JPS5017668A - - Google Patents
Info
- Publication number
- JPS5017668A JPS5017668A JP5237174A JP5237174A JPS5017668A JP S5017668 A JPS5017668 A JP S5017668A JP 5237174 A JP5237174 A JP 5237174A JP 5237174 A JP5237174 A JP 5237174A JP S5017668 A JPS5017668 A JP S5017668A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/22—Analogue/digital converters pattern-reading type
- H03M1/24—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip
- H03M1/28—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding
- H03M1/30—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental
- H03M1/308—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental with additional pattern means for determining the absolute position, e.g. reference marks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/30—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Optical Transform (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH679273A CH553960A (de) | 1973-05-14 | 1973-05-14 | Laengen oder winkel-messeinrichtung. |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5017668A true JPS5017668A (sv) | 1975-02-25 |
JPS5610565B2 JPS5610565B2 (sv) | 1981-03-09 |
Family
ID=4315100
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5237174A Expired JPS5610565B2 (sv) | 1973-05-14 | 1974-05-13 |
Country Status (7)
Country | Link |
---|---|
JP (1) | JPS5610565B2 (sv) |
CH (1) | CH553960A (sv) |
FR (1) | FR2229949B1 (sv) |
GB (1) | GB1472876A (sv) |
IT (1) | IT1012199B (sv) |
NL (1) | NL159498B (sv) |
SE (1) | SE399473B (sv) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58123411A (ja) * | 1982-01-15 | 1983-07-22 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | 位置測定系における誤差補正装置 |
JPS59168316A (ja) * | 1983-03-07 | 1984-09-22 | マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト | 歯車のピツチを検査するための測定装置および方法 |
JPS61219815A (ja) * | 1985-03-27 | 1986-09-30 | Yokogawa Electric Corp | デイスク形状測定装置 |
CN110174048A (zh) * | 2018-02-20 | 2019-08-27 | 约翰内斯.海德汉博士有限公司 | 光学位置测量装置 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5892571U (ja) * | 1981-12-17 | 1983-06-23 | 有限会社 和田製作所 | 流量調節弁付ボ−ルタツプ |
US4678908A (en) * | 1983-07-25 | 1987-07-07 | Bei Electronics, Inc. | Zero reference generating method and apparatus for optical encoders |
US4602155A (en) * | 1983-07-25 | 1986-07-22 | Bei Electronics, Inc. | Zero reference generating method and apparatus for optical encoders |
GB8322886D0 (en) * | 1983-08-25 | 1983-09-28 | Lucas Ind Plc | Transducer means |
DE3611204A1 (de) * | 1986-04-04 | 1987-10-15 | Heidenhain Gmbh Dr Johannes | Messeinrichtung |
DE3617254A1 (de) * | 1986-05-22 | 1987-11-26 | Heidenhain Gmbh Dr Johannes | Messeinrichtung |
DE3850164T2 (de) * | 1987-04-03 | 1994-09-22 | Hitachi Ltd | Verfahren und Gerät zur Drehwinkelerkennung. |
DE10300918B4 (de) | 2003-01-13 | 2014-11-06 | Robert Bosch Gmbh | Vorrichtung und Verfahren zum Erfassen der Relativbewegung zweier relativ zueinander bewegbarer Maschinenteile |
CN101650153B (zh) * | 2009-09-08 | 2011-06-08 | 长春理工大学 | 一种飞行姿态模拟台角度测量装置 |
CN110879041B (zh) * | 2019-11-08 | 2021-06-22 | 杭州电子科技大学 | 一种直线双码道绝对式钢带尺及其读取方法 |
-
1973
- 1973-05-14 CH CH679273A patent/CH553960A/xx not_active IP Right Cessation
-
1974
- 1974-04-01 NL NL7404433A patent/NL159498B/xx not_active IP Right Cessation
- 1974-04-23 SE SE7405417A patent/SE399473B/sv not_active IP Right Cessation
- 1974-05-09 IT IT2248574A patent/IT1012199B/it active
- 1974-05-13 GB GB2116274A patent/GB1472876A/en not_active Expired
- 1974-05-13 FR FR7416454A patent/FR2229949B1/fr not_active Expired
- 1974-05-13 JP JP5237174A patent/JPS5610565B2/ja not_active Expired
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58123411A (ja) * | 1982-01-15 | 1983-07-22 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | 位置測定系における誤差補正装置 |
JPH049241B2 (sv) * | 1982-01-15 | 1992-02-19 | ||
JPS59168316A (ja) * | 1983-03-07 | 1984-09-22 | マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト | 歯車のピツチを検査するための測定装置および方法 |
JPS61219815A (ja) * | 1985-03-27 | 1986-09-30 | Yokogawa Electric Corp | デイスク形状測定装置 |
JPH0334003B2 (sv) * | 1985-03-27 | 1991-05-21 | Yokogawa Electric Corp | |
CN110174048A (zh) * | 2018-02-20 | 2019-08-27 | 约翰内斯.海德汉博士有限公司 | 光学位置测量装置 |
CN110174048B (zh) * | 2018-02-20 | 2021-11-23 | 约翰内斯.海德汉博士有限公司 | 光学位置测量装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5610565B2 (sv) | 1981-03-09 |
FR2229949B1 (sv) | 1978-11-17 |
GB1472876A (en) | 1977-05-11 |
NL159498B (nl) | 1979-02-15 |
NL7404433A (sv) | 1974-11-18 |
SE399473B (sv) | 1978-02-13 |
DE2416212A1 (de) | 1974-11-28 |
CH553960A (de) | 1974-09-13 |
DE2416212B2 (de) | 1975-07-10 |
FR2229949A1 (sv) | 1974-12-13 |
IT1012199B (it) | 1977-03-10 |