JPS5034885A - - Google Patents

Info

Publication number
JPS5034885A
JPS5034885A JP48104864A JP10486473A JPS5034885A JP S5034885 A JPS5034885 A JP S5034885A JP 48104864 A JP48104864 A JP 48104864A JP 10486473 A JP10486473 A JP 10486473A JP S5034885 A JPS5034885 A JP S5034885A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48104864A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5034885A publication Critical patent/JPS5034885A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0078—Testing material properties on manufactured objects
    • G01N33/0081—Containers; Packages; Bottles

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP48104864A 1973-07-23 1973-09-17 Pending JPS5034885A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US381549A US3877821A (en) 1973-07-23 1973-07-23 Apparatus for detecting flaws using an array of photo sensitive devices

Publications (1)

Publication Number Publication Date
JPS5034885A true JPS5034885A (enExample) 1975-04-03

Family

ID=23505456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48104864A Pending JPS5034885A (enExample) 1973-07-23 1973-09-17

Country Status (3)

Country Link
US (1) US3877821A (enExample)
JP (1) JPS5034885A (enExample)
FR (1) FR2239171A5 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2501975A1 (de) * 1975-01-18 1976-07-22 Kronseder Hermann Vorrichtung zum pruefen von behaeltermuendungen auf schadstellen
US4147619A (en) * 1976-12-09 1979-04-03 Ore-Ida Foods, Inc. Electronic sorting apparatus
JPS53139597A (en) * 1977-05-12 1978-12-05 Eisai Co Ltd Detecting method for foreign matters in liquid in transparent container
US4246098A (en) * 1978-06-21 1981-01-20 Sunkist Growers, Inc. Method and apparatus for detecting blemishes on the surface of an article
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS55119049A (en) * 1979-03-08 1980-09-12 Eisai Co Ltd Method and apparatus for detecting extraneous matter in liquid
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
US4270863A (en) * 1979-11-01 1981-06-02 Owens-Illinois, Inc. Method and apparatus for inspecting objects for defects
US4351004A (en) * 1980-01-31 1982-09-21 Texas Instruments Incorporated CCD Imager
DE3007514A1 (de) * 1980-02-28 1981-09-10 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Vorrichtung zur pruefung abbildender systeme
US4448526A (en) * 1980-06-27 1984-05-15 Kirin Beer Kabushiki Kaisha Defect detecting method and device
DE3027775A1 (de) * 1980-07-23 1982-02-04 Eckehardt Dipl.-Chem. 8550 Forchheim Strich Verfahren zur optischen ueberpruefung schnell bewegter homogener materialbahnen auf fehlerstellen
US4437116A (en) * 1980-12-22 1984-03-13 Owens-Illinois, Inc. Method and apparatus for comparing data signals in a container inspection device
FR2500630A1 (fr) * 1981-02-25 1982-08-27 Leser Jacques Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede
DE3206656A1 (de) * 1981-03-26 1983-09-01 Vereinigte Flugtechnische Werke Gmbh, 2800 Bremen Messanordnung zum feststellen von rissen
JPS57211044A (en) * 1981-06-19 1982-12-24 Hajime Sangyo Kk Inspecting device
US4432013A (en) * 1981-11-23 1984-02-14 Owens-Illinois, Inc. Method and apparatus for comparing data signals in a container inspection device
JPS58162038A (ja) * 1982-03-23 1983-09-26 Canon Inc 面状態検査装置
JPS59114445A (ja) * 1982-12-21 1984-07-02 Yamamura Glass Kk 透明体の欠陥検出装置
US4584469A (en) * 1982-12-30 1986-04-22 Owens-Illinois, Inc. Optical detection of radial reflective defects
US5068799A (en) * 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
DE3536374A1 (de) * 1985-10-11 1987-04-16 Siemens Ag Durchlichtverfahren zur gehaeuse- und bauteilevermessung
JPS63304146A (ja) * 1987-06-04 1988-12-12 Kirin Brewery Co Ltd 壜の胴部検査装置
US4760270A (en) * 1987-06-04 1988-07-26 Owens-Illinois Television Products Inc. Method of and apparatus for comparing data signals in an electrooptical inspection system
US5550384A (en) * 1995-04-11 1996-08-27 Appalachian Electronic Instruments, Inc. Method and apparatus of automatically scanning for density defects in carpets
US5696591A (en) * 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
US10012598B2 (en) 2015-07-17 2018-07-03 Emhart S.A. Multi-wavelength laser check detection tool

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3283162A (en) * 1963-01-29 1966-11-01 Api Instr Company Photosensitive apparatus for detecting a flaw in material with steady illumination means

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2798605A (en) * 1950-07-12 1957-07-09 Tele Tect Corp Electronic inspection apparatus
US2803161A (en) * 1952-10-02 1957-08-20 Gen Electric Surface roughness measuring method and device
DE1773635C3 (de) * 1968-06-15 1978-10-19 Vyzkumny Ustav Strojirenske Technologie A Ekonomiky, Prag Vorrichtung zur Oberflächenprüfung von Körpern mit reflektierender Oberfläche
US3536829A (en) * 1968-09-11 1970-10-27 Us Air Force Solid state time sequential optical image transducer utilizing frame time quanta collection
US3693021A (en) * 1970-06-29 1972-09-19 Eastman Kodak Co Web inspection system using interlaced photocells

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3283162A (en) * 1963-01-29 1966-11-01 Api Instr Company Photosensitive apparatus for detecting a flaw in material with steady illumination means

Also Published As

Publication number Publication date
FR2239171A5 (enExample) 1975-02-21
US3877821A (en) 1975-04-15

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