JPS4924076A - - Google Patents

Info

Publication number
JPS4924076A
JPS4924076A JP48041517A JP4151773A JPS4924076A JP S4924076 A JPS4924076 A JP S4924076A JP 48041517 A JP48041517 A JP 48041517A JP 4151773 A JP4151773 A JP 4151773A JP S4924076 A JPS4924076 A JP S4924076A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48041517A
Other languages
Japanese (ja)
Other versions
JPS5753661B2 (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4924076A publication Critical patent/JPS4924076A/ja
Publication of JPS5753661B2 publication Critical patent/JPS5753661B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP48041517A 1972-05-05 1973-04-13 Expired JPS5753661B2 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25053772A 1972-05-05 1972-05-05

Publications (2)

Publication Number Publication Date
JPS4924076A true JPS4924076A (zh) 1974-03-04
JPS5753661B2 JPS5753661B2 (zh) 1982-11-13

Family

ID=22948165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48041517A Expired JPS5753661B2 (zh) 1972-05-05 1973-04-13

Country Status (5)

Country Link
US (1) US3746973A (zh)
JP (1) JPS5753661B2 (zh)
DE (1) DE2319011C2 (zh)
FR (1) FR2183691B1 (zh)
GB (1) GB1414013A (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5521195A (en) * 1978-07-31 1980-02-15 Ibm Integrated circuit module
JPS5761853U (zh) * 1980-09-30 1982-04-13

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3882532A (en) * 1972-07-03 1975-05-06 Ibm Externally accessing mechanically difficult to access circuit nodes in integrated circuits
US3984860A (en) * 1973-06-04 1976-10-05 International Business Machines Corporation Multi-function LSI wafers
US3867693A (en) * 1974-02-20 1975-02-18 Ibm LSI chip test probe contact integrity checking circuit
US3982180A (en) * 1974-12-20 1976-09-21 Bell Telephone Laboratories, Incorporated Apparatus for testing multiconductor cables for continuity, correct connections, and the absence of short circuits between conductors
US3999126A (en) * 1975-04-17 1976-12-21 A & P Products Incorporated Test device for simultaneously displaying the level of logic signals in a plurality of circuits
SE433782B (sv) * 1977-10-31 1984-06-12 Western Electric Co Forfarande och anordning for testning av elektriska ledarelement
US4202007A (en) * 1978-06-23 1980-05-06 International Business Machines Corporation Multi-layer dielectric planar structure having an internal conductor pattern characterized with opposite terminations disposed at a common edge surface of the layers
US4241307A (en) * 1978-08-18 1980-12-23 International Business Machines Corporation Module interconnection testing scheme
US4379259A (en) * 1980-03-12 1983-04-05 National Semiconductor Corporation Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber
US4295359A (en) * 1980-03-17 1981-10-20 Honeywell Information Systems Inc. Calibration apparatus for CML circuit test unit
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
JPS57153464A (en) * 1981-03-18 1982-09-22 Toshiba Corp Injection type semiconductor integrated logic circuit
US4395767A (en) * 1981-04-20 1983-07-26 Control Data Corporation Interconnect fault detector for LSI logic chips
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
DE3235119A1 (de) * 1982-09-22 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Anordnung fuer die pruefung von mikroverdrahtungen und verfahren zu ihrem betrieb
US4674007A (en) * 1985-06-07 1987-06-16 Microscience Corporation Method and apparatus for facilitating production of electronic circuit boards
US4884122A (en) * 1988-08-05 1989-11-28 General Electric Company Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer
US4937203A (en) * 1986-09-26 1990-06-26 General Electric Company Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer
US4812742A (en) * 1987-12-03 1989-03-14 Unisys Corporation Integrated circuit package having a removable test region for testing for shorts and opens
GB2249639A (en) * 1990-09-06 1992-05-13 Digital Equipment Int Testing printed circuit boards
US5477160A (en) * 1992-08-12 1995-12-19 Fujitsu Limited Module test card
US5363038A (en) * 1992-08-12 1994-11-08 Fujitsu Limited Method and apparatus for testing an unpopulated chip carrier using a module test card
JPH0669306A (ja) * 1992-08-18 1994-03-11 Sumitomo Kinzoku Ceramics:Kk シート状セラミックパッケージ
US5357192A (en) * 1993-02-01 1994-10-18 Motorola, Inc. Method of contacting a semiconductor die with probes
US5751015A (en) * 1995-11-17 1998-05-12 Micron Technology, Inc. Semiconductor reliability test chip
US6087841A (en) * 1997-10-01 2000-07-11 International Business Machines Corporation Contact test circuit
US8093921B2 (en) * 2009-02-13 2012-01-10 Cisco Technology, Inc. Monitoring of interconnect reliability using a programmable device
EP2790027B1 (en) 2013-04-08 2017-10-18 Imec Two-step interconnect testing of semiconductor dies

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1977703A (en) * 1932-01-07 1934-10-23 Western Electric Co Method of and apparatus for electrical testing
US3217244A (en) * 1961-12-27 1965-11-09 George G Glover Multiple conductor cable tester having rotatable annular switch means for testing insulation resistance, cross wiring and continuity
US3405361A (en) * 1964-01-08 1968-10-08 Signetics Corp Fluid actuable multi-point microprobe for semiconductors
US3192307A (en) * 1964-05-29 1965-06-29 Burndy Corp Connector for component and printed circuit board
US3560907A (en) * 1968-05-17 1971-02-02 Peter V N Heller Test connector for microminiature circuits
US3609538A (en) * 1969-04-04 1971-09-28 Thomas & Betts Corp Device to identify individual wires in a random bundle

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5521195A (en) * 1978-07-31 1980-02-15 Ibm Integrated circuit module
JPS5826171B2 (ja) * 1978-07-31 1983-06-01 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション 集積回路モジユ−ル
JPS5761853U (zh) * 1980-09-30 1982-04-13
JPS615804Y2 (zh) * 1980-09-30 1986-02-21

Also Published As

Publication number Publication date
DE2319011A1 (de) 1973-11-15
US3746973A (en) 1973-07-17
JPS5753661B2 (zh) 1982-11-13
DE2319011C2 (de) 1983-08-25
FR2183691B1 (zh) 1978-05-26
GB1414013A (en) 1975-11-12
FR2183691A1 (zh) 1973-12-21

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