JPH1153213A - Ras automatic test system and recording medium - Google Patents

Abstract

PROBLEM TO BE SOLVED: To easily conduct a RAS test through simple constitution by providing a means which generates a false fault setting command and a means which generates a specific kind of false fault to the unit specified with the false fault setting command. SOLUTION: A RAS test means 11 issues the false fault setting command wherein the kind of a false fault, the unit to which it is generated, and time information are set and a false fault injecting means 12 generates the false fault of the specified kind to the specified unit after an elapse of the time information specified with the false fault setting command. Further, the RAS test means 11 issues a false fault reset command wherein the kind of the resetting of the false fault and the unit are specified and a false fault injecting means 12 resets the false fault of the specified kind to the unit specified with the false fault reset command. Then information on the generated false fault is read out and the error content are compared with an expected value to decide whether or not the RAS test is normal or abnormal.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to a RAS automatic test system and a recording medium for automatically performing a RAS test of an apparatus.

[0002]

2. Description of the Related Art Conventionally, for a peripheral device of a computer system, a test for confirming the normality of a function of automatically performing a degenerate operation when a failure occurs in the device, and a confirmation of the normality of a function of reporting a failure. In a RAS test such as a test, the RAS test is performed by manually setting a device failure using a hardware clip or the like.

[0003]

Therefore, there are the following problems. (1) There is a problem that a lot of time is required to find a position on a circuit of a device for setting a hardware clip by referring to a circuit drawing or the like.

(2) There is a problem that it is impossible or difficult to set a hardware clip due to a mounting position of a printed board and components of an apparatus. (3) There is a problem that it is difficult to set a hardware clip according to the timing of hardware operation.

(4) Once the hardware clip is set, it is difficult to adjust the timing of releasing the hardware clip, and there is a problem that it is difficult to perform a confirmation test for automatically recovering from the degeneration operation to the normal operation after recovery from the failure.

(5) There is a problem that it is difficult to retest under the same conditions. According to the present invention, in order to solve these problems, commands such as a pseudo-failure request, a pseudo-failure release request, a pseudo-failure setting, and a pseudo-failure release are provided and used, and the RAS test is easily realized with a simple configuration. It is intended to be.

[0007]

Means for solving the problem will be described with reference to FIG. In FIG. 1, the RAS test means 11 issues a command to instruct a RAS test.

[0008] The pseudo-failure injecting means 12 receives a command from the RAS testing means 11 and issues a command to the RAS of the apparatus.
The test is performed. Next, the operation will be described.

The RAS test means 11 issues a pseudo fault setting command in which a type and a unit for generating a pseudo fault are set, and the pseudo fault injecting means 12 sets a pseudo fault of the type specified in the unit specified by the pseudo fault setting command. Is caused to occur. RAS test means 1
1 issues a pseudo failure release command in which the type and unit for which the pseudo failure is to be released are set, and the pseudo failure injection means 12 releases the pseudo failure of the type specified for the unit specified by the pseudo failure release command. I have.

Further, the RAS test means 11 issues a pseudo fault setting command in which the type, unit and time information causing the pseudo fault are set, and the pseudo fault injection means 12 elapses the time information specified by the pseudo fault setting command. A pseudo failure of a specified type is generated in a unit specified later. Further, the RAS test means 11 issues a pseudo failure release command in which a type and a unit for canceling the pseudo failure are set, and the pseudo failure injection means 12 checks the pseudo failure of the type specified for the unit specified by the pseudo failure release command. I am trying to release it.

At this time, information on the generated pseudo failure is read, and the error content is compared with an expected value to determine whether the RAS test is normal or abnormal. Further, a command is issued by setting or canceling a pseudo failure, selecting a target unit and a type from the screen.

Therefore, commands such as a pseudo-failure request, a pseudo-failure release request, a pseudo-failure setting, and a pseudo-failure release are provided, and by using these commands, the R can be simply configured with a simple configuration.
An AS test can be performed.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, embodiments and operations of the present invention will be sequentially described in detail with reference to FIGS.

FIG. 1 is a block diagram showing one embodiment of the present invention.
In FIG. 1, in S1, the RAS test means (RAS test program) 11 executes a communication data write command (issues a pseudo failure setting command). In this case, the RAS test program 11 issues a pseudo failure setting command of the communication data write command of FIG.

CONTROL = X'01 '(represents a pseudo-failure setting command) RAS NO = X'01' (represents the type of pseudo-failure) UNIT CODE = X'02 '(unit code for generating a pseudo-failure TIMER1 = x (time x from receiving the pseudo-failure instruction until it is generated) TIMER2 = y (time y from the generation of the pseudo-failure until execution of the next process) S3 is a pseudo-failure Fault injection means (pseudo fault injection program)
12 repeats the communication data read command, that is, waits for a pseudo failure request. When the pseudo failure setting command of S2 is read, the process proceeds to the next S4.

S4 waits for time. This is the TIM set in the pseudo failure setting command read in S3.
Wait for the time of ER1 = x, and proceed to the next S5. S5 is
The pseudo fault setting command is executed, that is, the pseudo fault is set in the device (hardware). This is because a pseudo failure setting command of FIG.
And issues a false fault to the device as shown in (1).

CONTROL = X'81 '(represents the execution of a pseudo-failure setting) RAS NO = X'01' (represents the type of a pseudo-failure) UNIT CODE = X'02 '(a unit code for generating a pseudo-failure) In S7, the pseudo fault injection program 12 executes the pseudo fault setting command of S6 to generate a pseudo fault.

S8 represents a waiting time xms from receiving the pseudo fault setting request until actually setting the pseudo fault (representing the time set by TIMER1 = x in S2).
S9 represents the time yms from the occurrence of the pseudo failure to the execution of the next processing (representing the time set by TIMER2 = y in S2). Here, in S9, a process of confirming the automatic degeneration operation function and the failure report function of the device at the time of occurrence of the failure is performed. Then, after waiting for yms described above in S10, the process proceeds to the next process, S11 to S18.

By the above S1 to S10, RAS
The test program 11 issues a pseudo fault setting command by a communication data write command, the pseudo fault injection program 12 receives a pseudo fault setting command issued by a communication data read command, and sets a time specified by the pseudo fault setting command. After the elapse of x, a specified pseudo fault is generated (a pseudo fault type (for example, power-off) specified by RAS NO is generated for a device having a unit code specified by UNIT CODE). On this occasion,
The processing of checking the automatic degeneration operation function and the failure report function when a failure occurs in the apparatus itself is performed, and after a specified time yms has elapsed, the processing proceeds to the next processing. As a result, when the RAS test program 11 issues a pseudo-failure setting command by a communication data write command, the pseudo-failure injection program 12 sets and generates a pseudo-failure in the device in accordance with the pseudo-failure setting command received. Various RAS of the device itself
The function (automatic degeneration operation function at the time of failure occurrence, failure report function, etc.) can be operated and its confirmation can be performed.

Next, the case of canceling the pseudo fault generated in S1 to S10 will be described in detail with reference to S11 to S18. In FIG. 1, in S11, the RAS test means (RAS test program) 11 executes a communication data write command (issues a pseudo failure release command). This is because the RAS test program 11 sends a pseudo failure release command among the communication data write commands of FIG.
Issued as shown in FIG.

CONTROL = X'02 '(representing a pseudo-failure release command) RAS NO = X'01' (representing the type of pseudo-failure) UNIT CODE = X'02 '(unit code for generating a pseudo-failure In S13, the pseudo failure injection means (pseudo failure injection program) 12 repeats the communication data read command,
Wait for a request to cancel the pseudo failure. Then, when the pseudo failure release command of S12 is read, the process proceeds to the next S14.

S14 executes a pseudo failure release command,
That is, it is set to cancel the pseudo fault of the device (hardware) in which the pseudo fault has occurred (return to the state before setting the pseudo fault). In this case, a pseudo failure release command of FIG. 5 described later is issued as a pseudo failure release command as described below in S15 to set the pseudo failure release in the apparatus.

CONTROL = X'82 '(represents the execution of the pseudo failure release setting) RAS NO = X'01' (represents the type of the pseudo failure) UNIT CODE = X'02 '(produces the pseudo failure In step S16, the pseudo failure injection program 12 executes the pseudo failure release command in S15 to release the pseudo failure.

In step S17, after setting the cancellation of the pseudo fault, the system waits for a time until the pseudo fault is cleared. In step S18, a process of checking the automatic recovery function after the recovery from the failure is performed.

By the above S11 to S18, RA
The S test program 11 issues a pseudo failure release command by the communication data write command, the pseudo failure injection program 12 receives the pseudo failure release command issued by the communication data read command, and is specified by the pseudo failure release command. Release pseudo obstacle (RAS NO
The pseudo-failure type (for example, power-off) specified in
The device of the unit code specified by T CODE is released). At this time, the process of checking the automatic recovery function at the time of recovery from the failure of the device itself is performed, and the process ends. As a result, when the RAS test program 11 issues a pseudo failure release command by a communication data write command, the pseudo failure injection program 12 releases the pseudo failure to the device in accordance with the received pseudo failure release command. It is possible to operate the various RAS functions (such as an automatic recovery function) to confirm the operation.

FIG. 2 shows an example of a communication data write command according to the present invention. This corresponds to S1, S2, S1 in FIG.
1. This is an example of a communication data write command in S12, in which the following information shown is set in BYTEs 0 to 10 as shown.

Contro: X'01 '(represents a pseudo failure setting command) X'02' (represents a pseudo failure release command) RAS NO: represents a pseudo failure type, for example, x'01 'described above is power supply Represents a break.

Unit Code: Setting of pseudo fault /
Indicates the unit code of the device (hardware) to be released. Timer-1: represents a waiting time from receipt of an instruction to set / cancel the pseudo fault to setting / cancelling the pseudo fault.

Timer-2: Represents a waiting time from when a pseudo failure is set / released until the next processing is executed. FIG. 3 shows an example of a communication data read command according to the present invention. This is an example of the communication data read command of S3 and S13 in FIG. 1 described above.
0 is set with the following information shown in the figure.
This is the same as the communication data write command in FIG. 2 and is read out by the pseudo failure injection program).

Contro: X'01 '(represents a pseudo-failure setting command) X'02' (represents a pseudo-failure release command) RAS NO: represents a pseudo-failure type, for example, x'01 'described above is power supply Represents a break.

Unit Code: Setting of pseudo fault /
Indicates the unit code of the device (hardware) to be released. Timer-1: represents a waiting time from receipt of an instruction to set / cancel the pseudo fault to setting / cancelling the pseudo fault.

Timer-2: Represents a waiting time from when a pseudo failure is set / released until the next processing is executed. FIG. 4 shows an example of the pseudo failure setting command of the present invention. This is an example of a command when the pseudo failure injection program 12 sets the hardware, and necessary information is extracted from the content read (received) by the communication data read command of FIG. And the following shown in the figure are set.

Contro: X'81 '(represents a pseudo-failure setting command) RAS NO: Represents a pseudo-failure type, for example, x'01' indicates power-off, x'02 'indicates power-on Represent.

Unit Code: Indicates a unit code of a device (hardware) for which a pseudo failure is to be set. FIG. 5 shows an example of a pseudo failure release command according to the present invention. This is a command example when the pseudo fault injection program 12 cancels the pseudo fault set in the hardware, and necessary information is read from (read) the content read (received) by the communication data read command of FIG. Take out and set the following commands as shown in the figure.

Contro: X'82 '(represents a pseudo-failure release command) RAS NO: Represents a pseudo-failure type, for example, x'01' indicates power-off, x'02 'indicates power-on Represent.

Unit Code: Indicates a unit code of a device (hardware) to be reset for a pseudo failure. FIG. 6 shows a specific example of the present invention. This is because R
This is a specific example in which an AS test program is loaded, a pseudo failure injection program 12 is loaded in the host 2, and an RAS test of the magnetic tape library device 21 is automatically performed. Here, a RAS test (test of an automatic degeneration function and a failure report function) at the time of generating a pseudo failure of power-off of AMC0 and a RAS test (recovery function) at the time of turning on the power of AMC0 to release the pseudo-failure ) Will be sequentially described in detail with reference to FIGS. 7 to 9.

In FIG. 6, a robot controller (ADR)
0, ADR1) controls the robot operating in the magnetic tape library device 21 and controls the tape control device (DM). ADR0,
ADR1 is a robot control unit, both of which operate so that when a failure occurs in one, the other performs processing instead of the control being executed.

Robot controllers (AMC0, AMC
1) a subordinate cell storage unit (DEE), a cassette loading / unloading mechanism (CAS), and a medium transport robot (AC)
C). AMC0 and AMC1 are robot controllers, both of which operate so that when one of them fails, the other performs processing in place of the control being executed.

The cell storage unit (DEE) is a unit for storing cells storing a plurality of cassette tapes. The cassette loading / unloading mechanism (CAS) is a mechanism for loading and unloading cassette tapes.

The medium transport robot (ACC) is a robot that transports a cassette tape (medium). The tape control device (DM) controls the tape deck.

MTUs 0, 1 and MTUa, b- are tape decks, respectively. Next, the operation when performing the RAS test of AMC0 in FIG. 6 will be described in detail according to the order of the explanatory diagram in FIG.

FIG. 7 shows an explanatory diagram of the present invention. In FIG. 7, a step S21 inputs the failure setting contents on the menu. In this case, the RAS tester inputs the failure setting details on a menu screen shown in FIG. For example, as shown in S22, on the menu screen of FIG. 8, select UNIT-NO = 3 (AMC0). FAULT ITEM = 1 (AMC0 P-OFF).
Select ・ 1. Select (SET) ・ Input (select) GO. As a result, the pseudo failure injection program 12 loaded on the host 2 receives the failure setting contents (pseudo failure setting command) input from the menu screen, and sets a pseudo failure in the hardware of the magnetic tape library device 21.

In S23, P-OFF (power cut-off) of AMC0 occurs in response to the setting of the pseudo failure in S22. In step S24, an automatic degeneration process is performed. this is,
Since the power-off of the AMC0 is set as the pseudo failure in S23, the automatic degeneration function of the hardware operates to execute the automatic degeneration process in response to this, for example, A in FIG.
MC0 stops the process, shifts the process to the substitute AMC1, and automatically continues the process.

In step S25, an error is reported. S26 is the RAS test program 11 loaded on the host 1.
AMC1 recognizes the start of the degeneration operation in response to the error report in S25.

As described above, when the RAS tester sets a fault on the menu screen of FIG. 8, a pseudo fault is automatically generated in the hardware of FIG.
Activate the S function, in this case, perform automatic degeneration processing and error reporting, confirm that the degeneration operation has been started by the AMC 1, and automatically perform a series of tests of the RAS function (automatic degeneration operation function, failure report function). It becomes possible.

In FIG. 7, in step S31, the contents of the failure cancellation are input on the menu. This is done by the RAS tester inputting the failure cancellation details on a menu screen shown in FIG. 8 described later. For example, as shown in S32, on the menu screen of FIG. 8, select UNIT-NO = 3 (AMC0). Select FAULT ITEM = 2 (AMC0 P-ON). Select (RESET) ・ Input (select) GO. As a result, the pseudo failure injection program 12 loaded on the host 2 receives the failure release content (pseudo failure release command) input from the menu screen, and sets the pseudo failure release in the hardware of the magnetic tape library device 21. I do.

In S33, P-ON (power-on) of AMC0 occurs in response to the setting of the cancellation of the pseudo failure in S32. In step S34, an automatic recovery process is performed.
This is because the power failure of AMC 0 is
Since N has been set, in response to this, the automatic recovery function of the hardware operates to execute the automatic recovery processing, for example, restart the processing of AMC0 in FIG. 5 to recover.

In step S35, an error recovery report is issued. S36
Indicates that the RAS test program 11 loaded on the host 1 responds to the error recovery report of S35,
Recognizes that has been restored.

As described above, when the RAS tester clears the fault from the menu screen of FIG. 8, the pseudo fault is automatically released in the hardware of FIG. 6, for example, AMC0, and the RAS function is operated. , Make automatic recovery process, error recovery report, confirm that AMC0 has recovered,
A series of tests of the RAS function (automatic recovery operation function, failure recovery report function) can be automatically performed.

FIG. 8 shows an example of a menu screen according to the present invention.
This is an example of a menu screen for selecting / inputting failure setting contents and failure recovery contents on the menu of FIG. 7 described above.
As described on this menu screen, UNIT NO (selection) FAULT ITEM (selection) SET (setting) / RESET (cancel) (selection) The test of the RAS function of the magnetic tape library device 21 of FIG. 6 can be automatically performed.

FIG. 9 shows a flow chart of the fault recovery verification of the present invention. This is a flowchart in which a RAS test is performed to generate a pseudo failure in hardware, error information at that time is read, and a failure recovery function (a type of RAS function) is verified.

In FIG. 9, S41 issues a command. This issues a command for failure recovery verification and causes the following processing to be executed. A step S42 decides whether or not there is an error report. This corresponds to, for example, the R of the device of FIG.
It is determined whether there is an error report stored by the AS function. YE
In the case of S, the process proceeds to S43. On the other hand, in the case of NO,
Since the pseudo-failure has been generated by the above-described pseudo-failure setting command, it is verified in S46 that the RAS function (such as an error reporting function) is abnormal.

In S43, since it is determined that an error report is present in S42, the content of the error report is read. S44
Determines whether the error content matches the expected value. YES
In the case of, the RAS function is verified to be normal in S45. N
In the case of O, it is verified in S46 that the RAS function is abnormal.

As described above, a pseudo fault is generated in the device by the pseudo fault setting command, and the RAS of the device at that time is generated.
With the error report and the error content saved by the function, the error report and the error content are read out and RA
It is possible to verify whether the S function has operated normally or abnormally.

[0055]

As described above, according to the present invention,
Type for generating a pseudo fault, means for issuing a pseudo fault setting command in which a unit is set, means for generating a pseudo fault of the type specified for the unit specified by the pseudo fault setting command, type for canceling the pseudo fault, unit Means for issuing a pseudo failure release command with
A means for canceling a pseudo fault of a specified type in a unit specified by a pseudo fault cancel command is provided, and a test of the RAS function of the device is automatically performed using the command. The RAS test can be easily performed with a simple configuration for various RAS functions of the apparatus by using commands such as a fault request, a pseudo fault release request, a pseudo fault setting, and a pseudo fault release.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of one embodiment of the present invention.

FIG. 2 is an example of a communication data write command according to the present invention.

FIG. 3 is an example of a communication data read command according to the present invention.

FIG. 4 is an example of a pseudo failure setting command according to the present invention.

FIG. 5 is an example of a pseudo failure release command according to the present invention.

FIG. 6 is a specific example of the present invention.

FIG. 7 is an explanatory diagram of the present invention.

FIG. 8 is an example of a menu screen of the present invention.

FIG. 9 is a failure recovery verification flowchart of the present invention.

[Explanation of symbols]

 11: RAS test means (RAS test program) 12: Pseudo fault injection means (pseudo fault injection program) 21: Magnetic tape library device

Claims (5)

[Claims] 1. An automatic RAS test system for automatically performing a RAS test on an apparatus, comprising: a means for issuing a pseudo fault setting command in which a type and a unit for generating a pseudo fault are set; Means for generating a pseudo-failure of the type specified for the unit; means for issuing a pseudo-fault release command in which the type and the unit for which the pseudo-fault is released; RAS automatic test system, comprising: means for canceling a type of pseudo failure. 2. An automatic RAS test system for automatically performing a RAS test on an apparatus, comprising: a means for issuing a pseudo fault setting command in which a type, a unit, and time information for generating a pseudo fault are set; Means for generating a pseudo fault of a specified type in a specified unit after a lapse of specified time information; means for issuing a pseudo fault release command in which a type and a unit for canceling the pseudo fault are set; Means for canceling a pseudo-failure of a type specified by a unit specified by a release command. 3. An apparatus according to claim 1, further comprising means for judging whether the RAS test is normal or abnormal by comparing the error content obtained by reading the information of the pseudo fault generated by said pseudo fault generating means with an expected value. The RAS automatic test system according to claim 1 or 2, wherein 4. A method for setting or canceling a pseudo fault from a screen.
4. The RAS automatic test system according to claim 1, wherein the command is issued by selecting a target unit and a type. 5. A means for issuing a pseudo-failure setting command in which a computer is operated to set a type, a unit, and time information for generating a pseudo-failure, and to specify the pseudo-failure after elapse of the time information specified by the pseudo-failure setting command. Means for generating a pseudo-failure of the type specified for the specified unit, means for issuing a pseudo-failure release command in which the type and the unit for which the pseudo-failure is to be released, and designation for the unit specified by the pseudo-failure release command Recording medium that stores a program that functions as means for canceling the specified type of pseudo failure.