JPH1151890A - Conductivity meter - Google Patents
Conductivity meterInfo
- Publication number
- JPH1151890A JPH1151890A JP9225613A JP22561397A JPH1151890A JP H1151890 A JPH1151890 A JP H1151890A JP 9225613 A JP9225613 A JP 9225613A JP 22561397 A JP22561397 A JP 22561397A JP H1151890 A JPH1151890 A JP H1151890A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- titanium
- titanium boride
- molten salt
- conductivity meter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体ウエハの洗
浄工程で使用される純水の純度管理等に用いられる導電
率計に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductivity meter used for controlling the purity of pure water used in a semiconductor wafer cleaning step.
【0002】[0002]
【従来の技術】例えば、半導体ウエハの製造工程におい
て、微細な埃あるいはわずかの汚れの存在も許されない
ため、純水による洗浄等の洗浄工程が設けられている。
この洗浄用の純水も、その成分によってはウエハの表面
に影響を与えるため、純水の純度管理を適切に行う必要
がある。従来のこのような純度管理を行う際には、純水
中に不純物が存在すると導電率が変化することを利用す
るため、導電率計を用いて監視を行っている。2. Description of the Related Art For example, in the manufacturing process of a semiconductor wafer, since fine dust or slight dirt is not allowed, a cleaning process such as cleaning with pure water is provided.
This pure water for cleaning also affects the surface of the wafer depending on its components, so that it is necessary to appropriately control the purity of the pure water. When such conventional purity control is performed, monitoring is performed using a conductivity meter to utilize the fact that the conductivity changes when impurities are present in pure water.
【0003】このような導電率計においては、対向して
設けた電極に交流電圧を与え、電流変化を検出すること
により被検査液体の導電率、比抵抗を測定している。そ
の際に用いる電極の素材としては、チタン、ステンレ
ス、白金、あるいはチタン表面に酸化チタン処理を施し
たもの他ものが用いられ、また、電極表面にTiN膜、
あるいはTiC膜を形成したものが提案されている。In such a conductivity meter, an AC voltage is applied to electrodes provided opposite to each other, and a change in current is detected to measure the conductivity and specific resistance of the liquid to be inspected. As the material of the electrode used at this time, titanium, stainless steel, platinum, or other materials obtained by performing titanium oxide treatment on the titanium surface are used, and a TiN film,
Alternatively, a device having a TiC film formed has been proposed.
【0004】[0004]
【発明が解決しようとする課題】上記のように電極の素
材としてチタンを用いたものにおいては、使用中に表面
が酸化し、酸化チタンが表層に形成され、その厚さは徐
々に変化し、温度変化等の外乱によって電極特性が変化
しやすく、指示に影響が発生し、信頼性が低下する欠点
があった。また、ステンレスを用いたものにおいては、
前記のチタン極よりも変化の程度は低いものの、やはり
比抵抗値が徐々に大となり、指示に影響が生じる欠点は
存在する。更に、白金極を用いた場合には、材質的には
安定であるものの、その使用に際しては構造上堅牢さが
要求され、また、電極自体が高価なものとなる欠点もあ
る。また、チタン表面に酸化チタン処理を施したものに
おいては、その酸化チタン層自体が不働体化しているた
め、表面の変化はないが、その酸化チタン層が絶縁体で
あるため、温度変化等の外乱の影響を受けやすい欠点が
ある。As described above, in the case of using titanium as the material of the electrode, the surface oxidizes during use, titanium oxide is formed on the surface layer, and the thickness gradually changes. The electrode characteristics are liable to change due to disturbances such as a temperature change, which affects the indication and lowers the reliability. In the case of using stainless steel,
Although the degree of change is lower than that of the above-mentioned titanium electrode, there still exists a drawback that the specific resistance value gradually increases and the indication is affected. Further, when a platinum electrode is used, although it is stable in material, it requires structural rigidity when used, and has the disadvantage that the electrode itself is expensive. In the case where titanium surface is subjected to a titanium oxide treatment, the surface of the titanium oxide layer itself is not passivated because the titanium oxide layer itself is passivated. However, since the titanium oxide layer is an insulator, temperature change and the like are prevented. There is a disadvantage that it is easily affected by disturbance.
【0005】更に、電極表面にTiNのコーテイング処
理を施したものにおいては、TiN層が高温水中では変
成し、TiO2 に成ることが確認されている。即ち、 2TiN+4H2O→2TiO2+2NH3+H2 2TiN+2O2 →2TiO2+N2 の化学変化が考えられ、いずれもTiO2 を生じる。ま
た、電極面にTiC膜を形成したものにおいては、Ti
C膜の比抵抗は193×10-6Ω・cmと大きく電極のコ
ーテイング材としては不向きである。[0005] Further, it has been confirmed that in the case where the electrode surface is subjected to a TiN coating treatment, the TiN layer is transformed in high-temperature water to become TiO 2 . That, 2TiN + 4H 2 O → 2TiO 2 + 2NH 3 + H 2 2TiN + 2O 2 → 2TiO 2 + chemical changes N 2 is considered, both resulting in TiO 2. In the case where a TiC film is formed on the electrode surface, Ti
The specific resistance of the C film is as large as 193 × 10 −6 Ω · cm, which is not suitable as a coating material for an electrode.
【0006】したがって、本発明は、電極表面が安定化
することにより電極の電気特性が安定し、長期的に高い
測定精度を維持することができ、信頼性の高い導電率計
を提供することを目的とする。Accordingly, the present invention is to provide a highly reliable conductivity meter which can stabilize the electrical characteristics of the electrode by stabilizing the electrode surface, maintain high measurement accuracy over a long period of time, and provide a highly reliable conductivity meter. Aim.
【0007】[0007]
【課題を解決するための手段】本発明は、上記課題を解
決するため、導電率計の電極表面にホウ化チタン膜を形
成したものである。According to the present invention, a titanium boride film is formed on an electrode surface of a conductivity meter in order to solve the above problems.
【0008】本発明は、上記のように導電率計の電極表
面にホウ化チタン膜を形成したので、電極表面が安定化
し、またその比抵抗も小さく電極のコーテイング材とし
て最適である。In the present invention, since the titanium boride film is formed on the surface of the electrode of the conductivity meter as described above, the surface of the electrode is stabilized, and the specific resistance thereof is small, so that it is most suitable as a coating material for the electrode.
【0009】[0009]
【発明の実施の形態】本発明を適用する導電計の電極部
は、図に示すように、中心電極1とその周囲に間隔を有
して同心円の円筒状の周辺電極2を有し、ここに交流電
圧が通電される。この各電極の素材はチタン製のものと
し、その表面に、本発明においてはホウ化チタン(チタ
ンB,チタンB2 )層を形成している。DESCRIPTION OF THE PREFERRED EMBODIMENTS The electrode section of a conductivity meter to which the present invention is applied has a central electrode 1 and a concentric cylindrical peripheral electrode 2 with a space around the central electrode 1 as shown in FIG. Is supplied with an AC voltage. The material of each of these electrodes is made of titanium, and a titanium boride (titanium B, titanium B 2 ) layer is formed on the surface thereof in the present invention.
【0010】ホウ化チタン層は、固体法、溶融塩浴浸漬
法、ペースト法、融塩浴電解法により形成することがで
きる。例えば溶融塩浴法によることができる。この方法
においては、ホウ酸、ホウ酸カリュウム、炭酸カリュウ
ム、マグネシュウムなどの混合塩を溶融し、材料や溶融
塩の酸化を防ぐためにアルゴンなどの不活性ガスで覆っ
た溶融塩浴に材料を浸し、1023乃至1323Kの温
度で処理をする。また、ペースト法によってもチタンB
2層を形成することができる。この方法によると、B4C
、Na2B4O7 、NaBF4 、NH4Cl 等の薬剤の
混合物をエチルアルコールでペースト状にし、材料の表
面に塗布し、乾燥後、B4C を含むアルミナ粉に埋め込
み、1123乃至1238Kの温度で大気中にて加熱処
理する事によっても得られる。[0010] The titanium boride layer can be formed by a solid method, a molten salt bath immersion method, a paste method, or a molten salt bath electrolytic method. For example, a molten salt bath method can be used. In this method, a mixed salt of boric acid, calcium borate, calcium carbonate, magnesium, etc. is melted, and the material is immersed in a molten salt bath covered with an inert gas such as argon to prevent oxidation of the material and the molten salt. The treatment is performed at a temperature of 1023 to 1323K. Titanium B can also be prepared by the paste method.
Two layers can be formed. According to this method, B 4 C
, Na 2 B 4 O 7 , NaBF 4 , NH 4 Cl, etc., a mixture of chemicals is pasted with ethyl alcohol, applied to the surface of the material, dried, and embedded in alumina powder containing B 4 C. It can also be obtained by performing a heat treatment in the atmosphere at the temperature described above.
【0011】更に、溶融塩浴電解法によることもでき
る。この方法によってホウ化チタン層を形成するには、
厚さ3mmの市販の純チタン圧延板ををエメリー紙で研
磨し、トリクロールエタンで洗浄脱脂後、硝酸10%、
フッ酸3%の水溶液で酸洗いする。溶融塩浴電解ホウ酸
化処理装置としては、黒鉛ルツボを電解槽とし、溶融塩
電解質としては無水ホウ砂(Na2B4O7 )を溶融した
ものを用い、処理前に予備電解を行い、脱水を充分に行
った後、試料をカソードで、溶融塩浴に浸し、電解層を
アノードとして、処理温度1123乃至1223K、処
理時間10.8乃至54ks、電流密度200乃至60
0A/m2 の条件でホウ化処理を行う。チタンは酸化さ
れやすいので装置内をアルゴン雰囲気として試料を浸
す。このように、種々の方法によりチタンに対してホウ
化チタン層を生成することができる。Further, it is also possible to employ a molten salt bath electrolysis method. To form a titanium boride layer by this method,
A commercially available pure titanium rolled plate having a thickness of 3 mm is polished with emery paper, washed and degreased with trichlorethane, then nitric acid 10%,
Pickling is performed with an aqueous solution of 3% hydrofluoric acid. As a molten salt bath electrolytic bo oxidation treatment apparatus, a graphite crucible is used as an electrolytic tank, and as a molten salt electrolyte, a substance obtained by melting anhydrous borax (Na 2 B 4 O 7 ) is used. After the sample was sufficiently treated, the sample was immersed in a molten salt bath at the cathode, and the electrolytic layer was used as the anode, at a processing temperature of 1123 to 1223 K, a processing time of 10.8 to 54 ks, and a current density of 200 to 60.
The boring treatment is performed under the condition of 0 A / m 2 . Since titanium is easily oxidized, the sample is immersed in an argon atmosphere in the apparatus. As described above, a titanium boride layer can be formed on titanium by various methods.
【0012】上記のように形成されたホウ化チタン層は
その比抵抗が6.4×10-6Ω・cmと上記のTiCの1
93×10-6Ω・cmに比べて小さく、電極のコーテイン
グ材として適していることが明らかである。The titanium boride layer formed as described above has a specific resistance of 6.4 × 10 −6 Ω · cm, which is 1% of the above-mentioned TiC.
It is apparently smaller than 93 × 10 −6 Ω · cm and suitable as a coating material for the electrode.
【0013】[0013]
【発明の効果】本発明の導電率計は、その電極にホウ化
チタン層を形成したので、非常に堅い導電性の膜により
耐酸化性、耐熱性に優れ電気的特性が安定する。そし
て、長期的に高い測定精度を信頼性よく得ることができ
る。According to the conductivity meter of the present invention, since a titanium boride layer is formed on its electrode, an extremely hard conductive film has excellent oxidation resistance and heat resistance, and has stable electric characteristics. Then, high measurement accuracy can be reliably obtained over a long period of time.
【図1】本発明の実施例の導電率計の電極部分を示す概
略図である。FIG. 1 is a schematic view showing an electrode portion of a conductivity meter according to an embodiment of the present invention.
1 中心電極 2 周辺電極 1 center electrode 2 peripheral electrode
Claims (5)
ことを特徴とする導電率計。1. A conductivity meter having a titanium boride film formed on both electrode surfaces.
される請求項1に記載の導電率計。2. The conductivity meter according to claim 1, wherein the titanium boride film is formed by a solid-state method.
形成される請求項1に記載の導電率計。3. The conductivity meter according to claim 1, wherein the titanium boride film is formed by a molten salt bath method.
形成される請求項1に記載の導電率計。4. The conductivity meter according to claim 1, wherein the titanium boride film is formed by a paste method.
り形成される請求項1に記載の導電率計。5. The conductivity meter according to claim 1, wherein the titanium boride film is formed by a molten salt bath electrolysis method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22561397A JP3616840B2 (en) | 1997-08-08 | 1997-08-08 | Conductivity meter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22561397A JP3616840B2 (en) | 1997-08-08 | 1997-08-08 | Conductivity meter |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH1151890A true JPH1151890A (en) | 1999-02-26 |
JP3616840B2 JP3616840B2 (en) | 2005-02-02 |
Family
ID=16832071
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22561397A Expired - Fee Related JP3616840B2 (en) | 1997-08-08 | 1997-08-08 | Conductivity meter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3616840B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001296263A (en) * | 2000-02-07 | 2001-10-26 | Japan Organo Co Ltd | Conductivity meter, conductivity measuring electrode and manufacturing method thereof |
JP2010007134A (en) * | 2008-06-27 | 2010-01-14 | Air Water Inc | Surface treatment method for steel material, surface treatment device, and steel obtained thereby |
CN104391179A (en) * | 2014-12-16 | 2015-03-04 | 成都光明光电股份有限公司 | Conductivity test device and method for molten glass |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63159685A (en) * | 1986-12-19 | 1988-07-02 | Taiho Kogyo Co Ltd | Vane |
JPH04251650A (en) * | 1991-01-24 | 1992-09-08 | Tokyo Yogyo Co Ltd | Sleeve for die casting machine |
JPH0649687A (en) * | 1992-07-30 | 1994-02-22 | Kobe Steel Ltd | Wear-resistant surface-coated material |
JPH06138067A (en) * | 1991-08-06 | 1994-05-20 | Shinagawa Refract Co Ltd | Cell for measuring electric conductivity |
JPH07230714A (en) * | 1994-02-16 | 1995-08-29 | Murata Mfg Co Ltd | Copper electroconductive paste |
JPH08278270A (en) * | 1995-04-08 | 1996-10-22 | Horiba Ltd | Device for measuring conductivity and specific resistance |
-
1997
- 1997-08-08 JP JP22561397A patent/JP3616840B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63159685A (en) * | 1986-12-19 | 1988-07-02 | Taiho Kogyo Co Ltd | Vane |
JPH04251650A (en) * | 1991-01-24 | 1992-09-08 | Tokyo Yogyo Co Ltd | Sleeve for die casting machine |
JPH06138067A (en) * | 1991-08-06 | 1994-05-20 | Shinagawa Refract Co Ltd | Cell for measuring electric conductivity |
JPH0649687A (en) * | 1992-07-30 | 1994-02-22 | Kobe Steel Ltd | Wear-resistant surface-coated material |
JPH07230714A (en) * | 1994-02-16 | 1995-08-29 | Murata Mfg Co Ltd | Copper electroconductive paste |
JPH08278270A (en) * | 1995-04-08 | 1996-10-22 | Horiba Ltd | Device for measuring conductivity and specific resistance |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001296263A (en) * | 2000-02-07 | 2001-10-26 | Japan Organo Co Ltd | Conductivity meter, conductivity measuring electrode and manufacturing method thereof |
JP2010007134A (en) * | 2008-06-27 | 2010-01-14 | Air Water Inc | Surface treatment method for steel material, surface treatment device, and steel obtained thereby |
CN104391179A (en) * | 2014-12-16 | 2015-03-04 | 成都光明光电股份有限公司 | Conductivity test device and method for molten glass |
Also Published As
Publication number | Publication date |
---|---|
JP3616840B2 (en) | 2005-02-02 |
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