JPH11509271A - 分子、層状媒体、およびパターン形成方法 - Google Patents
分子、層状媒体、およびパターン形成方法Info
- Publication number
- JPH11509271A JPH11509271A JP10534028A JP53402898A JPH11509271A JP H11509271 A JPH11509271 A JP H11509271A JP 10534028 A JP10534028 A JP 10534028A JP 53402898 A JP53402898 A JP 53402898A JP H11509271 A JPH11509271 A JP H11509271A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- molecule
- molecules
- conformations
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 59
- 239000000758 substrate Substances 0.000 claims abstract description 129
- 239000002356 single layer Substances 0.000 claims description 27
- 239000010410 layer Substances 0.000 claims description 21
- 230000006870 function Effects 0.000 claims description 12
- 238000002347 injection Methods 0.000 claims description 9
- 239000007924 injection Substances 0.000 claims description 9
- 230000002441 reversible effect Effects 0.000 claims description 4
- 239000002245 particle Substances 0.000 claims description 3
- 230000000873 masking effect Effects 0.000 claims 1
- 230000027756 respiratory electron transport chain Effects 0.000 abstract description 13
- 238000013500 data storage Methods 0.000 abstract description 4
- 230000001737 promoting effect Effects 0.000 abstract 1
- 230000008901 benefit Effects 0.000 description 30
- 230000002093 peripheral effect Effects 0.000 description 13
- 230000007261 regionalization Effects 0.000 description 12
- 238000003860 storage Methods 0.000 description 10
- 230000008859 change Effects 0.000 description 8
- 238000005381 potential energy Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 7
- 229920000642 polymer Polymers 0.000 description 7
- 239000000126 substance Substances 0.000 description 7
- 241001422033 Thestylus Species 0.000 description 6
- 238000013461 design Methods 0.000 description 6
- 230000005684 electric field Effects 0.000 description 6
- 230000005284 excitation Effects 0.000 description 6
- 238000000059 patterning Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000003993 interaction Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- PYJJCSYBSYXGQQ-UHFFFAOYSA-N trichloro(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](Cl)(Cl)Cl PYJJCSYBSYXGQQ-UHFFFAOYSA-N 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 230000018109 developmental process Effects 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 230000009257 reactivity Effects 0.000 description 4
- 230000005641 tunneling Effects 0.000 description 4
- 125000004429 atom Chemical group 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 230000002349 favourable effect Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 150000004032 porphyrins Chemical class 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 230000004913 activation Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000005281 excited state Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000005283 ground state Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 238000002407 reforming Methods 0.000 description 2
- 238000012827 research and development Methods 0.000 description 2
- 239000002094 self assembled monolayer Substances 0.000 description 2
- 239000013545 self-assembled monolayer Substances 0.000 description 2
- 238000001338 self-assembly Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 235000014676 Phragmites communis Nutrition 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- -1 butylphenyl groups Chemical group 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002255 enzymatic effect Effects 0.000 description 1
- 238000000407 epitaxy Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229940088597 hormone Drugs 0.000 description 1
- 239000005556 hormone Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002052 molecular layer Substances 0.000 description 1
- 238000001579 optical reflectometry Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000008672 reprogramming Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/164—Coating processes; Apparatus therefor using electric, electrostatic or magnetic means; powder coating
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/858—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including positioning/mounting nanostructure
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Nitrogen Condensed Heterocyclic Rings (AREA)
- Micromachines (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.少なくとも1つの接続(2)によって相互に結合された少なくとも2種類の エンティティ(1、3)を含む分子であって、基板(4)に取り付け可能で、上 記エンティティ(1、3)の上記基板(4)または相互にもしくはその両方に対 する配列が異なることにより識別可能な、少なくとも2つの異なる安定または準 安定な配座(18、19)間の切り替えが外部の影響下で可能であり、上記分子 が上記基板(4)に取り付けられた場合、上記配座のうち第1の配座(18)で は、上記エンティティ(1、3)のうち第2のエンティティ(3)と上記基板( 4)間の第2の引力(5)により上記分子が上記基板(4)に引きつけられ、上 記エンティティ(1、3)のうち第1のエンティティ(1)が上記基板(4)に 対して、上記第2の引力(5)と比較して無視できる第1の引力(6)を有する 位置を有し、上記配座のうち第2の配座(19)では、上記第1のエンティティ (1)が上記第1の引力(6)により上記基板(4)に結合する位置を有するこ とを特徴とする分子。 2.基板(4)上の分子の位置が、配座(18、19)のうち少なくとも1つに 固定されることを特徴とする、請求項1に記載の分子。 3.分子が第1および第2の配座(18、19)間で可逆的 に切り替え可能であることを特徴とする、請求項1または2に記載の分子。 4.第1のエンティティ(1)が分子内に中央位置を有し、第2のエンティティ (3)が上記第1のエンティティ(1)に移動可能に接続された少なくとも1個 の周辺エンティティを含むことを特徴とする、請求項1ないし3のいずれか一項 に記載の分子。 5.請求項1ないし4のいずれか一項に記載の分子を複数含み、基板(4)上に 完全または不完全な単一層(15)の形状で配置された層状媒体。 6.分子が、いずれの配座(18、19)においても、切り替えの間においても 、基板(4)上の固定位置を保持することを特徴とする、請求項5に記載の層状 媒体。 7.配座(18、19)のうちの少なくとも1つにある分子が基板(4)に沿っ て移動可能であり、上記分子が熱的励起により上記基板(4)の一部分が一時的 に被覆されないように基板(4)に沿って移動を続け、上記配座(18、19) のうち少なくとも他の1つにおいて、上記分子が上記基板上の固定位置にあるこ とを特徴とする、請求項5に記載の層状媒体。 8.基板(4)が導電性であり、配座(18、19)の1つにおいて、分子が上 記基板(4)が隣接する非金属媒体へ電子を注入する能力を与え、上記配座(1 8、19)の他の1 つにおいては、上記電子注入能力がそれより小さいことを特徴とする、請求項5 ないし7のいずれか一項に記載の層状媒体。 9.上記層状媒体の分子の配座(18、19)間を切り替えることにより、発光 能力を種々の効率に切り替えることが可能な有機発光ダイオードの、電子注入電 極の少なくとも一部であることを特徴とする、請求項8に記載の層状媒体。 10.請求項5ないし9のいずれか一項に記載の層状媒体に所定のパターンを形 成する方法において、第1段階で上記層状媒体の領域を選択し、第2段階で上記 選択した領域中の上記分子を配座(18、19)のうちの1つから、上記配座( 18、19)のうちの他の1つに切り替える構造化手段に、上記選択した領域を 露出させることを特徴とする方法。 11.第3段階で、配座(18、19)の一方にある分子を第1の分子除去手段 により除去することを特徴とする請求項10に記載の所定のパターンを形成する 方法。 12.次の段階で、前段階後上記基板(4)の固定位置に残留する分子をパター ニング・マスクとして使用して、基板(4)にパターンを形成することを特徴と する、請求項10または11に記載の所定のパターンを形成する方法。 13.最後の段階で、第2の分子除去手段により基板(4)から分子を除去する ことを特徴とする、請求項10ないし12のいずれか一項に記載の所定のパター ンを形成する方法。 14.構造化手段として、切り替え機能を行い、形成すべきパターンの形状に対 応する経路で層状媒体に沿って移動可能な少なくとも1個のスタイラス(7)を 使用することを特徴とする、請求項10ないし13のいずれか一項に記載の所定 のパターンを形成する方法。 15.構造化手段として、切り替え機能を行い、形成すべきパターンに従って構 造化された突起(21)を有する、少なくとも1個のスタンプ(20)を使用す ることを特徴とする、請求項10ないし14のいずれか一項に記載の所定のパタ ーンを形成する方法。 16.構造化手段として、切り替え機能を行い、パターンを形成するために、層 状媒体に近接、または接触して配置され、アクチュエータ(31)を個別に稼動 することができる、少なくとも1個のアクチュエータ・アレイ(30)を使用す ることを特徴とする、請求項10ないし15のいずれか一項に記載の所定のパタ ーンを形成する方法。 17.構造化手段として、少なくとも1個の照射装置、または粒子ビーム装置を 使用することを特徴とする、請求項10ないし16のいずれか一項に記載の所定 のパターンを形成する方法。 18.識別手段として、請求項14ないし17のいずれか一項に記載の構造化手 段を使用する、請求項5ないし9のいずれか一項に記載の層状媒体中、または基 板上のパターンを識 別する方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/IB1997/000083 WO1998035271A1 (en) | 1997-02-06 | 1997-02-06 | Molecule, layered medium and method for creating a pattern |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000330320A Division JP3396846B2 (ja) | 2000-10-30 | 2000-10-30 | パターン形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH11509271A true JPH11509271A (ja) | 1999-08-17 |
JP3525934B2 JP3525934B2 (ja) | 2004-05-10 |
Family
ID=11004527
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53402898A Expired - Lifetime JP3525934B2 (ja) | 1997-02-06 | 1997-02-06 | 層状媒体及び発光ダイオード |
Country Status (6)
Country | Link |
---|---|
US (1) | US6031756A (ja) |
EP (1) | EP0892942B1 (ja) |
JP (1) | JP3525934B2 (ja) |
KR (1) | KR100296613B1 (ja) |
DE (1) | DE69713500T2 (ja) |
WO (1) | WO1998035271A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005509271A (ja) * | 2001-03-29 | 2005-04-07 | ヒューレット・パッカード・カンパニー | 電子スイッチング、ゲート及び記憶装置用途のための、電界によってバンドギャップ変化が促進される双安定分子メカニカルデバイス |
Families Citing this family (59)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6339217B1 (en) * | 1995-07-28 | 2002-01-15 | General Nanotechnology Llc | Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
US5751683A (en) * | 1995-07-24 | 1998-05-12 | General Nanotechnology, L.L.C. | Nanometer scale data storage device and associated positioning system |
US6337479B1 (en) | 1994-07-28 | 2002-01-08 | Victor B. Kley | Object inspection and/or modification system and method |
US6353219B1 (en) * | 1994-07-28 | 2002-03-05 | Victor B. Kley | Object inspection and/or modification system and method |
US7196328B1 (en) | 2001-03-08 | 2007-03-27 | General Nanotechnology Llc | Nanomachining method and apparatus |
US6802646B1 (en) * | 2001-04-30 | 2004-10-12 | General Nanotechnology Llc | Low-friction moving interfaces in micromachines and nanomachines |
US6787768B1 (en) | 2001-03-08 | 2004-09-07 | General Nanotechnology Llc | Method and apparatus for tool and tip design for nanomachining and measurement |
US6752008B1 (en) | 2001-03-08 | 2004-06-22 | General Nanotechnology Llc | Method and apparatus for scanning in scanning probe microscopy and presenting results |
NO312867B1 (no) * | 1999-06-30 | 2002-07-08 | Penn State Res Found | Anordning til elektrisk kontaktering eller isolering av organiske eller uorganiske halvledere, samt fremgangsmåte til densfremstilling |
US6381169B1 (en) * | 1999-07-01 | 2002-04-30 | The Regents Of The University Of California | High density non-volatile memory device |
EP1196939A4 (en) * | 1999-07-01 | 2002-09-18 | Gen Nanotechnology Llc | DEVICE AND METHOD FOR EXAMINING AND / OR CHANGING OBJECT |
EP1210714A4 (en) | 1999-07-01 | 2006-01-04 | Univ | HIGH DENSITY REMANENT MEMORY DEVICE |
US6198655B1 (en) * | 1999-12-10 | 2001-03-06 | The Regents Of The University Of California | Electrically addressable volatile non-volatile molecular-based switching devices |
US6212093B1 (en) * | 2000-01-14 | 2001-04-03 | North Carolina State University | High-density non-volatile memory devices incorporating sandwich coordination compounds |
WO2001052266A1 (en) * | 2000-01-14 | 2001-07-19 | North Carolina State University | Substrates carrying polymers of linked sandwich coordination compounds and methods of use thereof |
US6674932B1 (en) * | 2000-12-14 | 2004-01-06 | Hewlett-Packard Development Company, L.P. | Bistable molecular mechanical devices with a middle rotating segment activated by an electric field for electronic switching, gating, and memory applications |
US6701035B2 (en) * | 2000-12-14 | 2004-03-02 | Hewlett-Packard Development Company, L.P. | Electric-field actuated chromogenic materials based on molecules with a rotating middle segment for applications in photonic switching |
US6512119B2 (en) | 2001-01-12 | 2003-01-28 | Hewlett-Packard Company | Bistable molecular mechanical devices with an appended rotor activated by an electric field for electronic switching, gating and memory applications |
US7112366B2 (en) * | 2001-01-05 | 2006-09-26 | The Ohio State University | Chemical monolayer and micro-electronic junctions and devices containing same |
US7170842B2 (en) * | 2001-02-15 | 2007-01-30 | Hewlett-Packard Development Company, L.P. | Methods for conducting current between a scanned-probe and storage medium |
WO2002077633A1 (en) | 2001-03-23 | 2002-10-03 | The Regents Of The University Of California | Open circuit potential amperometry and voltammetry |
US6995312B2 (en) * | 2001-03-29 | 2006-02-07 | Hewlett-Packard Development Company, L.P. | Bistable molecular switches and associated methods |
WO2002086200A1 (en) * | 2001-04-23 | 2002-10-31 | Universität Basel | Production method for atomic and molecular patterns on surfaces and nanostructured devices |
US6919592B2 (en) * | 2001-07-25 | 2005-07-19 | Nantero, Inc. | Electromechanical memory array using nanotube ribbons and method for making same |
US6924538B2 (en) * | 2001-07-25 | 2005-08-02 | Nantero, Inc. | Devices having vertically-disposed nanofabric articles and methods of making the same |
US6835591B2 (en) * | 2001-07-25 | 2004-12-28 | Nantero, Inc. | Methods of nanotube films and articles |
US6706402B2 (en) * | 2001-07-25 | 2004-03-16 | Nantero, Inc. | Nanotube films and articles |
US6643165B2 (en) | 2001-07-25 | 2003-11-04 | Nantero, Inc. | Electromechanical memory having cell selection circuitry constructed with nanotube technology |
US6574130B2 (en) | 2001-07-25 | 2003-06-03 | Nantero, Inc. | Hybrid circuit having nanotube electromechanical memory |
US7566478B2 (en) * | 2001-07-25 | 2009-07-28 | Nantero, Inc. | Methods of making carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US7259410B2 (en) * | 2001-07-25 | 2007-08-21 | Nantero, Inc. | Devices having horizontally-disposed nanofabric articles and methods of making the same |
US6556470B1 (en) * | 2001-07-31 | 2003-04-29 | Hewlett-Packard Company | Field addressable rewritable media |
ITMI20012075A1 (it) * | 2001-10-08 | 2003-04-08 | Consiglio Nazionale Ricerche | Procedimento per il conferimento e controllo su scale micro e nanomatriche dell'anisotropia di proprieta' strutturali elettriche ottiche ed |
US6850230B1 (en) * | 2001-10-16 | 2005-02-01 | Hewlett-Packard Development Company, L.P. | Electronic writing and erasing pencil |
US7053369B1 (en) * | 2001-10-19 | 2006-05-30 | Rave Llc | Scan data collection for better overall data accuracy |
US7348206B2 (en) * | 2001-10-26 | 2008-03-25 | The Regents Of The University Of California | Formation of self-assembled monolayers of redox SAMs on silicon for molecular memory applications |
US7074519B2 (en) | 2001-10-26 | 2006-07-11 | The Regents Of The University Of California | Molehole embedded 3-D crossbar architecture used in electrochemical molecular memory device |
US6670981B1 (en) * | 2001-10-30 | 2003-12-30 | Hewlett-Packard Development Company, L.P. | Laser printing with rewritable media |
US7020355B2 (en) * | 2001-11-02 | 2006-03-28 | Massachusetts Institute Of Technology | Switchable surfaces |
JP2003209305A (ja) * | 2001-11-13 | 2003-07-25 | Hewlett Packard Co <Hp> | 電界調整式双安定分子システム |
US6813937B2 (en) | 2001-11-28 | 2004-11-09 | General Nanotechnology Llc | Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
US6784028B2 (en) | 2001-12-28 | 2004-08-31 | Nantero, Inc. | Methods of making electromechanical three-trace junction devices |
US7176505B2 (en) * | 2001-12-28 | 2007-02-13 | Nantero, Inc. | Electromechanical three-trace junction devices |
US6728129B2 (en) * | 2002-02-19 | 2004-04-27 | The Regents Of The University Of California | Multistate triple-decker dyads in three distinct architectures for information storage applications |
US6998689B2 (en) * | 2002-09-09 | 2006-02-14 | General Nanotechnology Llc | Fluid delivery for scanning probe microscopy |
US7335395B2 (en) * | 2002-04-23 | 2008-02-26 | Nantero, Inc. | Methods of using pre-formed nanotubes to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US7560136B2 (en) * | 2003-01-13 | 2009-07-14 | Nantero, Inc. | Methods of using thin metal layers to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
KR100547015B1 (ko) * | 2003-05-23 | 2006-01-26 | 주식회사 올메디쿠스 | 일정한 크기 이상의 분석물질을 정량 분석하기 위한바이오센서 및 그 제조방법 |
US7737433B2 (en) | 2004-03-08 | 2010-06-15 | The Ohio State University Research Foundation | Electronic junction devices featuring redox electrodes |
US20060238696A1 (en) * | 2005-04-20 | 2006-10-26 | Chien-Hui Wen | Method of aligning negative dielectric anisotropic liquid crystals |
US20070090344A1 (en) * | 2005-10-24 | 2007-04-26 | Hewlett-Packard Development Company, L.P. | Multi-stable molecular device |
US7604916B2 (en) * | 2006-11-06 | 2009-10-20 | 3M Innovative Properties Company | Donor films with pattern-directing layers |
GB201203511D0 (en) * | 2012-02-29 | 2012-04-11 | Ibm | Position sensing apparatus |
US9583358B2 (en) | 2014-05-30 | 2017-02-28 | Samsung Electronics Co., Ltd. | Hardmask composition and method of forming pattern by using the hardmask composition |
KR102287343B1 (ko) | 2014-07-04 | 2021-08-06 | 삼성전자주식회사 | 하드마스크 조성물 및 이를 이용한 패턴의 형성방법 |
KR102463893B1 (ko) | 2015-04-03 | 2022-11-04 | 삼성전자주식회사 | 하드마스크 조성물 및 이를 이용한 패턴의 형성방법 |
US11034847B2 (en) | 2017-07-14 | 2021-06-15 | Samsung Electronics Co., Ltd. | Hardmask composition, method of forming pattern using hardmask composition, and hardmask formed from hardmask composition |
KR102433666B1 (ko) | 2017-07-27 | 2022-08-18 | 삼성전자주식회사 | 하드마스크 조성물, 이를 이용한 패턴의 형성방법 및 상기 하드마스크 조성물을 이용하여 형성된 하드마스크 |
KR102486388B1 (ko) | 2017-07-28 | 2023-01-09 | 삼성전자주식회사 | 그래핀 양자점의 제조방법, 상기 제조방법에 따라 얻어진 그래핀 양자점을 포함한 하드마스크 조성물, 이를 이용한 패턴의 형성방법 및 상기 하드마스크 조성물을 이용하여 형성된 하드마스크 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0272935B1 (en) * | 1986-12-24 | 1994-03-16 | Canon Kabushiki Kaisha | Recording device and reproducing device |
US5314725A (en) * | 1992-02-17 | 1994-05-24 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Photo-plating process |
US5751629A (en) * | 1995-04-25 | 1998-05-12 | Irori | Remotely programmable matrices with memories |
-
1997
- 1997-02-06 WO PCT/IB1997/000083 patent/WO1998035271A1/en active IP Right Grant
- 1997-02-06 EP EP97901208A patent/EP0892942B1/en not_active Expired - Lifetime
- 1997-02-06 DE DE69713500T patent/DE69713500T2/de not_active Expired - Lifetime
- 1997-02-06 US US09/155,915 patent/US6031756A/en not_active Expired - Lifetime
- 1997-02-06 KR KR1019980707313A patent/KR100296613B1/ko not_active IP Right Cessation
- 1997-02-06 JP JP53402898A patent/JP3525934B2/ja not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7714438B2 (en) | 2000-12-14 | 2010-05-11 | Hewlett-Packard Development Company, L.P. | Bistable molecular mechanical devices with a band gap change activated by an electrical field for electronic switching, gating, and memory applications |
JP2005509271A (ja) * | 2001-03-29 | 2005-04-07 | ヒューレット・パッカード・カンパニー | 電子スイッチング、ゲート及び記憶装置用途のための、電界によってバンドギャップ変化が促進される双安定分子メカニカルデバイス |
Also Published As
Publication number | Publication date |
---|---|
US6031756A (en) | 2000-02-29 |
DE69713500D1 (de) | 2002-07-25 |
WO1998035271A1 (en) | 1998-08-13 |
JP3525934B2 (ja) | 2004-05-10 |
EP0892942A1 (en) | 1999-01-27 |
DE69713500T2 (de) | 2003-02-20 |
EP0892942B1 (en) | 2002-06-19 |
KR100296613B1 (ko) | 2001-09-22 |
KR20000064617A (ko) | 2000-11-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3525934B2 (ja) | 層状媒体及び発光ダイオード | |
US6919128B2 (en) | Pixel array | |
US8630807B2 (en) | Methods for the electronic, homogeneous assembly and fabrication of devices | |
US6587408B1 (en) | High-density mechanical memory and turing machine | |
KR100507815B1 (ko) | 광자 및 전자 용품을 위한 친화성 자가-어셈블리 시스템 및 디바이스 | |
US6706473B1 (en) | Systems and devices for photoelectrophoretic transport and hybridization of oligonucleotides | |
JP2004507083A (ja) | ナノメートルスケール分子デバイスの方向付けられたアセンブリ | |
JP3396846B2 (ja) | パターン形成方法 | |
US7828954B2 (en) | Electrode based patterning of thin film self-assembled nanoparticles | |
JP2002299582A (ja) | 強誘電体膜、強誘電体膜の製造方法、強誘電体キャパシタ、強誘電体キャパシタの製造方法、強誘電体メモリ装置、強誘電体メモリ装置の製造方法、機能性膜、機能性膜の製造方法 | |
JPH0748567B2 (ja) | 光応答性スイツチ素子 | |
AU2002249821A1 (en) | Chemical monolayer and micro-electronic junctions and devices containing same | |
JPH0770764B2 (ja) | スイツチ素子 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20040210 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080227 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090227 Year of fee payment: 5 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100227 Year of fee payment: 6 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110227 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110227 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120227 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120227 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130227 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130227 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140227 Year of fee payment: 10 |
|
EXPY | Cancellation because of completion of term |