JPS5113435B1 - - Google Patents

Info

Publication number
JPS5113435B1
JPS5113435B1 JP45076398A JP7639870A JPS5113435B1 JP S5113435 B1 JPS5113435 B1 JP S5113435B1 JP 45076398 A JP45076398 A JP 45076398A JP 7639870 A JP7639870 A JP 7639870A JP S5113435 B1 JPS5113435 B1 JP S5113435B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45076398A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5113435B1 publication Critical patent/JPS5113435B1/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/48—Electron guns

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP45076398A 1969-09-02 1970-09-02 Pending JPS5113435B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US85443769A 1969-09-02 1969-09-02

Publications (1)

Publication Number Publication Date
JPS5113435B1 true JPS5113435B1 (ja) 1976-04-28

Family

ID=25318691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45076398A Pending JPS5113435B1 (ja) 1969-09-02 1970-09-02

Country Status (5)

Country Link
US (1) US3617741A (ja)
JP (1) JPS5113435B1 (ja)
DE (2) DE2043323C3 (ja)
FR (1) FR2060766A5 (ja)
GB (1) GB1276400A (ja)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1303136A (ja) * 1970-02-27 1973-01-17
GB1327572A (en) * 1971-03-23 1973-08-22 Ass Elect Ind Apparatus for use in charged particle spectroscopy
GB1332207A (en) * 1971-05-07 1973-10-03 Ass Elect Ind Apparatus for charged particle spectroscopy
US3777159A (en) * 1972-11-09 1973-12-04 Hewlett Packard Co Parallel entry detector system
US3870882A (en) * 1973-05-23 1975-03-11 Gca Corp Esca x-ray source
DE2340372A1 (de) * 1973-08-09 1975-02-20 Max Planck Gesellschaft Doppelfokussierendes massenspektrometer hoher eingangsapertur
JPS5230876B2 (ja) * 1973-08-21 1977-08-11
US4358680A (en) * 1979-11-30 1982-11-09 Kratos Limited Charged particle spectrometers
US4864130A (en) * 1986-06-04 1989-09-05 Arch Development Corporation Photo ion spectrometer
US4855596A (en) * 1986-06-04 1989-08-08 Arch Development Corp. Photo ion spectrometer
US4810880A (en) * 1987-06-05 1989-03-07 The Perkin-Elmer Corporation Direct imaging monochromatic electron microscope
US4806754A (en) * 1987-06-19 1989-02-21 The Perkin-Elmer Corporation High luminosity spherical analyzer for charged particles
US4800273A (en) * 1988-01-07 1989-01-24 Phillips Bradway F Secondary ion mass spectrometer
JPH0225737A (ja) * 1988-07-15 1990-01-29 Hitachi Ltd 表面分析方法および装置
DE3943211C2 (de) * 1989-12-28 1995-02-02 Max Planck Gesellschaft Abbildendes elektronenoptisches Gerät
US5444242A (en) * 1992-09-29 1995-08-22 Physical Electronics Inc. Scanning and high resolution electron spectroscopy and imaging
US5315113A (en) * 1992-09-29 1994-05-24 The Perkin-Elmer Corporation Scanning and high resolution x-ray photoelectron spectroscopy and imaging
GB0801663D0 (en) * 2008-01-30 2008-03-05 Krizek Jiri G F Electromagnetic imaging analyzer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3084249A (en) * 1959-10-01 1963-04-02 High Voltage Engineering Corp Magnetic spectrometer with a focusing lens system prior to the energy separation means

Also Published As

Publication number Publication date
FR2060766A5 (ja) 1971-06-18
DE2043323A1 (de) 1971-03-11
DE2043323C3 (de) 1974-10-10
DE2043323B2 (de) 1974-02-14
DE7032595U (de) 1974-11-21
US3617741A (en) 1971-11-02
GB1276400A (en) 1972-06-01

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