JPS509457A - - Google Patents
Info
- Publication number
- JPS509457A JPS509457A JP49041594A JP4159474A JPS509457A JP S509457 A JPS509457 A JP S509457A JP 49041594 A JP49041594 A JP 49041594A JP 4159474 A JP4159474 A JP 4159474A JP S509457 A JPS509457 A JP S509457A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00350973A US3822383A (en) | 1973-04-13 | 1973-04-13 | Profile gauging system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS509457A true JPS509457A (ja) | 1975-01-30 |
| JPS5829444B2 JPS5829444B2 (ja) | 1983-06-22 |
Family
ID=23379030
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49041594A Expired JPS5829444B2 (ja) | 1973-04-13 | 1974-04-13 | アツサプロフイルソクテイソウチ |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3822383A (ja) |
| JP (1) | JPS5829444B2 (ja) |
| FR (1) | FR2225718B1 (ja) |
| GB (1) | GB1464764A (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61164108A (ja) * | 1985-01-17 | 1986-07-24 | Toshiba Corp | 板クラウン検出装置 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2335839A1 (fr) * | 1975-12-19 | 1977-07-15 | Commissariat Energie Atomique | Procede d'analyse d'echantillons en matiere isolante par spectrometrie photo-electronique et porte-echantillon pour la mise en oeuvre dudit procede |
| US4289964A (en) * | 1980-01-24 | 1981-09-15 | Intec Corporation | Radiation inspection system for a material making apparatus and method using a beta ray gauge |
| LU83049A1 (fr) * | 1981-01-07 | 1982-09-10 | Arbed | Installation de controle de la geometrie de produits lamines |
| GB2097915B (en) * | 1981-04-27 | 1985-02-27 | British Steel Corp | Apparatus for measuring profile thickness of strip material |
| GB9112397D0 (en) * | 1991-06-10 | 1991-07-31 | Infrared Eng | Apparatus for sampling a material travelling past a sampling region |
| DE19726044C2 (de) * | 1997-06-19 | 1999-06-10 | Effem Gmbh | Flüssigkeitsstandanzeiger |
| ITMI20060162A1 (it) * | 2006-02-01 | 2007-08-02 | Electronic Systems Spa | Apparecchio e procedimento per misurare il profilo di almeno una grandezza fisica di un materiale in forma di film |
| DE102006034244A1 (de) | 2006-07-21 | 2008-01-31 | Schott Ag | Verfahren und Vorrichtung zur Dickenmessung großflächiger Glassubstrate |
| CN108007366A (zh) | 2016-10-31 | 2018-05-08 | 泰科电子(上海)有限公司 | 在线厚度检测平台 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3016460A (en) * | 1958-04-14 | 1962-01-09 | Goodyear Tire & Rubber | Method and apparatus for web thickness control |
| US3610925A (en) * | 1969-10-15 | 1971-10-05 | Detroit Edison Co | Apparatus for computing conveyor belt mass flow rate including a radioactive source detector and slide-wire linearizer multiplier |
| US3715592A (en) * | 1971-01-12 | 1973-02-06 | Weston Instruments Inc | Thickness change radiation gauge |
-
1973
- 1973-04-13 US US00350973A patent/US3822383A/en not_active Expired - Lifetime
-
1974
- 1974-04-10 FR FR7412540A patent/FR2225718B1/fr not_active Expired
- 1974-04-13 JP JP49041594A patent/JPS5829444B2/ja not_active Expired
- 1974-04-16 GB GB1651374A patent/GB1464764A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61164108A (ja) * | 1985-01-17 | 1986-07-24 | Toshiba Corp | 板クラウン検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1464764A (en) | 1977-02-16 |
| JPS5829444B2 (ja) | 1983-06-22 |
| US3822383A (en) | 1974-07-02 |
| FR2225718A1 (ja) | 1974-11-08 |
| FR2225718B1 (ja) | 1976-10-08 |