JPS4826036A - - Google Patents
Info
- Publication number
- JPS4826036A JPS4826036A JP47068760A JP6876072A JPS4826036A JP S4826036 A JPS4826036 A JP S4826036A JP 47068760 A JP47068760 A JP 47068760A JP 6876072 A JP6876072 A JP 6876072A JP S4826036 A JPS4826036 A JP S4826036A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00168875A US3805152A (en) | 1971-08-04 | 1971-08-04 | Recirculating testing methods and apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4826036A true JPS4826036A (enExample) | 1973-04-05 |
| JPS5223699B2 JPS5223699B2 (enExample) | 1977-06-25 |
Family
ID=22613311
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47068760A Expired JPS5223699B2 (enExample) | 1971-08-04 | 1972-07-11 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3805152A (enExample) |
| JP (1) | JPS5223699B2 (enExample) |
| FR (1) | FR2148313B1 (enExample) |
| GB (1) | GB1355296A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62120698A (ja) * | 1985-11-20 | 1987-06-01 | Fujitsu Ltd | 半導体記憶回路 |
| US6115783A (en) * | 1996-08-15 | 2000-09-05 | Nec Corporation | Integrated circuit |
| WO2005008677A1 (ja) * | 2003-07-22 | 2005-01-27 | Fujitsu Limited | 内蔵されるメモリマクロのac特性を測定するテスト回路を有する集積回路装置 |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IN146507B (enExample) * | 1975-09-29 | 1979-06-23 | Ericsson Telefon Ab L M | |
| DE2829709C2 (de) * | 1978-07-06 | 1984-02-23 | Ibm Deutschland Gmbh, 7000 Stuttgart | Verfahren und Anordnung zur Erzeugung zeitlich unmittelbar aufeinanderfolgender Impulszyklen |
| DE2746743C2 (de) * | 1977-10-18 | 1986-04-17 | Ibm Deutschland Gmbh, 7000 Stuttgart | Verfahren und Anordnung zur computergesteuerten Erzeugung von Impulsintervallen |
| DE2839950B1 (de) * | 1978-09-14 | 1979-10-25 | Ibm Deutschland | Einrichtung zur Feststellung der Laenge beliebiger Schieberegister |
| FR2460526A1 (fr) * | 1979-06-29 | 1981-01-23 | Ibm France | Procede de mesure du temps d'acces d'adresse de memoires mettant en oeuvre la technique de recirculation des donnees, et testeur en resultant |
| JPS59198596A (ja) * | 1983-04-22 | 1984-11-10 | Hitachi Micro Comput Eng Ltd | 検査回路 |
| US4564943A (en) * | 1983-07-05 | 1986-01-14 | International Business Machines | System path stressing |
| JPS6238600A (ja) * | 1985-08-14 | 1987-02-19 | Fujitsu Ltd | 半導体記憶装置 |
| JPS63174271U (enExample) * | 1987-01-30 | 1988-11-11 | ||
| US4841485A (en) * | 1987-11-05 | 1989-06-20 | International Business Machines Corporation | Read/write memory device with an embedded read-only pattern and method for providing same |
| JP2956145B2 (ja) * | 1990-06-28 | 1999-10-04 | 日本電気株式会社 | 半導体集積回路装置 |
| US5287363A (en) * | 1991-07-01 | 1994-02-15 | Disk Technician Corporation | System for locating and anticipating data storage media failures |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3487304A (en) * | 1968-02-02 | 1969-12-30 | Aai Corp | Sequential test apparatus for electrical circuits including a digital controlled analog test signal generating unit |
-
1971
- 1971-08-04 US US00168875A patent/US3805152A/en not_active Expired - Lifetime
-
1972
- 1972-06-23 GB GB2942072A patent/GB1355296A/en not_active Expired
- 1972-07-11 JP JP47068760A patent/JPS5223699B2/ja not_active Expired
- 1972-07-26 FR FR7228825*A patent/FR2148313B1/fr not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62120698A (ja) * | 1985-11-20 | 1987-06-01 | Fujitsu Ltd | 半導体記憶回路 |
| US6115783A (en) * | 1996-08-15 | 2000-09-05 | Nec Corporation | Integrated circuit |
| US6321291B1 (en) | 1996-08-15 | 2001-11-20 | Nec Corporation | Method of measuring the speed of a memory unit in an integrated circuit |
| WO2005008677A1 (ja) * | 2003-07-22 | 2005-01-27 | Fujitsu Limited | 内蔵されるメモリマクロのac特性を測定するテスト回路を有する集積回路装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US3805152A (en) | 1974-04-16 |
| FR2148313A1 (enExample) | 1973-03-11 |
| JPS5223699B2 (enExample) | 1977-06-25 |
| GB1355296A (en) | 1974-06-05 |
| FR2148313B1 (enExample) | 1974-12-27 |