GB1276400A - Electron spectroscopy system - Google Patents

Electron spectroscopy system

Info

Publication number
GB1276400A
GB1276400A GB42014/70A GB4201470A GB1276400A GB 1276400 A GB1276400 A GB 1276400A GB 42014/70 A GB42014/70 A GB 42014/70A GB 4201470 A GB4201470 A GB 4201470A GB 1276400 A GB1276400 A GB 1276400A
Authority
GB
United Kingdom
Prior art keywords
electrodes
lens
target
spectrometer
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB42014/70A
Inventor
Kai M B Siegbahn
Edward F Barnett
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of GB1276400A publication Critical patent/GB1276400A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/48—Electron guns

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

1276400 Particle spectrometers HEWLETTPACKARD CO 2 Sept 1970 [2 Sept 1969] 42014/70 Heading HID In an electron spectroscope for use in chemical analysis wherein X-rays from a source 12, Fig. 1, located on the Rowland circle 20 are directed at a crystal 18 to produce a monochromatic beam 22 which strikes the target 10 and produces photo-electrons which are focused by a lens 38 on the entrance of an electron spectrometer 28, the overall dispersion of the lens 38 and spectrometer 28 is made to cancel the dispersion of the monochromator, in order to reduce the contribution of the characteristic X-ray line width to the line width of the electrons focused on the detector 36. When the spectrometer comprises two hemispherical electrodes of mean radius p (as shown), this condition requires that where R is the radius of the Rowland circle, M is the magnification of the lens, # is the angle between the axis 24 and the tangent to the Rowland circle at the target, # is the angle between the plane of the target and the axis 26 of the lens 38, γ is the angle between the plane of the target and the tangent to the Rowland circle, E S is the kinetic energy of a central electron in the spectrometer 28, and E P is the mean energy of the photons in the incident beam 22. In practice this means adjusting the potentials of the inner electrodes 42 and 44 of the lens to keep M constant when the potential difference between the outer electrodes 40 and 46 is altered. In Fig. 1 the outer electrodes are funnel-shaped and the inner electrodes are frusto-conical. The axis of the electrodes may lie in the plane of the Rowland circle, or may be inclined to or normal to it (Fig. 4, not shown), the last arrangement being particularly suitable when the target is gaseous. In a modification (Figs. 5 and 6, not shown) the hemispherical electrodes of the spectrometer are modified to provide a conical entrance having an axis of symmetry passing through the centre of the hemisphere, and the lens comprises four pairs of conical fan-shaped electrodes having the same axis of symmetry.
GB42014/70A 1969-09-02 1970-09-02 Electron spectroscopy system Expired GB1276400A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US85443769A 1969-09-02 1969-09-02

Publications (1)

Publication Number Publication Date
GB1276400A true GB1276400A (en) 1972-06-01

Family

ID=25318691

Family Applications (1)

Application Number Title Priority Date Filing Date
GB42014/70A Expired GB1276400A (en) 1969-09-02 1970-09-02 Electron spectroscopy system

Country Status (5)

Country Link
US (1) US3617741A (en)
JP (1) JPS5113435B1 (en)
DE (2) DE7032595U (en)
FR (1) FR2060766A5 (en)
GB (1) GB1276400A (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1303136A (en) * 1970-02-27 1973-01-17
GB1327572A (en) * 1971-03-23 1973-08-22 Ass Elect Ind Apparatus for use in charged particle spectroscopy
GB1332207A (en) * 1971-05-07 1973-10-03 Ass Elect Ind Apparatus for charged particle spectroscopy
US3777159A (en) * 1972-11-09 1973-12-04 Hewlett Packard Co Parallel entry detector system
US3870882A (en) * 1973-05-23 1975-03-11 Gca Corp Esca x-ray source
DE2340372A1 (en) * 1973-08-09 1975-02-20 Max Planck Gesellschaft DOUBLE FOCUSING MASS SPECTROMETER HIGH ENTRANCE APERTURE
JPS5230876B2 (en) * 1973-08-21 1977-08-11
US4358680A (en) * 1979-11-30 1982-11-09 Kratos Limited Charged particle spectrometers
US4855596A (en) * 1986-06-04 1989-08-08 Arch Development Corp. Photo ion spectrometer
US4864130A (en) * 1986-06-04 1989-09-05 Arch Development Corporation Photo ion spectrometer
US4810880A (en) * 1987-06-05 1989-03-07 The Perkin-Elmer Corporation Direct imaging monochromatic electron microscope
US4806754A (en) * 1987-06-19 1989-02-21 The Perkin-Elmer Corporation High luminosity spherical analyzer for charged particles
US4800273A (en) * 1988-01-07 1989-01-24 Phillips Bradway F Secondary ion mass spectrometer
JPH0225737A (en) * 1988-07-15 1990-01-29 Hitachi Ltd Method and apparatus for surface analysis
DE3943211C2 (en) * 1989-12-28 1995-02-02 Max Planck Gesellschaft Imaging electron optical device
US5315113A (en) * 1992-09-29 1994-05-24 The Perkin-Elmer Corporation Scanning and high resolution x-ray photoelectron spectroscopy and imaging
US5444242A (en) * 1992-09-29 1995-08-22 Physical Electronics Inc. Scanning and high resolution electron spectroscopy and imaging
GB0801663D0 (en) * 2008-01-30 2008-03-05 Krizek Jiri G F Electromagnetic imaging analyzer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3084249A (en) * 1959-10-01 1963-04-02 High Voltage Engineering Corp Magnetic spectrometer with a focusing lens system prior to the energy separation means

Also Published As

Publication number Publication date
DE2043323C3 (en) 1974-10-10
JPS5113435B1 (en) 1976-04-28
DE2043323B2 (en) 1974-02-14
FR2060766A5 (en) 1971-06-18
DE2043323A1 (en) 1971-03-11
DE7032595U (en) 1974-11-21
US3617741A (en) 1971-11-02

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee