081-20111122-C00044.png) 1981-09-25
DE2521934B2 (de) 1978-03-02
US4126396A (en) 1978-11-21
IT1062070B (it) 1983-06-25
DE2521934C3 (de) 1978-11-02
FR2311296A1 (fr) 1976-12-10
DE2521934A1 (de) 1976-11-18
GB1531844A (en) 1978-11-08
JPS6214769B2 (US08063081-20111122-C00044.png) 1987-04-03

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