JPS50122988A - - Google Patents

Info

Publication number
JPS50122988A
JPS50122988A JP50025549A JP2554975A JPS50122988A JP S50122988 A JPS50122988 A JP S50122988A JP 50025549 A JP50025549 A JP 50025549A JP 2554975 A JP2554975 A JP 2554975A JP S50122988 A JPS50122988 A JP S50122988A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50025549A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US447339A external-priority patent/US3916191A/en
Priority claimed from US447378A external-priority patent/US3916190A/en
Application filed filed Critical
Publication of JPS50122988A publication Critical patent/JPS50122988A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP50025549A 1974-03-01 1975-02-28 Pending JPS50122988A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US447339A US3916191A (en) 1974-03-01 1974-03-01 Imaging apparatus and method for use with ion scattering spectrometer
US447378A US3916190A (en) 1974-03-01 1974-03-01 Depth profile analysis apparatus

Publications (1)

Publication Number Publication Date
JPS50122988A true JPS50122988A (fr) 1975-09-26

Family

ID=27034945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50025549A Pending JPS50122988A (fr) 1974-03-01 1975-02-28

Country Status (4)

Country Link
JP (1) JPS50122988A (fr)
DE (1) DE2509327A1 (fr)
FR (1) FR2262799B1 (fr)
GB (1) GB1506175A (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias

Also Published As

Publication number Publication date
FR2262799A1 (fr) 1975-09-26
FR2262799B1 (fr) 1978-10-06
DE2509327A1 (de) 1975-10-02
GB1506175A (en) 1978-04-05

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