JPS5017668A - - Google Patents

Info

Publication number
JPS5017668A
JPS5017668A JP5237174A JP5237174A JPS5017668A JP S5017668 A JPS5017668 A JP S5017668A JP 5237174 A JP5237174 A JP 5237174A JP 5237174 A JP5237174 A JP 5237174A JP S5017668 A JPS5017668 A JP S5017668A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5237174A
Other languages
Japanese (ja)
Other versions
JPS5610565B2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5017668A publication Critical patent/JPS5017668A/ja
Publication of JPS5610565B2 publication Critical patent/JPS5610565B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/22—Analogue/digital converters pattern-reading type
    • H03M1/24—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip
    • H03M1/28—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding
    • H03M1/30—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental
    • H03M1/308—Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental with additional pattern means for determining the absolute position, e.g. reference marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Optical Transform (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP5237174A 1973-05-14 1974-05-13 Expired JPS5610565B2 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH679273A CH553960A (de) 1973-05-14 1973-05-14 Laengen oder winkel-messeinrichtung.

Publications (2)

Publication Number Publication Date
JPS5017668A true JPS5017668A (enrdf_load_stackoverflow) 1975-02-25
JPS5610565B2 JPS5610565B2 (enrdf_load_stackoverflow) 1981-03-09

Family

ID=4315100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5237174A Expired JPS5610565B2 (enrdf_load_stackoverflow) 1973-05-14 1974-05-13

Country Status (7)

Country Link
JP (1) JPS5610565B2 (enrdf_load_stackoverflow)
CH (1) CH553960A (enrdf_load_stackoverflow)
FR (1) FR2229949B1 (enrdf_load_stackoverflow)
GB (1) GB1472876A (enrdf_load_stackoverflow)
IT (1) IT1012199B (enrdf_load_stackoverflow)
NL (1) NL159498B (enrdf_load_stackoverflow)
SE (1) SE399473B (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58123411A (ja) * 1982-01-15 1983-07-22 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 位置測定系における誤差補正装置
JPS59168316A (ja) * 1983-03-07 1984-09-22 マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト 歯車のピツチを検査するための測定装置および方法
JPS61219815A (ja) * 1985-03-27 1986-09-30 Yokogawa Electric Corp デイスク形状測定装置
CN110174048A (zh) * 2018-02-20 2019-08-27 约翰内斯.海德汉博士有限公司 光学位置测量装置

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892571U (ja) * 1981-12-17 1983-06-23 有限会社　和田製作所 流量調節弁付ボ−ルタツプ
US4678908A (en) * 1983-07-25 1987-07-07 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
US4602155A (en) * 1983-07-25 1986-07-22 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
GB8322886D0 (en) * 1983-08-25 1983-09-28 Lucas Ind Plc Transducer means
DE3611204A1 (de) * 1986-04-04 1987-10-15 Heidenhain Gmbh Dr Johannes Messeinrichtung
DE8613887U1 (de) * 1986-05-22 1990-09-13 Dr. Johannes Heidenhain Gmbh, 83301 Traunreut Meßeinrichtung
EP0286322B1 (en) * 1987-04-03 1994-06-15 Hitachi, Ltd. Method and apparatus for detecting a rotation angle
DE10300918B4 (de) 2003-01-13 2014-11-06 Robert Bosch Gmbh Vorrichtung und Verfahren zum Erfassen der Relativbewegung zweier relativ zueinander bewegbarer Maschinenteile
CN101650153B (zh) * 2009-09-08 2011-06-08 长春理工大学 一种飞行姿态模拟台角度测量装置
CN110879041B (zh) * 2019-11-08 2021-06-22 杭州电子科技大学 一种直线双码道绝对式钢带尺及其读取方法
CN116539078A (zh) * 2023-04-27 2023-08-04 浙江锐鹰传感技术有限公司 一种增量型电感式编码器零位设置方法及电感式编码器

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58123411A (ja) * 1982-01-15 1983-07-22 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング 位置測定系における誤差補正装置
JPS59168316A (ja) * 1983-03-07 1984-09-22 マ−ク−ツア−ンレ−ダ−・ウント・−マシ−ネン・アクチエンゲゼルシヤフト 歯車のピツチを検査するための測定装置および方法
JPS61219815A (ja) * 1985-03-27 1986-09-30 Yokogawa Electric Corp デイスク形状測定装置
CN110174048A (zh) * 2018-02-20 2019-08-27 约翰内斯.海德汉博士有限公司 光学位置测量装置
CN110174048B (zh) * 2018-02-20 2021-11-23 约翰内斯.海德汉博士有限公司 光学位置测量装置

Also Published As

Publication number Publication date
JPS5610565B2 (enrdf_load_stackoverflow) 1981-03-09
FR2229949A1 (enrdf_load_stackoverflow) 1974-12-13
DE2416212A1 (de) 1974-11-28
FR2229949B1 (enrdf_load_stackoverflow) 1978-11-17
CH553960A (de) 1974-09-13
IT1012199B (it) 1977-03-10
SE399473B (sv) 1978-02-13
DE2416212B2 (de) 1975-07-10
NL7404433A (enrdf_load_stackoverflow) 1974-11-18
GB1472876A (en) 1977-05-11
NL159498B (nl) 1979-02-15

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