JPS5017668A - - Google Patents

Info

Publication number
JPS5017668A
JPS5017668A JP5237174A JP5237174A JPS5017668A JP S5017668 A JPS5017668 A JP S5017668A JP 5237174 A JP5237174 A JP 5237174A JP 5237174 A JP5237174 A JP 5237174A JP S5017668 A JPS5017668 A JP S5017668A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5237174A
Other languages
Japanese (ja)
Other versions
JPS5610565B2 (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5017668A publication Critical patent/JPS5017668A/ja
Publication of JPS5610565B2 publication Critical patent/JPS5610565B2/ja
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/22Analogue/digital converters pattern-reading type
    • H03M1/24Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip
    • H03M1/28Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding
    • H03M1/30Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental
    • H03M1/308Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental with additional pattern means for determining the absolute position, e.g. reference marks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/30Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Optical Transform (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP5237174A 1973-05-14 1974-05-13 Expired JPS5610565B2 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH679273A CH553960A (de) 1973-05-14 1973-05-14 Laengen oder winkel-messeinrichtung.

Publications (2)

Publication Number Publication Date
JPS5017668A true JPS5017668A (zh) 1975-02-25
JPS5610565B2 JPS5610565B2 (zh) 1981-03-09

Family

ID=4315100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5237174A Expired JPS5610565B2 (zh) 1973-05-14 1974-05-13

Country Status (7)

Country Link
JP (1) JPS5610565B2 (zh)
CH (1) CH553960A (zh)
FR (1) FR2229949B1 (zh)
GB (1) GB1472876A (zh)
IT (1) IT1012199B (zh)
NL (1) NL159498B (zh)
SE (1) SE399473B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58123411A (ja) * 1982-01-15 1983-07-22 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 位置測定系における誤差補正装置
JPS59168316A (ja) * 1983-03-07 1984-09-22 マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト 歯車のピツチを検査するための測定装置および方法
JPS61219815A (ja) * 1985-03-27 1986-09-30 Yokogawa Electric Corp デイスク形状測定装置
CN110174048A (zh) * 2018-02-20 2019-08-27 约翰内斯.海德汉博士有限公司 光学位置测量装置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892571U (ja) * 1981-12-17 1983-06-23 有限会社 和田製作所 流量調節弁付ボ−ルタツプ
US4678908A (en) * 1983-07-25 1987-07-07 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
US4602155A (en) * 1983-07-25 1986-07-22 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
GB8322886D0 (en) * 1983-08-25 1983-09-28 Lucas Ind Plc Transducer means
DE3611204A1 (de) * 1986-04-04 1987-10-15 Heidenhain Gmbh Dr Johannes Messeinrichtung
DE8613887U1 (zh) * 1986-05-22 1990-09-13 Heidenhain Gmbh Dr Johannes Ok
DE3850164T2 (de) * 1987-04-03 1994-09-22 Hitachi Ltd Verfahren und Gerät zur Drehwinkelerkennung.
DE10300918B4 (de) 2003-01-13 2014-11-06 Robert Bosch Gmbh Vorrichtung und Verfahren zum Erfassen der Relativbewegung zweier relativ zueinander bewegbarer Maschinenteile
CN101650153B (zh) * 2009-09-08 2011-06-08 长春理工大学 一种飞行姿态模拟台角度测量装置
CN110879041B (zh) * 2019-11-08 2021-06-22 杭州电子科技大学 一种直线双码道绝对式钢带尺及其读取方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58123411A (ja) * 1982-01-15 1983-07-22 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 位置測定系における誤差補正装置
JPH049241B2 (zh) * 1982-01-15 1992-02-19
JPS59168316A (ja) * 1983-03-07 1984-09-22 マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト 歯車のピツチを検査するための測定装置および方法
JPS61219815A (ja) * 1985-03-27 1986-09-30 Yokogawa Electric Corp デイスク形状測定装置
JPH0334003B2 (zh) * 1985-03-27 1991-05-21 Yokogawa Electric Corp
CN110174048A (zh) * 2018-02-20 2019-08-27 约翰内斯.海德汉博士有限公司 光学位置测量装置
CN110174048B (zh) * 2018-02-20 2021-11-23 约翰内斯.海德汉博士有限公司 光学位置测量装置

Also Published As

Publication number Publication date
NL159498B (nl) 1979-02-15
JPS5610565B2 (zh) 1981-03-09
DE2416212A1 (de) 1974-11-28
DE2416212B2 (de) 1975-07-10
FR2229949B1 (zh) 1978-11-17
NL7404433A (zh) 1974-11-18
FR2229949A1 (zh) 1974-12-13
CH553960A (de) 1974-09-13
IT1012199B (it) 1977-03-10
SE399473B (sv) 1978-02-13
GB1472876A (en) 1977-05-11

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